SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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MF139100 - SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption
SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption Sale priceMember Price: $113.00
Non-Member Price: $193.00
G08900 - SEMI G89 - Specification for Leadframe Strip Size
SEMI G89 - Specification for Leadframe Strip Size Sale priceMember Price: $113.00
Non-Member Price: $193.00
M06200 - SEMI M62 - Specification for Silicon Epitaxial Wafers
SEMI M62 - Specification for Silicon Epitaxial Wafers Sale price Member Price : $113.00
MF039100 - SEMI MF391 - Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage
SEMI MF391 - Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage Sale priceMember Price: $113.00
Non-Member Price: $193.00
M00600 - SEMI M6 - 太陽光電池用シリコンウェーハの仕様
SEMI M6 - 太陽光電池用シリコンウェーハの仕様 Sale priceMember Price: $135.00
Non-Member Price: $180.00
MF207400 - SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers
SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
HB00800 - SEMI HB8 - Test Method for Determining Orientation of a Sapphire Single Crystal
SEMI HB8 - Test Method for Determining Orientation of a Sapphire Single Crystal Sale priceMember Price: $113.00
Non-Member Price: $193.00
F07000 - SEMI F70 - Test Method for Determination of Particle Contribution of Gas Delivery System
SEMI F70 - Test Method for Determination of Particle Contribution of Gas Delivery System Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF152800 - SEMI MF1528 - Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF1528 - Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF172600 - SEMI MF1726 - Practice for Analysis of Crystallographic Perfection of Silicon Wafers
SEMI MF1726 - Practice for Analysis of Crystallographic Perfection of Silicon Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF181100 - SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data
SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data Sale priceMember Price: $113.00
Non-Member Price: $193.00
G09300 - SEMI G93 - ボール・グリッド・アレイ（BGA）パッケージ用はんだボールの測定方法
SEMI G93 - ボール・グリッド・アレイ（BGA）パッケージ用はんだボールの測定方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
G04100 - SEMI G41 - Specification for Dual Strip SOIC Leadframe
SEMI G41 - Specification for Dual Strip SOIC Leadframe Sale priceMember Price: $113.00
Non-Member Price: $193.00
M06500 - SEMI M65 - 化合物半導体エピタキシャルウェーハに使用するサファイア基板の仕様
SEMI M65 - 化合物半導体エピタキシャルウェーハに使用するサファイア基板の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M05700 - SEMI M57 - Specification for Silicon Annealed Wafers
SEMI M57 - Specification for Silicon Annealed Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
M04400 - SEMI M44 - シリコン中の酸素の換算係数ガイド
SEMI M44 - シリコン中の酸素の換算係数ガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors
SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Sale priceMember Price: $113.00
Non-Member Price: $193.00
F07600 - SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas
SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas Sale priceMember Price: $113.00
Non-Member Price: $193.00
G05500 - SEMI G55 - リードフレーム銀めっき光沢度の測定方法
SEMI G55 - リードフレーム銀めっき光沢度の測定方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
G02900 - SEMI G29 - Test Method for Trace Contaminants in Molding Compounds
SEMI G29 - Test Method for Trace Contaminants in Molding Compounds Sale priceMember Price: $113.00
Non-Member Price: $193.00
G02300 - SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages
SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages Sale priceMember Price: $113.00
Non-Member Price: $193.00
G02800 - SEMI G28 - Specification for Leadframes for Plastic Molded S.O. Packages
SEMI G28 - Specification for Leadframes for Plastic Molded S.O. Packages Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF163000 - SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $113.00
Non-Member Price: $193.00
M04300 - SEMI M43 - Guide for Reporting Wafer Nanotopography
SEMI M43 - Guide for Reporting Wafer Nanotopography Sale priceMember Price: $113.00
Non-Member Price: $193.00