SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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M02300 - SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers
SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
F03700 - SEMI F37 - Test Method for Determination of Surface Roughness Parameters for Gas Distribution System Components
SEMI F37 - Test Method for Determination of Surface Roughness Parameters for Gas Distribution System Components Sale priceMember Price: $113.00
Non-Member Price: $193.00
F09800 - SEMI F98 - Guide for Treatment of Reuse Water in Semiconductor Processing
SEMI F98 - Guide for Treatment of Reuse Water in Semiconductor Processing Sale price Member Price : $113.00
MF067400 - SEMI MF674 - Practice for Preparing Silicon for Spreading Resistance Measurements
SEMI MF674 - Practice for Preparing Silicon for Spreading Resistance Measurements Sale priceMember Price: $113.00
Non-Member Price: $193.00
G00400 - SEMI G4 - Specification for Integrated Circuit Leadframe Materials Used in the Production of Stamped Leadframes
SEMI G4 - Specification for Integrated Circuit Leadframe Materials Used in the Production of Stamped Leadframes Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF092800 - SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates Sale priceMember Price: $113.00
Non-Member Price: $193.00
M06000 - SEMI M60 - Test Method for Time Dependent Dielectric Breakdown Characteristics of SiO2 Films for Si Wafer Evaluation
SEMI M60 - Test Method for Time Dependent Dielectric Breakdown Characteristics of SiO2 Films for Si Wafer Evaluation Sale priceMember Price: $113.00
Non-Member Price: $193.00
HB01000 - SEMI HB10 - Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers
SEMI HB10 - Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
G07400 - SEMI G74 - Specification for Tape Frame for 300 mm Wafers
SEMI G74 - Specification for Tape Frame for 300 mm Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV02100 - SEMI PV21 - Guide for Silane (SiH4), Used in Photovoltaic ApplicationsPV02100 - SEMI PV21 - Guide for Silane (SiH4), Used in Photovoltaic Applications
SEMI PV21 - Guide for Silane (SiH4), Used in Photovoltaic Applications Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV08800 - SEMI PV88 - Test Method for Determination of Hydrogen in Photovoltaic (PV) Polysilicon by Inert Gas Fusion Infrared Absorption Method
SEMI PV88 - Test Method for Determination of Hydrogen in Photovoltaic (PV) Polysilicon by Inert Gas Fusion Infrared Absorption Method Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV05400 - SEMI PV54 - 晶体硅太阳电池N型层接触用银浆技术规范
SEMI PV54 - 晶体硅太阳电池N型层接触用银浆技术规范 Sale priceMember Price: $113.00
Non-Member Price: $193.00
G02500 - SEMI G25 - Test Method for Measuring the Resistance of Package Leads
SEMI G25 - Test Method for Measuring the Resistance of Package Leads Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF198200 - SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography
SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography Sale priceMember Price: $113.00
Non-Member Price: $193.00
M08300 - SEMI M83 - Test Method for Determination of Dislocation Etch Pit Density in Monocrystals of III-V Compound Semiconductors
SEMI M83 - Test Method for Determination of Dislocation Etch Pit Density in Monocrystals of III-V Compound Semiconductors Sale price Member Price : $113.00
M08400 - SEMI M84 - Specification for Polished Single Crystal Silicon Wafers for Gallium Nitride-On-Silicon Applications
SEMI M84 - Specification for Polished Single Crystal Silicon Wafers for Gallium Nitride-On-Silicon Applications Sale priceMember Price: $113.00
Non-Member Price: $193.00
G07000 - SEMI G70 - Standard for Equipment and Leadframe Fixtures for Measurement of Plastic Package Leadframes
SEMI G70 - Standard for Equipment and Leadframe Fixtures for Measurement of Plastic Package Leadframes Sale priceMember Price: $113.00
Non-Member Price: $193.00
M07400 - SEMI M74 - Specification for 450 mm Diameter Mechanical Handling Polished Wafers
SEMI M74 - Specification for 450 mm Diameter Mechanical Handling Polished Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
G06600 - SEMI G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds
SEMI G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF138900 - SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $113.00
Non-Member Price: $193.00
G02500 - SEMI G25 - パッケージ・リード抵抗の測定のための試験方法
SEMI G25 - パッケージ・リード抵抗の測定のための試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
G04300 - SEMI G43 - Test Method for Junction-to-Case Thermal Resistance Measurements of Molded Plastic Packages
SEMI G43 - Test Method for Junction-to-Case Thermal Resistance Measurements of Molded Plastic Packages Sale priceMember Price: $113.00
Non-Member Price: $193.00
G09600 - SEMI G96 - Test Method for Measurement of Chip (Die) Strength by Mean of Cantilever Bending
SEMI G96 - Test Method for Measurement of Chip (Die) Strength by Mean of Cantilever Bending Sale price Member Price : $113.00
MF138800 - SEMI MF1388 - Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors
SEMI MF1388 - Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors Sale priceMember Price: $113.00
Non-Member Price: $193.00