SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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MF115200 - SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers
SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
ME139200 - SEMI ME1392 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces
SEMI ME1392 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF072800 - SEMI MF728 - Practice for Preparing an Optical Microscope for Dimensional Measurements
SEMI MF728 - Practice for Preparing an Optical Microscope for Dimensional Measurements Sale priceMember Price: $113.00
Non-Member Price: $193.00
M08500 - SEMI M85 - Guide for the Measurement of Trace Metal Contamination on Silicon Wafer Surface by Inductively Coupled Plasma Mass Spectrometry
SEMI M85 - Guide for the Measurement of Trace Metal Contamination on Silicon Wafer Surface by Inductively Coupled Plasma Mass Spectrometry Sale priceMember Price: $113.00
Non-Member Price: $193.00
G02400 - SEMI G24 - パッケージ・リード間の容量および付加容量の測定のための試験方法
SEMI G24 - パッケージ・リード間の容量および付加容量の測定のための試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
F06100 - SEMI F61 - Guide to Design and Operation of a Semiconductor Ultrapure Water System
SEMI F61 - Guide to Design and Operation of a Semiconductor Ultrapure Water System Sale priceMember Price: $113.00
Non-Member Price: $193.00
M06600 - SEMI M66 - Test Method to Extract Effective Work Function in Oxide and High-K Gate Stacks Using the MIS Flat Band Voltage-Insulator Thickness Technique
SEMI M66 - Test Method to Extract Effective Work Function in Oxide and High-K Gate Stacks Using the MIS Flat Band Voltage-Insulator Thickness Technique Sale priceMember Price: $113.00
Non-Member Price: $193.00
M04500 - SEMI M45 - Specification for 300 mm Wafer Shipping System
SEMI M45 - Specification for 300 mm Wafer Shipping System Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF152900 - SEMI MF1529 - Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure
SEMI MF1529 - Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure Sale priceMember Price: $113.00
Non-Member Price: $193.00
G04500 - SEMI G45 - Practice for Flash Characteristics of Thermosetting Molding Compounds
SEMI G45 - Practice for Flash Characteristics of Thermosetting Molding Compounds Sale priceMember Price: $113.00
Non-Member Price: $193.00
M04600 - SEMI M46 - ECV法によりエピタキシァル層内のキャリア密度プロファイルを測定するための試験方法
SEMI M46 - ECV法によりエピタキシァル層内のキャリア密度プロファイルを測定するための試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M01700 - SEMI M17 - Guide for a Universal Wafer Grid
SEMI M17 - Guide for a Universal Wafer Grid Sale priceMember Price: $113.00
Non-Member Price: $193.00
M06800 - SEMI M68 - 測定した高さデータ配列から曲率法ZDDを使ってウェーハのエッジ近傍形状を決定するための作業方法
SEMI M68 - 測定した高さデータ配列から曲率法ZDDを使ってウェーハのエッジ近傍形状を決定するための作業方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M05400 - SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters
SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF011000 - SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique
SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique Sale priceMember Price: $113.00
Non-Member Price: $193.00
M06000 - SEMI M60 - シリコンウェーハ評価のためのSiO2の経時絶縁破壊特性の試験方法
SEMI M60 - シリコンウェーハ評価のためのSiO2の経時絶縁破壊特性の試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M06800 - SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD
SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD Sale priceMember Price: $113.00
Non-Member Price: $193.00
G03800 - SEMI G38 - Test Method for Still- and Forced-Air Junction-to-Ambient Thermal Resistance Measurements of Integrated Circuit Packages
SEMI G38 - Test Method for Still- and Forced-Air Junction-to-Ambient Thermal Resistance Measurements of Integrated Circuit Packages Sale priceMember Price: $113.00
Non-Member Price: $193.00
F02300 - SEMI F23 - Specification for Particle Concentration of Grade 10/0.2 Hydrogen
SEMI F23 - Specification for Particle Concentration of Grade 10/0.2 Hydrogen Sale priceMember Price: $113.00
Non-Member Price: $193.00
M07500 - SEMI M75 - Specification for Polished Monocrystalline Gallium Antimonide Wafers
SEMI M75 - Specification for Polished Monocrystalline Gallium Antimonide Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
M06400 - SEMI M64 - 赤外線吸収スペクトル法による絶縁（SI）ガリウムヒ素単結晶内のEL2深いドナー濃度の試験方法
SEMI M64 - 赤外線吸収スペクトル法による絶縁（SI）ガリウムヒ素単結晶内のEL2深いドナー濃度の試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
F07800 - SEMI F78 - Practice for Gas Tungsten Arc (GTA) Welding of Fluid Distribution Systems in Semiconductor Manufacturing Applications
SEMI F78 - Practice for Gas Tungsten Arc (GTA) Welding of Fluid Distribution Systems in Semiconductor Manufacturing Applications Sale priceMember Price: $225.00
Non-Member Price: $380.00
M03500 - SEMI M35 - 自動検査により検出されるシリコンウェーハ表面特性の仕様を開発するためのガイド
SEMI M35 - 自動検査により検出されるシリコンウェーハ表面特性の仕様を開発するためのガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
F04400 - SEMI F44 - Specification for Machined Stainless Steel Weld Fittings
SEMI F44 - Specification for Machined Stainless Steel Weld Fittings Sale price Member Price : $113.00