개별 표준

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상품 1222개

3D00100 - SEMI 3D1 - 기하학적 계측을 통한 실리콘 관통 용어
SEMI 3D1 - 기하학적 계측을 통한 실리콘 관통 용어 할인 가격Member Price: ₩113
Non-Member Price: ₩290,000
3D00300 - SEMI 3D3 - 테이프 프레임의 300mm 얇은 실리콘 웨이퍼용 멀티 웨이퍼 운송 및 보관 용기용 안내서
SEMI 3D3 - 테이프 프레임의 300mm 얇은 실리콘 웨이퍼용 멀티 웨이퍼 운송 및 보관 용기용 안내서 할인 가격Member Price: ₩150
Non-Member Price: ₩290,000
3D00200 - SEMI 3D2 - 3DS-IC 애플리케이션용 유리 캐리어 웨이퍼 사양
SEMI 3D2 - 3DS-IC 애플리케이션용 유리 캐리어 웨이퍼 사양 할인 가격Member Price: ₩113
Non-Member Price: ₩290,000
A00100 - SEMI A1 - Specification for Production Equipment Smart Connection Interface (PESCI) - SEMI Dev 2
SEMI A1 - 생산 장비 스마트 연결 인터페이스(PESCI) 사양 할인 가격Member Price: ₩113
Non-Member Price: ₩256,000
3D00400 - SEMI 3D4 - 본딩된 웨이퍼 스택의 두께, 총 두께 변화(TTV), 보우, 워프/소리 및 평탄도를 측정하기 위한 계측 가이드
SEMI 3D4 - 본딩된 웨이퍼 스택의 두께, 총 두께 변화(TTV), 보우, 워프/소리 및 평탄도를 측정하기 위한 계측 가이드 할인 가격Member Price: ₩113
Non-Member Price: ₩290,000
FH00600 - SEMI FH6 - Terminology for Flexible Hybrid Electronics (FHE)
SEMI FH6 - Terminology for Flexible Hybrid Electronics (FHE) 할인 가격Member Price:
Non-Member Price: ₩290,000
A00100 - SEMI A1 - Specification for Production Equipment Smart Connection Interface (PESCI)
SEMI A1 - Specification for Production Equipment Smart Connection Interface (PESCI) 할인 가격 Member Price :
P03900 - SEMI P39 - Specification for OASIS® – Open Artwork System Interchange Standard
SEMI P39 - Specification for OASIS® – Open Artwork System Interchange Standard 할인 가격Member Price:
Non-Member Price: ₩571,000
S00200 - SEMI S2 - 반도체 제조장비에 대한 환경안전보건 가이드라인
SEMI S2 - 반도체 제조장비에 대한 환경안전보건 가이드라인 할인 가격Member Price: ₩113
Non-Member Price: ₩571,000
C03800 - SEMI C38 - 옥시염화인에 대한 지침
SEMI C38 - 옥시염화인에 대한 지침 할인 가격Member Price: ₩113
Non-Member Price: ₩290,000
C03900 - SEMI C39 - 수산화칼륨 펠릿 사양
SEMI C39 - 수산화칼륨 펠릿 사양 할인 가격Member Price: ₩113
Non-Member Price: ₩290,000
D08300 - SEMI D83 - Test Method for Warm-Up Properties of Display Picture Quality
SEMI D83 - Test Method for Warm-Up Properties of Display Picture Quality 할인 가격Member Price:
Non-Member Price: ₩290,000
HB01400 - SEMI HB14 - Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate
SEMI HB14 - Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate 할인 가격Member Price:
Non-Member Price: ₩290,000
FH00100 - SEMI FH1 - Test Method of Line Impedance for Electronic Textiles
SEMI FH1 - Test Method of Line Impedance for Electronic Textiles 할인 가격Member Price:
Non-Member Price: ₩290,000
FH00200 - SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles
SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles 할인 가격Member Price:
Non-Member Price: ₩290,000
M09200 - SEMI M92 - Specification for 4H-SIC Homoepitaxial Wafer
SEMI M92 - Specification for 4H-SIC Homoepitaxial Wafer 할인 가격₩290,000 KRW 부터
PV09800 - SEMI PV100 - Test Method of Wind Uplift Resistance for Photovoltaic Modules Roof (BIPV)
SEMI PV100 - Test Method of Wind Uplift Resistance for Photovoltaic Modules Roof (BIPV) 할인 가격Member Price:
Non-Member Price: ₩290,000
P04900 - SEMI P49 - Specification for Experimental Curvilinear Multigon Extension to SEMI P39
SEMI P49 - Specification for Experimental Curvilinear Multigon Extension to SEMI P39 할인 가격Member Price:
Non-Member Price: ₩290,000
PV10100 - SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building
SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building 할인 가격Member Price:
Non-Member Price: ₩290,000
F12100 - SEMI F121 - Guide for Evaluating Metrology for Particle Precursors in Ultrapure Water
SEMI F121 - Guide for Evaluating Metrology for Particle Precursors in Ultrapure Water 할인 가격Member Price:
Non-Member Price: ₩571,000
C10500 - SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA)
SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA) 할인 가격Member Price:
Non-Member Price: ₩290,000
M09300 - SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging
SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging 할인 가격Member Price:
Non-Member Price: ₩290,000
D08400 - SEMI D84 - Terminology for FPD Phase Shift Mask and Mask Blanks
SEMI D84 - Terminology for FPD Phase Shift Mask and Mask Blanks 할인 가격Member Price:
Non-Member Price: ₩290,000
FH00300 - SEMI FH3 - Guide for Salt Mist and Washability Test Flow for Control Module Connector of Wearables
SEMI FH3 - Guide for Salt Mist and Washability Test Flow for Control Module Connector of Wearables 할인 가격Member Price:
Non-Member Price: ₩290,000
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