Products

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SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M23 - 鏡面単結晶インジウムリンウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M24 - Specification for Polished Monocrystalline Silicon Premium Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M24 - 鏡面単結晶プレミアムシリコンウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M26 - Guide for the Re-Use of 100, 125, 150, and 200 mm Wafer Shipping Boxes Used to Transport Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M26 - ウェーハの運搬に使用される100 mm，125 mm，150 mm，200 mmウェーハシッピングボックスの再利用ガイド Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M29 - 300 mmシッピングボックスの仕様 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M29 - Specification for 300 mm Shipping Box Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M30 - Standard Test Method for Substitutional Atomic Carbon Concentration in GaAs by Fourier Transform Infrared Absorption Spectroscopy Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M31 - 300 mmウェーハの搬送および出荷用フロントオープニング・シッピングボックスの機械仕様 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M31 - Specification for Mechanical Features of Front-Opening Shipping Box Used to Transport and Ship 300 mm Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M32 - Guide to Statistical Specifications Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M32 - 統計的仕様のガイド Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M33 - Test Method for the Determination of Residual Surface Contamination on Silicon Wafers by Means of Total Reflection X-Ray Fluorescence Spectroscopy (TXRF) Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M34 - Guide for Specifying SIMOX Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M34 - SIMOXウェーハを規定するための指針 Sale priceMember Price: €135,00
Non-Member Price: €157,95

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SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M35 - 自動検査により検出されるシリコンウェーハ表面特性の仕様を開発するためのガイド Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M36 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Gallium Arsenide Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M36 - 低転位密度GaAs基板のエッチピット密度（EPD）測定方法 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M37 - 低転位密度Inp基板のエッチピット密度（EPD）測定方法 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M38 - Specification for Polished Reclaimed Silicon Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M38 - 鏡面リクレイムシリコンウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €177,95