Products

2142 products

M05200 - SEMI M52 - 130 nm,90nm,65nmおよび45nm技術世代シリコンウェーハ用走査型表面検査装置仕様のためのガイド
M05200 - SEMI M52 - Guide for Specifying Scanning Surface Inspection Systems for Silicon Wafers for the 130 nm to 5 nm Technology Generations
M05300 - SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces
M05300 - SEMI M53 - パターンのない半導体ウェーハ表面上に証明済み手法で付着した単分散標準粒子を用いた走査型表面検査システム較正の作業方法
M05400 - SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters
SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters Sale priceMember Price: €113,00
Non-Member Price: €148,95
M05400 - SEMI M54 - 半絶縁性(SI)GaAs材料のパラメータのガイド
SEMI M54 - 半絶縁性(SI)GaAs材料のパラメータのガイド Sale priceMember Price: €135,00
Non-Member Price: €176,95
M05500 - SEMI M55 - Specification for Polished Monocrystalline Silicon Carbide Wafers
SEMI M55 - Specification for Polished Monocrystalline Silicon Carbide Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95
M05500 - SEMI M55 - 鏡面単結晶シリコンカーバイドウェーハの仕様
SEMI M55 - 鏡面単結晶シリコンカーバイドウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €176,95
M05600 - SEMI M56 - Practice for Determining Cost Components for Metrology Equipment Due to Measurement Variability and Bias
M05600 - SEMI M56 - 計量装置の測定変動と偏りに起因する費用成分の作業法
SEMI M56 - 計量装置の測定変動と偏りに起因する費用成分の作業法 Sale priceMember Price: €135,00
Non-Member Price: €176,95
M05700 - SEMI M57 - Specification for Silicon Annealed Wafers
SEMI M57 - Specification for Silicon Annealed Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95
M05700 - SEMI M57 - シリコンアニールウェーハの仕様
SEMI M57 - シリコンアニールウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €176,95
M05800 - SEMI M58 - DMAを基にしたパーティクル堆積システムとプロセス評価のためのテスト方法
M05800 - SEMI M58 - Test Method for Evaluating DMA Based Particle Deposition Systems and Processes
SEMI M58 - Test Method for Evaluating DMA Based Particle Deposition Systems and Processes Sale priceMember Price: €113,00
Non-Member Price: €148,95
M05900 - SEMI M59 - Terminology for Silicon Technology
SEMI M59 - Terminology for Silicon Technology Sale priceMember Price: €113,00
Non-Member Price: €148,95
M05900 - SEMI M59 - シリコン技術の用語集
SEMI M59 - シリコン技術の用語集 Sale priceMember Price: €135,00
Non-Member Price: €176,95
M06000 - SEMI M60 - Test Method for Time Dependent Dielectric Breakdown Characteristics of SiO2 Films for Si Wafer Evaluation
M06000 - SEMI M60 - シリコンウェーハ評価のためのSiO2の経時絶縁破壊特性の試験方法
M06100 - SEMI M61 - Specification for Silicon Epitaxial Wafers with Buried Layers
SEMI M61 - Specification for Silicon Epitaxial Wafers with Buried Layers Sale priceMember Price: €113,00
Non-Member Price: €148,95
M06100 - SEMI M61 - 埋め込み層付きシリコンエピタキシャルウェーハの仕様
SEMI M61 - 埋め込み層付きシリコンエピタキシャルウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €176,95
M06200 - SEMI M62 - Specification for Silicon Epitaxial Wafers
SEMI M62 - Specification for Silicon Epitaxial Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95
M06200 - SEMI M62 - シリコンエピタキシャルウェーハの仕様
SEMI M62 - シリコンエピタキシャルウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €176,95
M06300 - SEMI M63 - Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction
M06300 - SEMI M63 - 化合物半導体エピタキシャルウェーハに使用するサファイア基板の仕様