Products

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SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M41 - 電源デバイス／IC用シリコン・オン・インシュレーター（SOI）の仕様 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M42 - Specification for Compound Semiconductor Epitaxial Wafers Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M42 - 化合物半導体エピタキシャルウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M43 - Guide for Reporting Wafer Nanotopography Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M43 - ウェーハナノポトグラフィを報告するためのガイド Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M44 - Guide to Conversion Factors for Interstitial Oxygen in Silicon Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M44 - シリコン中の酸素の換算係数ガイド Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M45 - 300 mmウェーハシッピングシステムに関する暫定仕様 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M45 - Specification for 300 mm Wafer Shipping System Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M46 - ECV法によりエピタキシァル層内のキャリア密度プロファイルを測定するための試験方法 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M47 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI Applications Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M48 - Guide for Evaluating Chemical-Mechanical Polishing Processes of Films on Unpatterned Silicon Substrates Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M49 - 130 nmから65 nmへの技術世代のシリコンウェーハ用ジオメトリ測定システム規定のためのガイド Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M49 - Guide for Specifying Geometry Measurement Systems for Silicon Wafers for the 130 nm to 16 nm Technology Generations Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M50 - オーバーレイ法による走査型表面検査システム用捕獲率および偽計数率を決定するための試験方法 Sale priceMember Price: €135,00
Non-Member Price: €177,95

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SEMI M51 - Test Method for Characterizing Silicon Wafer by Gate Oxide Integrity Sale priceMember Price: €113,00
Non-Member Price: €148,95

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SEMI M51 - シリコンウェーハ評価のためのSiO2の即時絶縁破壊特性（TZDB）の試験方法 Sale priceMember Price: €135,00
Non-Member Price: €177,95