SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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1900 products

D01700 - SEMI D17 - FPDガラス基板搬送用カセットの機械的仕様
SEMI D17 - FPDガラス基板搬送用カセットの機械的仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P01000 - SEMI P10 - フォトマスクオーダーのデータ構造の仕様
SEMI P10 - フォトマスクオーダーのデータ構造の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03300 - SEMI M33 - Test Method for the Determination of Residual Surface Contamination on Silicon Wafers by Means of Total Reflection X-Ray Fluorescence Spectroscopy (TXRF)
SEMI M33 - Test Method for the Determination of Residual Surface Contamination on Silicon Wafers by Means of Total Reflection X-Ray Fluorescence Spectroscopy (TXRF) Sale priceMember Price: $113.00
Non-Member Price: $193.00
G00500 - SEMI G5 - 仕様　セラミックチップキャリア（CCC）
SEMI G5 - 仕様　セラミックチップキャリア（CCC） Sale priceMember Price: $135.00
Non-Member Price: $193.00
Flex Electronics Webinar Master Class: May 2021 (on demand)
Flex Electronics Webinar Master Class: May 2021 (on demand) Sale priceMember Price: $49.00
Non-Member Price: $99.00
C10300 - SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing
SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing Sale priceMember Price: $113.00
Non-Member Price: $193.00
P00600 - SEMI P6 - フォトマスク用レジストレーションマーク
SEMI P6 - フォトマスク用レジストレーションマーク Sale priceMember Price: $135.00
Non-Member Price: $231.00
P01700 - SEMI P17 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresist Metal Ion Free (MIF) Developers by Inductively Coupled Plasma Emission Spectroscopy (ICP)
SEMI P17 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresist Metal Ion Free (MIF) Developers by Inductively Coupled Plasma Emission Spectroscopy (ICP) Sale priceMember Price: $113.00
Non-Member Price: $193.00
M03000 - SEMI M30 - Standard Test Method for Substitutional Atomic Carbon Concentration in GaAs by Fourier Transform Infrared Absorption Spectroscopy
SEMI M30 - Standard Test Method for Substitutional Atomic Carbon Concentration in GaAs by Fourier Transform Infrared Absorption Spectroscopy Sale priceMember Price: $113.00
Non-Member Price: $193.00
P00600 - SEMI P6 - Specification for Registration Marks for Photomasks
SEMI P6 - Specification for Registration Marks for Photomasks Sale priceMember Price: $113.00
Non-Member Price: $193.00
P03700 - SEMI P37 - Specification for Extreme Ultraviolet Lithography Substrates and Blanks
SEMI P37 - Specification for Extreme Ultraviolet Lithography Substrates and Blanks Sale priceMember Price: $113.00
Non-Member Price: $193.00
P04200 - SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様
SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
G06700 - SEMI G67 - シート材料から発生する粒子の測定の試験方法
SEMI G67 - シート材料から発生する粒子の測定の試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03900 - SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法
SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C04000 - SEMI C40 - 水酸化カリウム45%溶液の仕様
SEMI C40 - 水酸化カリウム45%溶液の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C00339 - SEMI C3.39 - 三フッ化窒素（NF3）99.98%品質の仕様
SEMI C3.39 - 三フッ化窒素（NF3）99.98%品質の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
Semiconductor Manufacturing Monitor Subscription
Semiconductor Manufacturing Monitor Subscription Sale priceMember Price: $2,750.00
Non-Member Price: $4,700.00
M07800 - SEMI M78 - 量産時における130nmから22nm世代のパターンなしシリコンウェーハ上のナノトポグラフィー決定に関するガイド
SEMI M78 - 量産時における130nmから22nm世代のパターンなしシリコンウェーハ上のナノトポグラフィー決定に関するガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
M01400 - SEMI M14 - Specification for Ion Implantation and Activation Process for Semi-Insulating Gallium Arsenide Single Crystals
SEMI M14 - Specification for Ion Implantation and Activation Process for Semi-Insulating Gallium Arsenide Single Crystals Sale priceMember Price: $113.00
Non-Member Price: $193.00
M02600 - SEMI M26 - ウェーハの運搬に使用される100 mm，125 mm，150 mm，200 mmウェーハシッピングボックスの再利用ガイド
SEMI M26 - ウェーハの運搬に使用される100 mm，125 mm，150 mm，200 mmウェーハシッピングボックスの再利用ガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
M01800 - SEMI M18 - シリコンウェーハ発注仕様書開発のガdイド
SEMI M18 - シリコンウェーハ発注仕様書開発のガdイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
M02000 - SEMI M20 - ウェーハ座標システムの確立の作業方法
SEMI M20 - ウェーハ座標システムの確立の作業方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
F02900 - SEMI F29 - ガスソースシステムパネルのパージ効果のテスト方法
SEMI F29 - ガスソースシステムパネルのパージ効果のテスト方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P00700 - SEMI P7 - Test Method of Viscosity Determination, Method A - Kinematic Viscosity
SEMI P7 - Test Method of Viscosity Determination, Method A - Kinematic Viscosity Sale priceMember Price: $113.00
Non-Member Price: $193.00