SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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P01900 - SEMI P19 - Specification for Metrology Pattern Cells for Integrated Circuit Manufacture
SEMI P19 - Specification for Metrology Pattern Cells for Integrated Circuit Manufacture Sale priceMember Price: $113.00
Non-Member Price: $193.00
C00300 - SEMI C3 - ガスの仕様
SEMI C3 - ガスの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C02900 - SEMI C29 - 4.9%フッ化ケイ素酸（10:1 V/V）の仕様とガイドライン
SEMI C29 - 4.9%フッ化ケイ素酸（10:1 V/V）の仕様とガイドライン Sale priceMember Price: $135.00
Non-Member Price: $231.00
3D01900 - SEMI 3D19 - Test Method for Adhesive Strength of Adhesive Tray Used for Thin Chip Handling
SEMI 3D19 - Test Method for Adhesive Strength of Adhesive Tray Used for Thin Chip Handling Sale priceMember Price: $113.00
Non-Member Price: $193.00
MS00800 - SEMI MS8 - Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages
SEMI MS8 - Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages Regular price$300.00 USD Sale price$193.00 USD
P01400 - SEMI P14 - Determination of Tin in Positive Photoresists by Graphite Furnace Atomic Absorption Spectroscopy
SEMI P14 - Determination of Tin in Positive Photoresists by Graphite Furnace Atomic Absorption Spectroscopy Sale priceMember Price: $113.00
Non-Member Price: $193.00
G03800 - SEMI G38 - 静止空気および強制風冷によるICパッケージのジャンクション部周囲間の熱抵抗の測定法
SEMI G38 - 静止空気および強制風冷によるICパッケージのジャンクション部周囲間の熱抵抗の測定法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P02300 - SEMI P23 - プログラム欠陥マスクおよびマスク欠陥検査システムの感度分析ベンチマーク手順についてのガイドライン
SEMI P23 - プログラム欠陥マスクおよびマスク欠陥検査システムの感度分析ベンチマーク手順についてのガイドライン Sale priceMember Price: $135.00
Non-Member Price: $231.00
MF172300 - SEMI MF1723 - Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy
SEMI MF1723 - Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy Sale priceMember Price: $113.00
Non-Member Price: $193.00
C03900 - SEMI C39 - Specification for Potassium Hydroxide Pellets
SEMI C39 - Specification for Potassium Hydroxide Pellets Sale priceMember Price: $113.00
Non-Member Price: $193.00
F02000 - SEMI F20 - 高純度および超高純度の半導体製造アプリケーションで使用される汎用コンポーネント用の316Lステンレス鋼の棒鋼，鍛造品，押出成形品，鋼板，鋼管の仕様
SEMI F20 - 高純度および超高純度の半導体製造アプリケーションで使用される汎用コンポーネント用の316Lステンレス鋼の棒鋼，鍛造品，押出成形品，鋼板，鋼管の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03700 - SEMI M37 - 低転位密度Inp基板のエッチピット密度（EPD）測定方法
SEMI M37 - 低転位密度Inp基板のエッチピット密度（EPD）測定方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03100 - SEMI M31 - 300 mmウェーハの搬送および出荷用フロントオープニング・シッピングボックスの機械仕様
SEMI M31 - 300 mmウェーハの搬送および出荷用フロントオープニング・シッピングボックスの機械仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P04700 - SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness
SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness Sale priceMember Price: $113.00
Non-Member Price: $193.00
G02600 - SEMI G26 - Specification for Hermetic Slam Chip Carrier Lids
SEMI G26 - Specification for Hermetic Slam Chip Carrier Lids Sale priceMember Price: $113.00
Non-Member Price: $150.00
PV03500 - SEMI PV35 - Specification for Horizontal Communication Between Equipment for Photovoltaic Fabrication System
SEMI PV35 - Specification for Horizontal Communication Between Equipment for Photovoltaic Fabrication System Sale priceMember Price: $113.00
Non-Member Price: $193.00
G08500 - SEMI G85 - マップデータ・フォーマット用仕様
SEMI G85 - マップデータ・フォーマット用仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03200 - SEMI M32 - 統計的仕様のガイド
SEMI M32 - 統計的仕様のガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
P03000 - SEMI P30 - 寸法測定用走査型電子顕微鏡（CD-SEM）の目録発行の実施要領
SEMI P30 - 寸法測定用走査型電子顕微鏡（CD-SEM）の目録発行の実施要領 Sale priceMember Price: $135.00
Non-Member Price: $231.00
D03100 - SEMI D31 - FPD画質検査における輝度ムラの計量単位（DSEMU）の定義
SEMI D31 - FPD画質検査における輝度ムラの計量単位（DSEMU）の定義 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03700 - SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers
SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF053400 - SEMI MF534 - Test Method for Bow of Silicon Wafers
SEMI MF534 - Test Method for Bow of Silicon Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
M02900 - SEMI M29 - Specification for 300 mm Shipping Box
SEMI M29 - Specification for 300 mm Shipping Box Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF039900 - SEMI MF399 - Test Method for Thickness of Heteroepitaxial or Polysilicon Layers
SEMI MF399 - Test Method for Thickness of Heteroepitaxial or Polysilicon Layers Sale priceMember Price: $113.00
Non-Member Price: $193.00