SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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T01400 - SEMI T14 - Specification for Micro ID on 300 mm Silicon Wafers
SEMI T14 - Specification for Micro ID on 300 mm Silicon Wafers Sale priceMember Price: $225.00
Non-Member Price: $380.00
C10000 - SEMI C100 - Guide for Reporting Chemical Mechanical Planarization (CMP) Polishing Pads Hardness Used in Semiconductor Manufacturing
SEMI C100 - Guide for Reporting Chemical Mechanical Planarization (CMP) Polishing Pads Hardness Used in Semiconductor Manufacturing Sale priceMember Price: $113.00
Non-Member Price: $193.00
P02900 - SEMI P29 - 減衰型位相シフトマスク（ハーフトーン型位相シフトマスク）およびマスクブランクスに特有な特性の仕様
SEMI P29 - 減衰型位相シフトマスク（ハーフトーン型位相シフトマスク）およびマスクブランクスに特有な特性の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C10100 - SEMI C101 - Test Method for Determining pH of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals
SEMI C101 - Test Method for Determining pH of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals Sale priceMember Price: $113.00
Non-Member Price: $193.00
M02200 - SEMI M22 - Specification for Dielectrically Isolated (DI) Wafers
SEMI M22 - Specification for Dielectrically Isolated (DI) Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
P01500 - SEMI P15 - Determination of Sodium and Potassium in Positive Photoresist Metal Ion Free (MIF) Developers by Atomic Absorption Spectroscopy
SEMI P15 - Determination of Sodium and Potassium in Positive Photoresist Metal Ion Free (MIF) Developers by Atomic Absorption Spectroscopy Sale priceMember Price: $113.00
Non-Member Price: $193.00
G08100 - SEMI G81 - マップデータ・アイテムの仕様
SEMI G81 - マップデータ・アイテムの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P01500 - SEMI P15 - 原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー（MIF）現像液中のナトリウムとカリウムの測定
SEMI P15 - 原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー（MIF）現像液中のナトリウムとカリウムの測定 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P01200 - SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP)
SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP) Sale priceMember Price: $113.00
Non-Member Price: $193.00
C00347 - SEMI C3.47 - 臭化水素（HBr），品質99.98%の仕様
SEMI C3.47 - 臭化水素（HBr），品質99.98%の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P03400 - SEMI P34 - Specification for 230 mm Square Photomask Substrates
SEMI P34 - Specification for 230 mm Square Photomask Substrates Sale priceMember Price: $113.00
Non-Member Price: $193.00
G08800 - SEMI G88 - 450mmウェーハ用テープフレームの仕様
SEMI G88 - 450mmウェーハ用テープフレームの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
G07100 - SEMI G71 - パッケージング材料の中間容器のバーコードマーキングの仕様
SEMI G71 - パッケージング材料の中間容器のバーコードマーキングの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03600 - SEMI M36 - 低転位密度GaAs基板のエッチピット密度（EPD）測定方法
SEMI M36 - 低転位密度GaAs基板のエッチピット密度（EPD）測定方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P00200 - SEMI P2 - Specification for Chrome Thin Films for Hard Surface Photomasks
SEMI P2 - Specification for Chrome Thin Films for Hard Surface Photomasks Sale priceMember Price: $113.00
Non-Member Price: $193.00
C02100 - SEMI C21 - 水酸化アンモニウムの仕様とガイドライン
SEMI C21 - 水酸化アンモニウムの仕様とガイドライン Sale priceMember Price: $135.00
Non-Member Price: $231.00
P04200 - SEMI P42 - Specification of Reticle Data for Automatic Recipe Transfer to Wafer Exposure System
SEMI P42 - Specification of Reticle Data for Automatic Recipe Transfer to Wafer Exposure System Sale priceMember Price: $113.00
Non-Member Price: $193.00
G07600 - SEMI G76 - Specification for Polyimide-Based Adhesive Tape Used in Tape Carrier Packages (TCP)
SEMI G76 - Specification for Polyimide-Based Adhesive Tape Used in Tape Carrier Packages (TCP) Sale priceMember Price: $113.00
Non-Member Price: $193.00
G07800 - SEMI G78 - Test Method for Comparing Automated Wafer Probe Systems Utilizing Process-Specific Measurements
SEMI G78 - Test Method for Comparing Automated Wafer Probe Systems Utilizing Process-Specific Measurements Sale priceMember Price: $113.00
Non-Member Price: $193.00
T01300 - SEMI T13 - Specification for Device Tracking: Concepts, Behavior, and Services
SEMI T13 - Specification for Device Tracking: Concepts, Behavior, and Services Sale priceMember Price: $225.00
Non-Member Price: $380.00
G02700 - SEMI G27 - Specification for Leadframes for Plastic Leaded Chip Carrier (PLCC) Packages
SEMI G27 - Specification for Leadframes for Plastic Leaded Chip Carrier (PLCC) Packages Sale priceMember Price: $113.00
Non-Member Price: $150.00
G06500 - SEMI G65 - Lリード（ガルウイング型）パッケージ用リードフレーム材料の評価の試験方法
SEMI G65 - Lリード（ガルウイング型）パッケージ用リードフレーム材料の評価の試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P01400 - SEMI P14 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト中の錫の測定
SEMI P14 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト中の錫の測定 Sale priceMember Price: $135.00
Non-Member Price: $231.00
D02900 - SEMI D29 - 平面顯示螢幕(FPD)彩色濾光片耐熱性計算之測試法
SEMI D29 - 平面顯示螢幕(FPD)彩色濾光片耐熱性計算之測試法 Sale priceMember Price: $113.00
Non-Member Price: $193.00