SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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G05800 - SEMI G58 - Specification for Cerquad Package Constructions
SEMI G58 - Specification for Cerquad Package Constructions Sale priceMember Price: $113.00
Non-Member Price: $193.00
G03200 - SEMI G32 - Guideline for Unencapsulated Thermal Test Chip
SEMI G32 - Guideline for Unencapsulated Thermal Test Chip Sale priceMember Price: $113.00
Non-Member Price: $193.00
F02300 - SEMI F23 - グレード10/0.2　引火性特殊ガスの粒子に関する仕様
SEMI F23 - グレード10/0.2　引火性特殊ガスの粒子に関する仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P01300 - SEMI P13 - Determination of Sodium and Potassium in Positive Photoresists by Atomic Absorption Spectroscopy
SEMI P13 - Determination of Sodium and Potassium in Positive Photoresists by Atomic Absorption Spectroscopy Sale priceMember Price: $113.00
Non-Member Price: $193.00
P02400 - SEMI P24 - CD Metrology Procedures
SEMI P24 - CD Metrology Procedures Sale priceMember Price: $113.00
Non-Member Price: $193.00
P01200 - SEMI P12 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト中の鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，及びニッケルの測定
SEMI P12 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト中の鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，及びニッケルの測定 Sale priceMember Price: $135.00
Non-Member Price: $231.00
F07100 - SEMI F71 - ガス供給システムの温度サイクル試験方法
SEMI F71 - ガス供給システムの温度サイクル試験方法 Regular price$300.00 USD Sale price$231.00 USD
M00100 - SEMI M1 - 鏡面単結晶シリコンウェーハの仕様
SEMI M1 - 鏡面単結晶シリコンウェーハの仕様 Sale priceMember Price: $135.00
Non-Member Price: $457.00
D07900 - SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays
SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays Sale priceMember Price: $113.00
Non-Member Price: $193.00
G08900 - SEMI G89 - リードフレームのストリップ寸法の規格
SEMI G89 - リードフレームのストリップ寸法の規格 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03200 - SEMI M32 - Guide to Statistical Specifications
SEMI M32 - Guide to Statistical Specifications Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF172400 - SEMI MF1724 - Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy
SEMI MF1724 - Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy Sale priceMember Price: $113.00
Non-Member Price: $193.00
P02100 - SEMI P21 - マスク描画装置の精度表示のガイドライン
SEMI P21 - マスク描画装置の精度表示のガイドライン Sale priceMember Price: $135.00
Non-Member Price: $231.00
C00358 - SEMI C3.58 - 八フッ化シクロブタン（C4F8），電子グレード，シリンダ充填，品質99.999%の仕様
SEMI C3.58 - 八フッ化シクロブタン（C4F8），電子グレード，シリンダ充填，品質99.999%の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M01000 - SEMI M10 - ガリウムヒ素ウェーハに見られる構造及び特徴の確認のための標準名称
SEMI M10 - ガリウムヒ素ウェーハに見られる構造及び特徴の確認のための標準名称 Sale priceMember Price: $135.00
Non-Member Price: $231.00
D03000 - SEMI D30 - FPDカラーフィルタの耐光性試験方法
SEMI D30 - FPDカラーフィルタの耐光性試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
D08000 - SEMI D80 - Test Method for Measurement of Water Vapor Transmission Rate for High Gas Barrier Plastic Film in a Short Time
SEMI D80 - Test Method for Measurement of Water Vapor Transmission Rate for High Gas Barrier Plastic Film in a Short Time Sale priceMember Price: $113.00
Non-Member Price: $193.00
G00300 - SEMI G3 - Specification for Sidebrazed Laminates
SEMI G3 - Specification for Sidebrazed Laminates Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV05000 - SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock
SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock Sale priceMember Price: $113.00
Non-Member Price: $193.00
F11500 - SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components
SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components Sale priceMember Price: $113.00
Non-Member Price: $193.00
G05300 - SEMI G53 - Specification for Metal Lid/Preform Assembly
SEMI G53 - Specification for Metal Lid/Preform Assembly Sale priceMember Price: $113.00
Non-Member Price: $193.00
Electronic Design Market Data (EDMD) - Single Edition
Electronic Design Market Data (EDMD) Single Edition Sale priceMember Price: $2,750.00
Non-Member Price: $5,200.00
G06400 - SEMI G64 - 全面めっきIC用リードフレーム（金，銀，銅，ニッケル，パラジウム/ニッケル，およびパラジウム）の仕様
SEMI G64 - 全面めっきIC用リードフレーム（金，銀，銅，ニッケル，パラジウム/ニッケル，およびパラジウム）の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M02600 - SEMI M26 - Guide for the Re-Use of 100, 125, 150, and 200 mm Wafer Shipping Boxes Used to Transport Wafers
SEMI M26 - Guide for the Re-Use of 100, 125, 150, and 200 mm Wafer Shipping Boxes Used to Transport Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00