SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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M04500 - SEMI M45 - 300 mmウェーハシッピングシステムに関する暫定仕様
SEMI M45 - 300 mmウェーハシッピングシステムに関する暫定仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03400 - SEMI M34 - SIMOXウェーハを規定するための指針
SEMI M34 - SIMOXウェーハを規定するための指針 Sale priceMember Price: $135.00
Non-Member Price: $180.00
P04100 - SEMI P41 - Specification for Mask Defect Data Handling with XML, Between Defect Inspection Tools, Repair Tools, and Review Tools
SEMI P41 - Specification for Mask Defect Data Handling with XML, Between Defect Inspection Tools, Repair Tools, and Review Tools Sale priceMember Price: $113.00
Non-Member Price: $193.00
M04800 - SEMI M48 - Guide for Evaluating Chemical-Mechanical Polishing Processes of Films on Unpatterned Silicon Substrates
SEMI M48 - Guide for Evaluating Chemical-Mechanical Polishing Processes of Films on Unpatterned Silicon Substrates Sale priceMember Price: $113.00
Non-Member Price: $193.00
G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment
SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Sale priceMember Price: $113.00
Non-Member Price: $193.00
P02300 - SEMI P23 - Guidelines for Programmed Defect Masks and Benchmark Procedures for Sensitivity Analysis of Mask Defect Inspection Systems
SEMI P23 - Guidelines for Programmed Defect Masks and Benchmark Procedures for Sensitivity Analysis of Mask Defect Inspection Systems Sale priceMember Price: $113.00
Non-Member Price: $193.00
C03800 - SEMI C38 - Guide for Phosphorus Oxychloride
SEMI C38 - Guide for Phosphorus Oxychloride Sale priceMember Price: $113.00
Non-Member Price: $193.00
E17900 - SEMI E179 - Specification for Protocol Buffers Common Components
SEMI E179 - Specification for Protocol Buffers Common Components Sale price Member Price : $113.00
G03200 - SEMI G32 - カプセルなし熱抵抗測定用チップのガイドライン
SEMI G32 - カプセルなし熱抵抗測定用チップのガイドライン Sale priceMember Price: $135.00
Non-Member Price: $180.00
M08900 - SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method
SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method Sale priceMember Price: $113.00
Non-Member Price: $193.00
G00600 - SEMI G6 - Test Method for Seal Ring Flatness
SEMI G6 - Test Method for Seal Ring Flatness Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV09200 - SEMI PV92 - Test Method for Extension of Flexible Thin Film Photovoltaic (PV) Modules
SEMI PV92 - Test Method for Extension of Flexible Thin Film Photovoltaic (PV) Modules Sale priceMember Price: $113.00
Non-Member Price: $193.00
E04400 - SEMI E44 - Guide for Procurment and Acceptance of Minienvironments
SEMI E44 - Guide for Procurment and Acceptance of Minienvironments Sale priceMember Price: $113.00
Non-Member Price: $193.00
M00800 - SEMI M8 - 鏡面単結晶シリコンテストウェーハの仕様
SEMI M8 - 鏡面単結晶シリコンテストウェーハの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C03000 - SEMI C30 - 過酸化水素の仕様
SEMI C30 - 過酸化水素の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
3D02000 - SEMI 3D20 - Specification for Panel Characteristics for Panel Level Packaging (PLP) Applications
SEMI 3D20 - Specification for Panel Characteristics for Panel Level Packaging (PLP) Applications Sale priceMember Price: $113.00
Non-Member Price: $193.00
M08100 - SEMI M81 - 単結晶シリコンカーバイド基板に存在する欠陥についてのガイド
SEMI M81 - 単結晶シリコンカーバイド基板に存在する欠陥についてのガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
M01500 - SEMI M15 - 半絶縁ガリウムヒ素ウェーハ用の鏡面ウェーハの許容表面欠陥表
SEMI M15 - 半絶縁ガリウムヒ素ウェーハ用の鏡面ウェーハの許容表面欠陥表 Sale priceMember Price: $135.00
Non-Member Price: $231.00
D00900 - SEMI D9 - FPD基板の用語
SEMI D9 - FPD基板の用語 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C00100 - SEMI C1 - 液体化学薬品の分析のためのガイド
SEMI C1 - 液体化学薬品の分析のためのガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
P02500 - SEMI P25 - Specification for Measuring Depth of Focus and Best Focus
SEMI P25 - Specification for Measuring Depth of Focus and Best Focus Sale priceMember Price: $113.00
Non-Member Price: $193.00
F10100 - SEMI F101 - ガス分配システムの圧力レギュレータの性能を決定するための試験方法
SEMI F101 - ガス分配システムの圧力レギュレータの性能を決定するための試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C0700 - SEMI C70 - 六フッ化タングステン（WF6）の仕様
SEMI C70 - 六フッ化タングステン（WF6）の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P01700 - SEMI P17 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト・メタルイオンフリー（MIF）現像液における鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，およびニッケルの測定
SEMI P17 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト・メタルイオンフリー（MIF）現像液における鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，およびニッケルの測定 Sale priceMember Price: $135.00
Non-Member Price: $231.00