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1638 製品

3D00100 - SEMI 3D1 - 幾何学的計測によるスルーシリコンの用語
SEMI 3D1 - 幾何学的計測によるスルーシリコンの用語 セール価格Member Price: ¥113
Non-Member Price: ¥31,900
SEMIViews - リーダーSEMIViews - リーダー
SEMIViews リーダー セール価格Member Price: ¥875
Non-Member Price: ¥328,300
3D00200 - SEMI 3D2 - 3DS-IC アプリケーション用のガラスキャリアウェーハの仕様
SEMI 3D2 - 3DS-IC アプリケーション用のガラスキャリアウェーハの仕様 セール価格Member Price: ¥113
Non-Member Price: ¥31,900
3D00300 - SEMI 3D3 - テープフレーム上の 300 mm 薄型シリコンウェーハ用マルチウェーハ輸送および保管コンテナのガイド
SEMI 3D3 - テープフレーム上の 300 mm 薄型シリコンウェーハ用マルチウェーハ輸送および保管コンテナのガイド セール価格Member Price: ¥150
Non-Member Price: ¥31,900
SEMIViews - Reader PlusSEMIViews - Reader Plus
SEMIViews Reader Plus セール価格Member Price: ¥1,560
Non-Member Price: ¥583,800
A00100 - SEMI A1 - Specification for Production Equipment Smart Connection Interface (PESCI) - SEMI Dev 2
SEMI A1 - 生産機器スマート接続インターフェース (PESCI) の仕様 セール価格Member Price: ¥113
Non-Member Price: ¥28,100
3D00400 - SEMI 3D4 - 貼り合わせたウェーハスタックの厚さ、総厚さ変動（TTV）、反り、反り/反り、および平坦度を測定するための計測ガイド
SEMI 3D4 - 貼り合わせたウェーハスタックの厚さ、総厚さ変動（TTV）、反り、反り/反り、および平坦度を測定するための計測ガイド セール価格Member Price: ¥113
Non-Member Price: ¥31,900
3D00100 - SEMI 3D1 - スルーシリコンビア（TSV）の幾何学的計測のための用語
SEMI 3D1 - スルーシリコンビア（TSV）の幾何学的計測のための用語 通常価格¥49,500 JPY セール価格¥38,100 JPY
FH00600 - SEMI FH6 - Terminology for Flexible Hybrid Electronics (FHE)
SEMI FH6 - Terminology for Flexible Hybrid Electronics (FHE) セール価格Member Price:
Non-Member Price: ¥31,900
A00100 - SEMI A1 - Specification for Production Equipment Smart Connection Interface (PESCI)
SEMI A1 - Specification for Production Equipment Smart Connection Interface (PESCI) セール価格 Member Price :
P03900 - SEMI P39 - Specification for OASIS® – Open Artwork System Interchange Standard
SEMI P39 - Specification for OASIS® – Open Artwork System Interchange Standard セール価格Member Price:
Non-Member Price: ¥62,700
D08300 - SEMI D83 - Test Method for Warm-Up Properties of Display Picture Quality
SEMI D83 - Test Method for Warm-Up Properties of Display Picture Quality セール価格Member Price:
Non-Member Price: ¥31,900
HB01400 - SEMI HB14 - Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate
SEMI HB14 - Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate セール価格Member Price:
Non-Member Price: ¥31,900
FH00100 - SEMI FH1 - Test Method of Line Impedance for Electronic Textiles
SEMI FH1 - Test Method of Line Impedance for Electronic Textiles セール価格Member Price:
Non-Member Price: ¥31,900
FH00200 - SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles
SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles セール価格Member Price:
Non-Member Price: ¥31,900
M09200 - SEMI M92 - Specification for 4H-SIC Homoepitaxial Wafer
SEMI M92 - Specification for 4H-SIC Homoepitaxial Wafer セール価格¥31,900 JPY から
PV09800 - SEMI PV100 - Test Method of Wind Uplift Resistance for Photovoltaic Modules Roof (BIPV)
SEMI PV100 - Test Method of Wind Uplift Resistance for Photovoltaic Modules Roof (BIPV) セール価格Member Price:
Non-Member Price: ¥31,900
P04900 - SEMI P49 - Specification for Experimental Curvilinear Multigon Extension to SEMI P39
SEMI P49 - Specification for Experimental Curvilinear Multigon Extension to SEMI P39 セール価格Member Price:
Non-Member Price: ¥31,900
PV10100 - SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building
SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building セール価格Member Price:
Non-Member Price: ¥31,900
F12100 - SEMI F121 - Guide for Evaluating Metrology for Particle Precursors in Ultrapure Water
SEMI F121 - Guide for Evaluating Metrology for Particle Precursors in Ultrapure Water セール価格Member Price:
Non-Member Price: ¥62,700
C10500 - SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA)
SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA) セール価格Member Price:
Non-Member Price: ¥31,900
M09300 - SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging
SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging セール価格Member Price:
Non-Member Price: ¥31,900
D08400 - SEMI D84 - Terminology for FPD Phase Shift Mask and Mask Blanks
SEMI D84 - Terminology for FPD Phase Shift Mask and Mask Blanks セール価格Member Price:
Non-Member Price: ¥31,900
FH00300 - SEMI FH3 - Guide for Salt Mist and Washability Test Flow for Control Module Connector of Wearables
SEMI FH3 - Guide for Salt Mist and Washability Test Flow for Control Module Connector of Wearables セール価格Member Price:
Non-Member Price: ¥31,900
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