SEMI 3D16 - Specification for Glass Base Material for Semiconductor Pa – Page 60

1910 products

MF002800 - SEMI MF28 - Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay

SEMI MF28 - Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay

Member Price: €113,00
Non-Member Price: €171,95

G01000 - SEMI G10 - プラスチックパッケージリードフレームの機械的標準測定方法

SEMI G10 - プラスチックパッケージリードフレームの機械的標準測定方法

Member Price: €135,00
Non-Member Price: €205,95

M05000 - SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method

SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method

Member Price: €113,00
Non-Member Price: €171,95

G03100 - SEMI G31 - Test Method for Determining the Abrasive Characteristics of Molding Compounds

SEMI G31 - Test Method for Determining the Abrasive Characteristics of Molding Compounds

Member Price: €113,00
Non-Member Price: €171,95

E01000 - SEMI E10 - Specification for Definition and Measurement of Equipment Reliability, Availability, and Maintainability (RAM) and Utilization

SEMI E10 - Specification for Definition and Measurement of Equipment Reliability, Availability, and Maintainability (RAM) and Utilization

Member Price: €225,00
Non-Member Price: €337,95

E03700 - SEMI E37 - Specification for High-Speed SECS Message Services (HSMS) Generic Services

SEMI E37 - Specification for High-Speed SECS Message Services (HSMS) Generic Services

Member Price: €225,00
Non-Member Price: €337,95

E04000 - SEMI E40 - Specification for Processing Management

SEMI E40 - Specification for Processing Management

Member Price: €113,00
Non-Member Price: €171,95

E00400 - SEMI E4 - Specification for SEMI Equipment Communications Standard 1 Message Transfer (SECS-I)

SEMI E4 - Specification for SEMI Equipment Communications Standard 1 Message Transfer (SECS-I)

Member Price: €113,00
Non-Member Price: €171,95

G09700 - SEMI G97 - Specification for Adhesive Tray Used for Thin Chip Handling

SEMI G97 - Specification for Adhesive Tray Used for Thin Chip Handling

Member Price: €113,00
Non-Member Price: €171,95

E03900 - SEMI E39 - Specification for Object Services: Concepts, Behavior, and Services

SEMI E39 - Specification for Object Services: Concepts, Behavior, and Services

Member Price: €113,00
Non-Member Price: €171,95

F10500 - SEMI F105 - Guide for Metallic Material Compatibility in Gas Distribution Systems

SEMI F105 - Guide for Metallic Material Compatibility in Gas Distribution Systems

Member Price: €113,00
Non-Member Price: €171,95

MF136600 - SEMI MF1366 - Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry

SEMI MF1366 - Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry

Member Price: €113,00
Non-Member Price: €171,95

M07000 - SEMI M70 - Test Method for Determining Wafer-Near-Edge Geometry Using Partial Wafer Site Flatness

SEMI M70 - Test Method for Determining Wafer-Near-Edge Geometry Using Partial Wafer Site Flatness

Member Price: €113,00
Non-Member Price: €171,95

E00500 - SEMI E5 - 半導体製造装置通信スタンダード2 メッセージ内容（SECS-II）

SEMI E5 - 半導体製造装置通信スタンダード2 メッセージ内容（SECS-II）

Member Price: €135,00
Non-Member Price: €405,95

E13200 - SEMI E132 - Specification for Equipment Client Authentication and Authorization

SEMI E132 - Specification for Equipment Client Authentication and Authorization

From €171,95 EUR

E11600 - SEMI E116 - Specification for Equipment Performance Tracking

SEMI E116 - Specification for Equipment Performance Tracking

Member Price: €225,00
Non-Member Price: €337,95

E09000 - SEMI E90 - Specification for Substrate Tracking

SEMI E90 - Specification for Substrate Tracking

From €171,95 EUR

World Fab Forecast - Subscription

World Fab Forecast Subscription

Member Price: €6.300,00
Non-Member Price: €9.848,95

MF115300 - SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements

SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements

Member Price: €113,00
Non-Member Price: €171,95

G02000 - SEMI G20 - Specification for Lead Finishes for Plastic Packages (Active Devices Only)

SEMI G20 - Specification for Lead Finishes for Plastic Packages (Active Devices Only)

Member Price: €113,00
Non-Member Price: €171,95

E15300 - SEMI E153 - Specification for AMHS SEM (AMHS SEM)

SEMI E153 - Specification for AMHS SEM (AMHS SEM)

Member Price: €113,00
Non-Member Price: €171,95

F03800 - SEMI F38 - Test Method for Efficiency Qualification of Point-of-Use Gas Filters

SEMI F38 - Test Method for Efficiency Qualification of Point-of-Use Gas Filters

Member Price: €113,00
Non-Member Price: €171,95

G01500 - SEMI G15 - Standard Test Method for Differential Scanning Calorimetry of Molding Compounds

SEMI G15 - Standard Test Method for Differential Scanning Calorimetry of Molding Compounds

Member Price: €113,00
Non-Member Price: €171,95

E15700 - SEMI E157 - Specification for Module and Substrate Process Tracking

E15700 - SEMI E157 - Specification for Module and Substrate Process Tracking

SEMI E157 - Specification for Module and Substrate Process Tracking

From €171,95 EUR