SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

M02100 - SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array
SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array Sale priceMember Price: €113,00
Non-Member Price: €171,95
F02500 - SEMI F25 - Specification for Particle Concentration of Grade 10/0.2 Oxidant Specialty Gases
SEMI F25 - Specification for Particle Concentration of Grade 10/0.2 Oxidant Specialty Gases Sale priceMember Price: €113,00
Non-Member Price: €171,95
M06100 - SEMI M61 - Specification for Silicon Epitaxial Wafers with Buried Layers
SEMI M61 - Specification for Silicon Epitaxial Wafers with Buried Layers Sale priceMember Price: €113,00
Non-Member Price: €171,95
M07900 - SEMI M79 - Specification for Round 100 mm Polished Monocrystalline Germanium Wafers for Solar Cell Applications
SEMI M79 - Specification for Round 100 mm Polished Monocrystalline Germanium Wafers for Solar Cell Applications Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF156900 - SEMI MF1569 - Guide for Generation of Consensus Reference Materials for Semiconductor Technology
SEMI MF1569 - Guide for Generation of Consensus Reference Materials for Semiconductor Technology Sale priceMember Price: €113,00
Non-Member Price: €171,95
G01500 - SEMI G15 - モールディングコンパウンド示差走査熱量分析の標準試験方法
SEMI G15 - モールディングコンパウンド示差走査熱量分析の標準試験方法 Sale priceMember Price: €135,00
Non-Member Price: €205,95
MF172500 - SEMI MF1725 - Practice for Analysis of Crystallographic Perfection of Silicon Ingots
SEMI MF1725 - Practice for Analysis of Crystallographic Perfection of Silicon Ingots Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF067200 - SEMI MF672 - Guide for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe
SEMI MF672 - Guide for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe Sale priceMember Price: €113,00
Non-Member Price: €171,95
M06500 - SEMI M65 - Specification for Sapphire Substrates to use for Compound Semiconductor Epitaxial Wafers
SEMI M65 - Specification for Sapphire Substrates to use for Compound Semiconductor Epitaxial Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
G06300 - SEMI G63 - Test Method for Measurement of Die Shear Strength
SEMI G63 - Test Method for Measurement of Die Shear Strength Sale priceMember Price: €113,00
Non-Member Price: €171,95
M07100 - SEMI M71 - CMOS LSI用シリコン・オン・インシュレーター（SOI）ウェーハのための仕様
SEMI M71 - CMOS LSI用シリコン・オン・インシュレーター（SOI）ウェーハのための仕様 Sale priceMember Price: €135,00
Non-Member Price: €205,95
MF067100 - SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials
SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials Sale priceMember Price: €113,00
Non-Member Price: €171,95
M04200 - SEMI M42 - 化合物半導体エピタキシャルウェーハの仕様
SEMI M42 - 化合物半導体エピタキシャルウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €205,95
M03800 - SEMI M38 - Specification for Polished Reclaimed Silicon Wafers
SEMI M38 - Specification for Polished Reclaimed Silicon Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
G02400 - SEMI G24 - Test Method for Measuring the Lead-to-Lead and Loading Capacitance of Package Leads
SEMI G24 - Test Method for Measuring the Lead-to-Lead and Loading Capacitance of Package Leads Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF161700 - SEMI MF1617 - Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and EPI Substrates by Secondary Ion Mass Spectrometry
SEMI MF1617 - Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and EPI Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: €113,00
Non-Member Price: €171,95
M05100 - SEMI M51 - Test Method for Characterizing Silicon Wafer by Gate Oxide Integrity
SEMI M51 - Test Method for Characterizing Silicon Wafer by Gate Oxide Integrity Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF177100 - SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique
SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique Sale priceMember Price: €113,00
Non-Member Price: €171,95
G05100 - SEMI G51 - Specification for Plastic Molded (Metric) Quad Flat Pack Leadframes
SEMI G51 - Specification for Plastic Molded (Metric) Quad Flat Pack Leadframes Sale priceMember Price: €113,00
Non-Member Price: €171,95
F02000 - SEMI F20 - Specification for 316L Stainless Steel Bar, Forgings, Extruded Shapes, Plate, and Tubing for Components Used in General Purpose, High Purity and Ultra-High Purity Semiconductor Manufacturing Applications
SEMI F20 - Specification for 316L Stainless Steel Bar, Forgings, Extruded Shapes, Plate, and Tubing for Components Used in General Purpose, High Purity and Ultra-High Purity Semiconductor Manufacturing Applications Sale priceMember Price: €225,00
Non-Member Price: €337,95
G06700 - SEMI G67 - Test Method for the Measurement of Particle Generation from Sheet Materials
SEMI G67 - Test Method for the Measurement of Particle Generation from Sheet Materials Sale priceMember Price: €113,00
Non-Member Price: €171,95
G09400 - SEMI G94 - Specification for Coin-Stack Type Tape Frame Shipping Container for 300 mm Wafer
SEMI G94 - Specification for Coin-Stack Type Tape Frame Shipping Container for 300 mm Wafer Sale priceMember Price: €113,00
Non-Member Price: €171,95
M04000 - SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド
SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド Sale priceMember Price: €135,00
Non-Member Price: €205,95
G02100 - SEMI G21 - Specification for Plating Integrated Circuit Leadframes
SEMI G21 - Specification for Plating Integrated Circuit Leadframes Sale priceMember Price: €113,00
Non-Member Price: €171,95