SEMI 3D16 - Specification for Glass Base Material for Semiconductor Pa – Page 57

1910 products

M07100 - SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI

SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI

Member Price: €113,00
Non-Member Price: €171,95

G09500 - SEMI G95 - 後工程における450mmウェーハ用テープフレームカセットのためのロードポートの機械的インタフェースの仕様

SEMI G95 - 後工程における450mmウェーハ用テープフレームカセットのためのロードポートの機械的インタフェースの仕様

Member Price: €135,00
Non-Member Price: €205,95

MF139000 - SEMI MF1390 - Test Method for Measuring Bow and Warp on Silicon Wafers by Automated Noncontact Scanning

SEMI MF1390 - Test Method for Measuring Bow and Warp on Silicon Wafers by Automated Noncontact Scanning

Member Price: €113,00
Non-Member Price: €171,95

G07100 - SEMI G71 - Specification for Barcode Marking of Intermediate Containers for Packaging Materials

SEMI G71 - Specification for Barcode Marking of Intermediate Containers for Packaging Materials

Member Price: €113,00
Non-Member Price: €171,95

M06700 - SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics

SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics

Member Price: €113,00
Non-Member Price: €171,95

F05400 - SEMI F54 - Test Method for Measuring the Counting Efficiency of Condensation Nucleus Counters

SEMI F54 - Test Method for Measuring the Counting Efficiency of Condensation Nucleus Counters

Member Price: €113,00
Non-Member Price: €171,95

MF072300 - SEMI MF723 - Practice for Conversion Between Resistivity and Dopant or Carrier Density for Boron-Doped, Phosphorous-Doped, and Arsenic-Doped Silicon

SEMI MF723 - Practice for Conversion Between Resistivity and Dopant or Carrier Density for Boron-Doped, Phosphorous-Doped, and Arsenic-Doped Silicon

Member Price: €113,00
Non-Member Price: €171,95

M01700 - SEMI M17 - 一般的なウェーハグリッドのガイド

SEMI M17 - 一般的なウェーハグリッドのガイド

Member Price: €135,00
Non-Member Price: €205,95

MF181000 - SEMI MF1810 - Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers

SEMI MF1810 - Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers

Member Price: €113,00
Non-Member Price: €171,95

G06500 - SEMI G65 - Test Method for Evaluation of Leadframe Materials Used for L-Leaded (Gull Wing Type) Packages

SEMI G65 - Test Method for Evaluation of Leadframe Materials Used for L-Leaded (Gull Wing Type) Packages

Member Price: €113,00
Non-Member Price: €171,95

F11000 - SEMI F110 - Test Method for Mono-Dispersed Polystyrene Latex (PSL) Challenge of Liquid Filters

SEMI F110 - Test Method for Mono-Dispersed Polystyrene Latex (PSL) Challenge of Liquid Filters

Member Price: €113,00
Non-Member Price: €171,95

MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials

SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials

Member Price: €113,00
Non-Member Price: €171,95

MF161900 - SEMI MF1619 - Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle

SEMI MF1619 - Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle

Member Price: €113,00
Non-Member Price: €171,95

F07500 - SEMI F75 - Guide for Quality Monitoring of Ultrapure Water Used in Semiconductor Manufacturing

SEMI F75 - Guide for Quality Monitoring of Ultrapure Water Used in Semiconductor Manufacturing

Member Price: €113,00
Non-Member Price: €171,95

F10100 - SEMI F101 - Test Method for Determining Pressure Regulator Performance in Gas Distribution Systems

SEMI F101 - Test Method for Determining Pressure Regulator Performance in Gas Distribution Systems

Member Price: €113,00
Non-Member Price: €171,95

MF123900 - SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction

SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction

Member Price: €113,00
Non-Member Price: €171,95

MF002600 - SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal

SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal

Member Price: €113,00
Non-Member Price: €171,95

MF052300 - SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces

SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces

Member Price: €113,00
Non-Member Price: €171,95

M06600 - SEMI M66 - MISフラットバンド電圧―絶縁膜厚法を使った，酸化膜，およびhigh-κゲートスタックの有効仕事関数の算出方法

SEMI M66 - MISフラットバンド電圧―絶縁膜厚法を使った，酸化膜，およびhigh-κゲートスタックの有効仕事関数の算出方法

Member Price: €135,00
Non-Member Price: €205,95

F06300 - SEMI F63 - Guide for Ultrapure Water Used in Semiconductor Processing

SEMI F63 - Guide for Ultrapure Water Used in Semiconductor Processing

Member Price: €252,00
Non-Member Price: €337,95

M04100 - SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs

SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs

Member Price: €113,00
Non-Member Price: €171,95

M05800 - SEMI M58 - Test Method for Evaluating DMA Based Particle Deposition Systems and Processes

SEMI M58 - Test Method for Evaluating DMA Based Particle Deposition Systems and Processes

Member Price: €113,00
Non-Member Price: €171,95

MF161800 - SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers

SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers

Member Price: €113,00
Non-Member Price: €171,95

M04600 - SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling

SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling

Member Price: €113,00
Non-Member Price: €171,95