SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

M08400 - SEMI M84 - Specification for Polished Single Crystal Silicon Wafers for Gallium Nitride-On-Silicon Applications
SEMI M84 - Specification for Polished Single Crystal Silicon Wafers for Gallium Nitride-On-Silicon Applications Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF198200 - SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography
SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography Sale priceMember Price: €113,00
Non-Member Price: €171,95
G07000 - SEMI G70 - Standard for Equipment and Leadframe Fixtures for Measurement of Plastic Package Leadframes
SEMI G70 - Standard for Equipment and Leadframe Fixtures for Measurement of Plastic Package Leadframes Sale priceMember Price: €113,00
Non-Member Price: €171,95
G02500 - SEMI G25 - パッケージ・リード抵抗の測定のための試験方法
SEMI G25 - パッケージ・リード抵抗の測定のための試験方法 Sale priceMember Price: €135,00
Non-Member Price: €205,95
M07400 - SEMI M74 - Specification for 450 mm Diameter Mechanical Handling Polished Wafers
SEMI M74 - Specification for 450 mm Diameter Mechanical Handling Polished Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
G06600 - SEMI G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds
SEMI G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF138900 - SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: €113,00
Non-Member Price: €171,95
G04300 - SEMI G43 - Test Method for Junction-to-Case Thermal Resistance Measurements of Molded Plastic Packages
SEMI G43 - Test Method for Junction-to-Case Thermal Resistance Measurements of Molded Plastic Packages Sale priceMember Price: €113,00
Non-Member Price: €171,95
G09600 - SEMI G96 - Test Method for Measurement of Chip (Die) Strength by Mean of Cantilever Bending
SEMI G96 - Test Method for Measurement of Chip (Die) Strength by Mean of Cantilever Bending Sale priceFrom €171,95 EUR
MF139100 - SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption
SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF138800 - SEMI MF1388 - Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors
SEMI MF1388 - Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors Sale priceMember Price: €113,00
Non-Member Price: €171,95
G08900 - SEMI G89 - Specification for Leadframe Strip Size
SEMI G89 - Specification for Leadframe Strip Size Sale priceMember Price: €113,00
Non-Member Price: €171,95
M06200 - SEMI M62 - Specification for Silicon Epitaxial Wafers
SEMI M62 - Specification for Silicon Epitaxial Wafers Sale priceFrom €171,95 EUR
MF039100 - SEMI MF391 - Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage
SEMI MF391 - Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage Sale priceMember Price: €113,00
Non-Member Price: €171,95
M00600 - SEMI M6 - 太陽光電池用シリコンウェーハの仕様
SEMI M6 - 太陽光電池用シリコンウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €159,95
MF207400 - SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers
SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
HB00800 - SEMI HB8 - Test Method for Determining Orientation of a Sapphire Single Crystal
SEMI HB8 - Test Method for Determining Orientation of a Sapphire Single Crystal Sale priceMember Price: €113,00
Non-Member Price: €171,95
F07000 - SEMI F70 - Test Method for Determination of Particle Contribution of Gas Delivery System
SEMI F70 - Test Method for Determination of Particle Contribution of Gas Delivery System Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF152800 - SEMI MF1528 - Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF1528 - Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: €113,00
Non-Member Price: €171,95
G04100 - SEMI G41 - Specification for Dual Strip SOIC Leadframe
SEMI G41 - Specification for Dual Strip SOIC Leadframe Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF172600 - SEMI MF1726 - Practice for Analysis of Crystallographic Perfection of Silicon Wafers
SEMI MF1726 - Practice for Analysis of Crystallographic Perfection of Silicon Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
G09300 - SEMI G93 - ボール・グリッド・アレイ（BGA）パッケージ用はんだボールの測定方法
SEMI G93 - ボール・グリッド・アレイ（BGA）パッケージ用はんだボールの測定方法 Sale priceMember Price: €135,00
Non-Member Price: €205,95
MF181100 - SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data
SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data Sale priceMember Price: €113,00
Non-Member Price: €171,95
M06500 - SEMI M65 - 化合物半導体エピタキシャルウェーハに使用するサファイア基板の仕様
SEMI M65 - 化合物半導体エピタキシャルウェーハに使用するサファイア基板の仕様 Sale priceMember Price: €135,00
Non-Member Price: €205,95