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1222 products

E13200 - SEMI E132 - Specification for Equipment Client Authentication and Authorization
SEMI E132 - Specification for Equipment Client Authentication and Authorization Sale price Member Price : ₩113
E09000 - SEMI E90 - Specification for Substrate Tracking
SEMI E90 - Specification for Substrate Tracking Sale price Member Price : ₩113
E11600 - SEMI E116 - Specification for Equipment Performance Tracking
SEMI E116 - Specification for Equipment Performance Tracking Sale priceMember Price: ₩225
Non-Member Price: ₩571,000
MF115300 - SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements
SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
G02000 - SEMI G20 - Specification for Lead Finishes for Plastic Packages (Active Devices Only)
SEMI G20 - Specification for Lead Finishes for Plastic Packages (Active Devices Only) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E15300 - SEMI E153 - Specification for AMHS SEM (AMHS SEM)
SEMI E153 - Specification for AMHS SEM (AMHS SEM) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
F03800 - SEMI F38 - Test Method for Efficiency Qualification of Point-of-Use Gas Filters
SEMI F38 - Test Method for Efficiency Qualification of Point-of-Use Gas Filters Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
G01500 - SEMI G15 - Standard Test Method for Differential Scanning Calorimetry of Molding Compounds
SEMI G15 - Standard Test Method for Differential Scanning Calorimetry of Molding Compounds Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E15700 - SEMI E157 - Specification for Module and Substrate Process TrackingE15700 - SEMI E157 - Specification for Module and Substrate Process Tracking
SEMI E157 - Specification for Module and Substrate Process Tracking Sale price Member Price : ₩113
E03005 - SEMI E30.5 - Specification for Metrology Specific Equipment Model (MSEM)
SEMI E30.5 - Specification for Metrology Specific Equipment Model (MSEM) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E06600 - SEMI E66 - Test Method for Determining Particle Contribution by Mass Flow Controllers
SEMI E66 - Test Method for Determining Particle Contribution by Mass Flow Controllers Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E05412 - SEMI E54.12 - Specification for Sensor/Actuator Network Communications for CC-Link
SEMI E54.12 - Specification for Sensor/Actuator Network Communications for CC-Link Sale price Member Price : ₩113
E14300 - SEMI E143 - Test Method for Measuring Power and Variation into a 50-Ω Load and Power Variation and Spectrum into a Load with a VSWR of 2.0 at any phase Angle
SEMI E143 - Test Method for Measuring Power and Variation into a 50-Ω Load and Power Variation and Spectrum into a Load with a VSWR of 2.0 at any phase Angle Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
D06800 - SEMI D68 - Test Method for Optical Properties of Electronic Paper Displays
SEMI D68 - Test Method for Optical Properties of Electronic Paper Displays Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
G00400 - SEMI G4 - スタンピングリードフレーム製品で使用されるICリードフレーム材料の仕様
SEMI G4 - スタンピングリードフレーム製品で使用されるICリードフレーム材料の仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
E14200 - SEMI E142 - Specification for Substrate Mapping
SEMI E142 - Specification for Substrate Mapping Sale price Member Price : ₩225
E05418 - SEMI E54.18 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pump Device
SEMI E54.18 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pump Device Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E16700 - SEMI E167 - Specification for Equipment Energy Saving Mode Communications (EESM)
SEMI E167 - Specification for Equipment Energy Saving Mode Communications (EESM) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E05404 - SEMI E54.4 - Specification for Sensor/Actuator Network Communications for DeviceNet
SEMI E54.4 - Specification for Sensor/Actuator Network Communications for DeviceNet Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
D07800 - SEMI D78 - Test Method of Water Vapor Barrier Property for Plastic Films with High Gas Barrier for Electronic Devices
SEMI D78 - Test Method of Water Vapor Barrier Property for Plastic Films with High Gas Barrier for Electronic Devices Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E12200 - SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM)
SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E08800 - SEMI E88 - Specification for AMHS Storage SEM (Stocker SEM)
SEMI E88 - Specification for AMHS Storage SEM (Stocker SEM) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E08000 - SEMI E80 - Test Method for Determining Attitude Sensitivity of Mass Flow Controllers (Mounting Position)
SEMI E80 - Test Method for Determining Attitude Sensitivity of Mass Flow Controllers (Mounting Position) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
F04300 - SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters
SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
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