SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

C09900 - SEMI C99 - Test Method for Determining Conductivity of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals
SEMI C99 - Test Method for Determining Conductivity of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F11600 - SEMI F116 - Guide for Drain Segregation for Semiconductor Manufacturing Tools to Support Site Water Reuse
SEMI F116 - Guide for Drain Segregation for Semiconductor Manufacturing Tools to Support Site Water Reuse Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Flex Electronics Webinar Master Class: July 2020 (On Demand)
Flex Electronics Webinar Master Class: July 2020 (On Demand) Sale priceMember Price: ¥25
Non-Member Price: ¥8,100
P04000 - SEMI P40 - 極紫外線リソグラフィマスクの取り付けに関する要求条件およびアライメント基準位置の仕様
SEMI P40 - 極紫外線リソグラフィマスクの取り付けに関する要求条件およびアライメント基準位置の仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
T01600 - SEMI T16 - 極紫外線マスク自動識別用データマトリクス記号法適用の仕様
SEMI T16 - 極紫外線マスク自動識別用データマトリクス記号法適用の仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Flex Electronics Webinar Master Class: April 2021 (on demand)
Flex Electronics Webinar Master Class: April 2021 (on demand) Sale priceMember Price: ¥49
Non-Member Price: ¥16,400
P03600 - SEMI P36 - 測長走査型電子顕微鏡（CD-SEM）用倍率標準試料のガイド
SEMI P36 - 測長走査型電子顕微鏡（CD-SEM）用倍率標準試料のガイド Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
HB01300 - SEMI HB13 - Specification of Susceptors for HB-LED MOCVD Equipment Communication Interface
SEMI HB13 - Specification of Susceptors for HB-LED MOCVD Equipment Communication Interface Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G06100 - SEMI G61 - Specification for Cofired Ceramic Packages
SEMI G61 - Specification for Cofired Ceramic Packages Sale priceMember Price: ¥113
Non-Member Price: ¥24,800
Semiconductor Fabrication Worker Safety Part 2
Semiconductor Fabrication Worker Safety Part 2 Sale priceMember Price: ¥30
Non-Member Price: ¥7,200
G00900 - SEMI G9 - 仕様　スタンピングによる半導体プラスチックDIPパッケージ用リードフレーム
SEMI G9 - 仕様　スタンピングによる半導体プラスチックDIPパッケージ用リードフレーム Sale priceMember Price: ¥135
Non-Member Price: ¥29,700
E17700 - SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows
SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P04500 - SEMI P45 - マスク装置向けジョブデック・データフォーマットの仕様
SEMI P45 - マスク装置向けジョブデック・データフォーマットの仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
T01200 - SEMI T12 - Specification for Tracing Jigs and Implements
SEMI T12 - Specification for Tracing Jigs and Implements Sale priceMember Price: ¥225
Non-Member Price: ¥62,700
G04700 - SEMI G47 - Specification for Plastic Molded Quad Flat Pack Leadframes
SEMI G47 - Specification for Plastic Molded Quad Flat Pack Leadframes Sale priceMember Price: ¥113
Non-Member Price: ¥24,800
E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb)
SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E18100 - SEMI E181 - Specification for Panel FOUP for Panel Level Packaging
SEMI E181 - Specification for Panel FOUP for Panel Level Packaging Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P00700 - SEMI P7 - 粘性決定方法，方法A－動粘度
SEMI P7 - 粘性決定方法，方法A－動粘度 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
P04400 - SEMI P44 - マスク装置向けオープン・アートワーク・システム・インターチェンジ・スタンダード（OASIS®）の仕様
SEMI P44 - マスク装置向けオープン・アートワーク・システム・インターチェンジ・スタンダード（OASIS®）の仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
G07600 - SEMI G76 - TCP用ポリイミド接着テープの仕様
SEMI G76 - TCP用ポリイミド接着テープの仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥29,700
M09000 - SEMI M90 - Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers by Optical Microscopy After Preferential Etching
SEMI M90 - Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers by Optical Microscopy After Preferential Etching Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P03100 - SEMI P31 - 化学増幅型（CA）フォトレジストパラメータのカタログ発行の作業方法
SEMI P31 - 化学増幅型（CA）フォトレジストパラメータのカタログ発行の作業方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Flex Electronics Webinar Master Class Series: Batteries, AI, HI, Materials, Applications, Sustainability (On Demand 2021)
Flex Electronics Webinar Master Class Series: Batteries, AI, HI, Materials, Applications, Sustainability (On Demand 2021) Sale priceMember Price: ¥149
Non-Member Price: ¥37,800
PV09500 - SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance
SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance Sale priceMember Price: ¥113
Non-Member Price: ¥31,900