SEMI Standards

SEMI Standards are voluntary technical agreements for the semiconductor, flat panel display, micro-electromechanical systems, photovoltaic, and high-brightness LED industries.

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1625 products

C00604 - SEMI C6.4 - Particle Specification for Grade 20/0.02 Nitrogen (N2) and Argon (Ar) Delivered as Pipeline Gas
C00349 - SEMI C3.49 - Standard for Bulk Nitrogen (N2), 99.99999% Quality
SEMI C3.49 - Standard for Bulk Nitrogen (N2), 99.99999% Quality Sale priceMember Price: $113.00
Non-Member Price: $193.00
C00602 - SEMI C6.2 - パイプラインガスとして授受されるグレード20/0.02酸素に対するパーティクル仕様
C00330 - SEMI C3.30 - Standard for Hydrogen (H2), Bulk, 99.9997% Quality
SEMI C3.30 - Standard for Hydrogen (H2), Bulk, 99.9997% Quality Sale priceMember Price: $113.00
Non-Member Price: $193.00
C00348 - SEMI C3.48 - Standard for Nitrogen (N2), Bulk Liquid, 99.9994% Quality
SEMI C3.48 - Standard for Nitrogen (N2), Bulk Liquid, 99.9994% Quality Sale priceMember Price: $113.00
Non-Member Price: $193.00
G07600 - SEMI G76 - Specification for Polyimide-Based Adhesive Tape Used in Tape Carrier Packages (TCP)
P03400 - SEMI P34 - Specification for 230 mm Square Photomask Substrates
SEMI P34 - Specification for 230 mm Square Photomask Substrates Sale priceMember Price: $113.00
Non-Member Price: $193.00
P01400 - SEMI P14 - Determination of Tin in Positive Photoresists by Graphite Furnace Atomic Absorption Spectroscopy
P02300 - SEMI P23 - プログラム欠陥マスクおよびマスク欠陥検査システムの感度分析ベンチマーク手順についてのガイドライン
P01400 - SEMI P14 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト中の錫の測定
P01900 - SEMI P19 - Specification for Metrology Pattern Cells for Integrated Circuit Manufacture
M03700 - SEMI M37 - 低転位密度Inp基板のエッチピット密度(EPD)測定方法
SEMI M37 - 低転位密度Inp基板のエッチピット密度(EPD)測定方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P04700 - SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness
SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness Sale priceMember Price: $113.00
Non-Member Price: $193.00
P04300 - SEMI P43 - Photomask Qualification Terminology
SEMI P43 - Photomask Qualification Terminology Sale priceMember Price: $113.00
Non-Member Price: $193.00
P00300 - SEMI P3 - レジスト付きクロムブランク
SEMI P3 - レジスト付きクロムブランク Sale priceMember Price: $135.00
Non-Member Price: $231.00
P03500 - SEMI P35 - Terminology for Microlithography Metrology
SEMI P35 - Terminology for Microlithography Metrology Sale priceMember Price: $113.00
Non-Member Price: $193.00
P01000 - SEMI P10 - Specification of Data Structures for Photomask Orders
SEMI P10 - Specification of Data Structures for Photomask Orders Sale priceMember Price: $113.00
Non-Member Price: $193.00
P03000 - SEMI P30 - 寸法測定用走査型電子顕微鏡(CD-SEM)の目録発行の実施要領
G08500 - SEMI G85 - マップデータ・フォーマット用仕様
SEMI G85 - マップデータ・フォーマット用仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03700 - SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers
M03900 - SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法
P00600 - SEMI P6 - Specification for Registration Marks for Photomasks
SEMI P6 - Specification for Registration Marks for Photomasks Sale priceMember Price: $113.00
Non-Member Price: $193.00
G07900 - SEMI G79 - Specification for Overall Digital Timing Accuracy
SEMI G79 - Specification for Overall Digital Timing Accuracy Sale priceMember Price: $113.00
Non-Member Price: $193.00
P00600 - SEMI P6 - フォトマスク用レジストレーションマーク
SEMI P6 - フォトマスク用レジストレーションマーク Sale priceMember Price: $135.00
Non-Member Price: $231.00
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