SEMI G79 - Specification for Overall Digital Timing Accuracy -

Revision: SEMI G79-0200 - Superseded

Revision

Abstract

This Standard was technically approved by the global Automated Test Equipment Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on December 24, 2011. Available at www.semiviews.org and www.semi.org in May 2012; originally published February 2000.

 

This Standard is intended to provide a minimum common definition of timing accuracy specifications for semiconductor automatic test equipment (ATE).

　

Referenced SEMI Standards

None.

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