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SEMI MS9 - Specification for High Density Permanent Connections Between Microfluidic Devices
Regular price$300.00 USD
Sale price$193.00 USD
SEMI M50 - オーバーレイ法による走査型表面検査システム用捕獲率および偽計数率を決定するための試験方法
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI P46 - Specification for Critical Dimension (CD) Measurement Information Data on Photomask by XML
Sale priceMember Price: $113.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI G68 - 空気環境における半導体パッケージのジャンクション部とケース間の熱抵抗測定の試験方法
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI F62 - 周囲およびガス温度の影響からマスフローコントローラ性能特性を決定する試験方法
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI M79 - 太陽電池用円盤状100 mm鏡面研磨単結晶ゲルマニウムウェーハの仕様
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI M75 - 鏡面単結晶ガリウムアンチモンスライスの仕様
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI M15 - Polished Wafer Defect Limits Table for Semi-Insulating Gallium Arsenide Wafers
Sale priceMember Price: $113.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI G94 - 300mmウェーハ用コインスタック型テープフレーム出荷容器の仕様
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI M57 - シリコンアニールウェーハの仕様
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI M49 - 130 nmから65 nmへの技術世代のシリコンウェーハ用ジオメトリ測定システム規定のためのガイド
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI P23 - Guidelines for Programmed Defect Masks and Benchmark Procedures for Sensitivity Analysis of Mask Defect Inspection Systems
Sale priceMember Price: $113.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI M45 - 300 mmウェーハシッピングシステムに関する暫定仕様
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI C71 - 三塩化ホウ素（BCI3）の仕様およびガイド
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI PV4 - Specification for Range of 5th Generation Substrate Sizes for Thin Film Photovoltaic Applications
Sale priceMember Price: $113.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI P32 - Test Method for Determination of Trace Metals in Photoresist
Sale priceMember Price: $113.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI C38 - Guide for Phosphorus Oxychloride
Sale priceMember Price: $113.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI M36 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Gallium Arsenide Wafers
Sale priceMember Price: $113.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI M34 - SIMOXウェーハを規定するための指針
Sale priceMember Price: $135.00
Non-Member Price: $180.00
Non-Member Price: $180.00
SEMI F98 - 半導体プロセスにおける用水再処理のためのガイド
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI P41 - Specification for Mask Defect Data Handling with XML, Between Defect Inspection Tools, Repair Tools, and Review Tools
Sale priceMember Price: $113.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI G86 - シリコンチップ（ダイ）の三点曲げテスト方法
Sale priceMember Price: $135.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment
Sale priceMember Price: $113.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI M48 - Guide for Evaluating Chemical-Mechanical Polishing Processes of Films on Unpatterned Silicon Substrates
Sale priceMember Price: $113.00
Non-Member Price: $193.00
Non-Member Price: $193.00