SEMI G56 - Test Method for Measurement of Silver Plating Thickness -

Abstract

　

Use — This Test Method may be used for process control and outgoing inspection at the supplier or by the customer for incoming inspection.

　

Units — This standard Test Method uses SI units.

 

This Test Method describes the standard method for measuring the thickness of silver plating on semiconductor leadframes.

 

　

Referenced SEMI Standards

None.

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