SEMI G23 - 半導体팍케이지의 内部導体路の인다크탄스의 試験방법 -

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Volume(s): Packaging
Language: Japanese
Type: Single Standards Download (.pdf)
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개정: SEMI G23-0996(0811 재승인) - 대체됨

개정

Abstract

本standanardは， global Assembly & Packaging Technical Committee で技術的に承認されている。現版は2011年7月1日， global Audits and Reviews Subcommitteeにて発行が承認された。 2011年8月にwww.semiviews .org およびwww.semi.org 에서 1980년 9월 9 일 이전.

　

この試験方法は，半導体팍케이지の内部導体路のindcktansの測定法について記載する.

　

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