SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

G01000 - SEMI G10 - Standard Method for Mechanical Measurement of Plastic Package Leadframes
SEMI G10 - Standard Method for Mechanical Measurement of Plastic Package Leadframes Sale priceMember Price: €113,00
Non-Member Price: €171,95
M01300 - SEMI M13 - Specification for Alphanumeric Marking of Silicon Wafers
SEMI M13 - Specification for Alphanumeric Marking of Silicon Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF118800 - SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline
SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline Sale priceMember Price: €113,00
Non-Member Price: €171,95
HB00400 - SEMI HB4 - Specification of Communication Interfaces for High Brightness LED Manufacturing Equipment (HB-LED ECI)
SEMI HB4 - Specification of Communication Interfaces for High Brightness LED Manufacturing Equipment (HB-LED ECI) Sale priceMember Price: €113,00
Non-Member Price: €171,95
M06400 - SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy
SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF008100 - SEMI MF81 - Test Method for Measuring Radial Resistivity Variation on Silicon Wafers
SEMI MF81 - Test Method for Measuring Radial Resistivity Variation on Silicon Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF153000 - SEMI MF1530 - Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning
SEMI MF1530 - Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning Sale priceMember Price: €113,00
Non-Member Price: €171,95
M07800 - SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing
SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing Sale priceMember Price: €113,00
Non-Member Price: €171,95
G08300 - SEMI G83 - Specification for Bar Code Marking of Product Packages
SEMI G83 - Specification for Bar Code Marking of Product Packages Sale priceMember Price: €113,00
Non-Member Price: €171,95
M00800 - SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers
SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
M03500 - SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection
SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection Sale priceFrom €171,95 EUR
MF037400 - SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure Sale priceMember Price: €113,00
Non-Member Price: €171,95
M05500 - SEMI M55 - Specification for Polished Monocrystalline Silicon Carbide Wafers
SEMI M55 - Specification for Polished Monocrystalline Silicon Carbide Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
PV04400 - SEMI PV44 - Specification for Package Protection Technology for Photovoltaic Modules
SEMI PV44 - Specification for Package Protection Technology for Photovoltaic Modules Sale priceMember Price: €113,00
Non-Member Price: €171,95
E05413 - SEMI E54.13 - Specification for Sensor/Actuator Network Communications for Ethernet/IP(TM)
SEMI E54.13 - Specification for Sensor/Actuator Network Communications for Ethernet/IP(TM) Sale priceFrom €171,95 EUR
G05600 - SEMI G56 - Test Method for Measurement of Silver Plating Thickness
SEMI G56 - Test Method for Measurement of Silver Plating Thickness Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF139200 - SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe
SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe Sale priceMember Price: €113,00
Non-Member Price: €171,95
M05800 - SEMI M58 - DMAを基にしたパーティクル堆積システムとプロセス評価のためのテスト方法
SEMI M58 - DMAを基にしたパーティクル堆積システムとプロセス評価のためのテスト方法 Sale priceMember Price: €135,00
Non-Member Price: €205,95
G08800 - SEMI G88 - Specification for Tape Frame for 450 mm Wafer
SEMI G88 - Specification for Tape Frame for 450 mm Wafer Sale priceMember Price: €113,00
Non-Member Price: €171,95
M05200 - SEMI M52 - Guide for Specifying Scanning Surface Inspection Systems for Silicon Wafers for the 130 nm to 5 nm Technology Generations
SEMI M52 - Guide for Specifying Scanning Surface Inspection Systems for Silicon Wafers for the 130 nm to 5 nm Technology Generations Sale priceFrom €171,95 EUR
G04200 - SEMI G42 - Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages
SEMI G42 - Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages Sale priceMember Price: €113,00
Non-Member Price: €171,95
G09300 - SEMI G93 - Measurement Method for Solder Sphere Size for Ball Grid Array Package
SEMI G93 - Measurement Method for Solder Sphere Size for Ball Grid Array Package Sale priceMember Price: €113,00
Non-Member Price: €171,95
F02400 - SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases
SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF004300 - SEMI MF43 - Test Method for Resistivity of Semiconductor Materials
SEMI MF43 - Test Method for Resistivity of Semiconductor Materials Sale priceMember Price: €113,00
Non-Member Price: €171,95