SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

M00300 - SEMI M3 - Specifications for Polished Monocrystalline Sapphire Substrates
SEMI M3 - Specifications for Polished Monocrystalline Sapphire Substrates Sale priceMember Price: €113,00
Non-Member Price: €171,95
M00400 - SEMI M4 - Specifications for SOS Epitaxial Wafers
SEMI M4 - Specifications for SOS Epitaxial Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
F01700 - SEMI F17 - Specification for High Purity Quality Electropolished 316L Stainless Steel Tubing, Component Tube Stubs, and Fittings Made from Tubing
SEMI F17 - Specification for High Purity Quality Electropolished 316L Stainless Steel Tubing, Component Tube Stubs, and Fittings Made from Tubing Sale priceMember Price: €113,00
Non-Member Price: €171,95
C04100 - SEMI C41 - 2-プロパノールの仕様とガイドライン
SEMI C41 - 2-プロパノールの仕様とガイドライン Sale priceMember Price: €135,00
Non-Member Price: €205,95
G04800 - SEMI G48 - Specification for Measurement Method for Molded Plastic Package Tooling
SEMI G48 - Specification for Measurement Method for Molded Plastic Package Tooling Sale priceMember Price: €113,00
Non-Member Price: €133,95
PV02200 - SEMI PV22 - 太陽光電池用シリコンウェーハの仕様
SEMI PV22 - 太陽光電池用シリコンウェーハの仕様 Sale priceMember Price: €135,00
Non-Member Price: €205,95
M01300 - SEMI M13 - シリコンウェーハの英数字マーキングの仕様
SEMI M13 - シリコンウェーハの英数字マーキングの仕様 Sale priceMember Price: €135,00
Non-Member Price: €205,95
F03000 - SEMI F30 - 据付現場における微量ガス不純物およびパーティクルに関する精製器性能テストの始動および検証
SEMI F30 - 据付現場における微量ガス不純物およびパーティクルに関する精製器性能テストの始動および検証 Sale priceMember Price: €135,00
Non-Member Price: €205,95
F01500 - SEMI F15 - Test Method for Enclosures Using Sulfur Hexafluoride Tracer Gas and Gas Chromatography
SEMI F15 - Test Method for Enclosures Using Sulfur Hexafluoride Tracer Gas and Gas Chromatography Sale priceFrom €159,95 EUR
F03400 - SEMI F34 - 液体化学薬品配管ラベリングに関するガイド
SEMI F34 - 液体化学薬品配管ラベリングに関するガイド Sale priceMember Price: €135,00
Non-Member Price: €205,95
T01400 - SEMI T14 - Specification for Micro ID on 300 mm Silicon Wafers
SEMI T14 - Specification for Micro ID on 300 mm Silicon Wafers Sale priceMember Price: €225,00
Non-Member Price: €337,95
P02900 - SEMI P29 - 減衰型位相シフトマスク（ハーフトーン型位相シフトマスク）およびマスクブランクスに特有な特性の仕様
SEMI P29 - 減衰型位相シフトマスク（ハーフトーン型位相シフトマスク）およびマスクブランクスに特有な特性の仕様 Sale priceMember Price: €135,00
Non-Member Price: €205,95
C10000 - SEMI C100 - Guide for Reporting Chemical Mechanical Planarization (CMP) Polishing Pads Hardness Used in Semiconductor Manufacturing
SEMI C100 - Guide for Reporting Chemical Mechanical Planarization (CMP) Polishing Pads Hardness Used in Semiconductor Manufacturing Sale priceMember Price: €113,00
Non-Member Price: €171,95
P01500 - SEMI P15 - Determination of Sodium and Potassium in Positive Photoresist Metal Ion Free (MIF) Developers by Atomic Absorption Spectroscopy
SEMI P15 - Determination of Sodium and Potassium in Positive Photoresist Metal Ion Free (MIF) Developers by Atomic Absorption Spectroscopy Sale priceMember Price: €113,00
Non-Member Price: €171,95
P03400 - SEMI P34 - Specification for 230 mm Square Photomask Substrates
SEMI P34 - Specification for 230 mm Square Photomask Substrates Sale priceMember Price: €113,00
Non-Member Price: €171,95
P00200 - SEMI P2 - Specification for Chrome Thin Films for Hard Surface Photomasks
SEMI P2 - Specification for Chrome Thin Films for Hard Surface Photomasks Sale priceMember Price: €113,00
Non-Member Price: €171,95
C10100 - SEMI C101 - Test Method for Determining pH of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals
SEMI C101 - Test Method for Determining pH of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals Sale priceMember Price: €113,00
Non-Member Price: €171,95
P01200 - SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP)
SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP) Sale priceMember Price: €113,00
Non-Member Price: €171,95
P01500 - SEMI P15 - 原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー（MIF）現像液中のナトリウムとカリウムの測定
SEMI P15 - 原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー（MIF）現像液中のナトリウムとカリウムの測定 Sale priceMember Price: €135,00
Non-Member Price: €205,95
P04200 - SEMI P42 - Specification of Reticle Data for Automatic Recipe Transfer to Wafer Exposure System
SEMI P42 - Specification of Reticle Data for Automatic Recipe Transfer to Wafer Exposure System Sale priceMember Price: €113,00
Non-Member Price: €171,95
C00347 - SEMI C3.47 - 臭化水素（HBr），品質99.98%の仕様
SEMI C3.47 - 臭化水素（HBr），品質99.98%の仕様 Sale priceMember Price: €135,00
Non-Member Price: €205,95
G08100 - SEMI G81 - マップデータ・アイテムの仕様
SEMI G81 - マップデータ・アイテムの仕様 Sale priceMember Price: €135,00
Non-Member Price: €205,95
M03600 - SEMI M36 - 低転位密度GaAs基板のエッチピット密度（EPD）測定方法
SEMI M36 - 低転位密度GaAs基板のエッチピット密度（EPD）測定方法 Sale priceMember Price: €135,00
Non-Member Price: €205,95
G08800 - SEMI G88 - 450mmウェーハ用テープフレームの仕様
SEMI G88 - 450mmウェーハ用テープフレームの仕様 Sale priceMember Price: €135,00
Non-Member Price: €205,95