SEMI 3D8 - Guide for Describing Silicon Wafers for Use as 300 mm Carrier Wafers in a 3DS-IC Temporary Bond-Debond (TBDB) Process

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1910 products

P03000 - SEMI P30 - Practice for Catalog Publication of Critical Dimension Measurement Scanning Electron Microscopes (CD-SEM)
SEMI P30 - Practice for Catalog Publication of Critical Dimension Measurement Scanning Electron Microscopes (CD-SEM) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
G09200 - SEMI G92 - 450 mmウェーハ用テープフレームカセットの仕様
SEMI G92 - 450 mmウェーハ用テープフレームカセットの仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
D04500 - SEMI D45 - 平面顯示器彩色濾光片所使用，含高阻值之樹脂型黑色矩陣電阻的量測方法
SEMI D45 - 平面顯示器彩色濾光片所使用，含高阻值之樹脂型黑色矩陣電阻的量測方法 Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
M02100 - SEMI M21 - カーテシアン（デカルト）アレイにおける方形エレメントへの割当アドレスのガイド
SEMI M21 - カーテシアン（デカルト）アレイにおける方形エレメントへの割当アドレスのガイド Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals
SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
P02000 - SEMI P20 - Guideline for Catalog Publication of EB Resist Parameters (Proposal)
SEMI P20 - Guideline for Catalog Publication of EB Resist Parameters (Proposal) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
D03900 - SEMI D39 - FPD偏光板用マーカーの仕様
SEMI D39 - FPD偏光板用マーカーの仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
P01500 - SEMI P15 - Determination of Sodium and Potassium in Positive Photoresist Metal Ion Free (MIF) Developers by Atomic Absorption Spectroscopy
SEMI P15 - Determination of Sodium and Potassium in Positive Photoresist Metal Ion Free (MIF) Developers by Atomic Absorption Spectroscopy Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
M02200 - SEMI M22 - Specification for Dielectrically Isolated (DI) Wafers
SEMI M22 - Specification for Dielectrically Isolated (DI) Wafers Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
G08100 - SEMI G81 - マップデータ・アイテムの仕様
SEMI G81 - マップデータ・アイテムの仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
P01200 - SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP)
SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
G08800 - SEMI G88 - 450mmウェーハ用テープフレームの仕様
SEMI G88 - 450mmウェーハ用テープフレームの仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
G07100 - SEMI G71 - パッケージング材料の中間容器のバーコードマーキングの仕様
SEMI G71 - パッケージング材料の中間容器のバーコードマーキングの仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
M03600 - SEMI M36 - 低転位密度GaAs基板のエッチピット密度（EPD）測定方法
SEMI M36 - 低転位密度GaAs基板のエッチピット密度（EPD）測定方法 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
P01500 - SEMI P15 - 原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー（MIF）現像液中のナトリウムとカリウムの測定
SEMI P15 - 原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー（MIF）現像液中のナトリウムとカリウムの測定 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000