Individual Standards

Search for Standards by using the Search form at the top of the page or browse by Volume, Topic and Language below.

Filters

Sort by:

1222 products

G02700 - SEMI G27 - Specification for Leadframes for Plastic Leaded Chip Carrier (PLCC) Packages
SEMI G27 - Specification for Leadframes for Plastic Leaded Chip Carrier (PLCC) Packages Sale priceMember Price: ₩113
Non-Member Price: ₩226,000
P01400 - SEMI P14 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト中の錫の測定
SEMI P14 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト中の錫の測定 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
P01900 - SEMI P19 - Specification for Metrology Pattern Cells for Integrated Circuit Manufacture
SEMI P19 - Specification for Metrology Pattern Cells for Integrated Circuit Manufacture Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
P01400 - SEMI P14 - Determination of Tin in Positive Photoresists by Graphite Furnace Atomic Absorption Spectroscopy
SEMI P14 - Determination of Tin in Positive Photoresists by Graphite Furnace Atomic Absorption Spectroscopy Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
3D01900 - SEMI 3D19 - Test Method for Adhesive Strength of Adhesive Tray Used for Thin Chip Handling
SEMI 3D19 - Test Method for Adhesive Strength of Adhesive Tray Used for Thin Chip Handling Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
P02300 - SEMI P23 - プログラム欠陥マスクおよびマスク欠陥検査システムの感度分析ベンチマーク手順についてのガイドライン
SEMI P23 - プログラム欠陥マスクおよびマスク欠陥検査システムの感度分析ベンチマーク手順についてのガイドライン Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
MS00800 - SEMI MS8 - Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages
SEMI MS8 - Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages Regular price₩451,000 KRW Sale price₩290,000 KRW
M03700 - SEMI M37 - 低転位密度Inp基板のエッチピット密度（EPD）測定方法
SEMI M37 - 低転位密度Inp基板のエッチピット密度（EPD）測定方法 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
P04700 - SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness
SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
G02600 - SEMI G26 - Specification for Hermetic Slam Chip Carrier Lids
SEMI G26 - Specification for Hermetic Slam Chip Carrier Lids Sale priceMember Price: ₩113
Non-Member Price: ₩226,000
G08500 - SEMI G85 - マップデータ・フォーマット用仕様
SEMI G85 - マップデータ・フォーマット用仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
P03000 - SEMI P30 - 寸法測定用走査型電子顕微鏡（CD-SEM）の目録発行の実施要領
SEMI P30 - 寸法測定用走査型電子顕微鏡（CD-SEM）の目録発行の実施要領 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
M03700 - SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers
SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
G00500 - SEMI G5 - 仕様　セラミックチップキャリア（CCC）
SEMI G5 - 仕様　セラミックチップキャリア（CCC） Sale priceMember Price: ₩135
Non-Member Price: ₩290,000
P03700 - SEMI P37 - Specification for Extreme Ultraviolet Lithography Substrates and Blanks
SEMI P37 - Specification for Extreme Ultraviolet Lithography Substrates and Blanks Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
C10300 - SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing
SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
P00600 - SEMI P6 - フォトマスク用レジストレーションマーク
SEMI P6 - フォトマスク用レジストレーションマーク Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
P01700 - SEMI P17 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresist Metal Ion Free (MIF) Developers by Inductively Coupled Plasma Emission Spectroscopy (ICP)
SEMI P17 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresist Metal Ion Free (MIF) Developers by Inductively Coupled Plasma Emission Spectroscopy (ICP) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
P00600 - SEMI P6 - Specification for Registration Marks for Photomasks
SEMI P6 - Specification for Registration Marks for Photomasks Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
P04200 - SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様
SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
M03900 - SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法
SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
M01400 - SEMI M14 - Specification for Ion Implantation and Activation Process for Semi-Insulating Gallium Arsenide Single Crystals
SEMI M14 - Specification for Ion Implantation and Activation Process for Semi-Insulating Gallium Arsenide Single Crystals Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
P02700 - SEMI P27 - Parameter Checklist for Resist Thickness Measurement on a Substrate
SEMI P27 - Parameter Checklist for Resist Thickness Measurement on a Substrate Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
M02600 - SEMI M26 - ウェーハの運搬に使用される100 mm，125 mm，150 mm，200 mmウェーハシッピングボックスの再利用ガイド
SEMI M26 - ウェーハの運搬に使用される100 mm，125 mm，150 mm，200 mmウェーハシッピングボックスの再利用ガイド Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
View All