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SEMI P35 - Terminology for Microlithography Metrology
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SEMI G42 - 半導体パッケージのジャンクション部と周囲間の熱抵抗測定用標準熱抵抗測定基板の仕様
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SEMI M67 - 測定した厚さデータ配列からESFQR,ESFQD,ESBIR METRICS法を使ってウェーハのエッジ近傍形状を決定するための作業方法
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SEMI M43 - ウェーハナノポトグラフィを報告するためのガイド
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SEMI G66 - 半導体用プラスチックモールディングコンパウンドの吸湿特性の測定方法
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SEMI P6 - フォトマスク用レジストレーションマーク
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SEMI P6 - Specification for Registration Marks for Photomasks
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SEMI M30 - Standard Test Method for Substitutional Atomic Carbon Concentration in GaAs by Fourier Transform Infrared Absorption Spectroscopy
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Non-Member Price: ¥31,900
SEMI P37 - Specification for Extreme Ultraviolet Lithography Substrates and Blanks
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SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様
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SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法
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SEMI G67 - シート材料から発生する粒子の測定の試験方法
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SEMI C40 - 水酸化カリウム45%溶液の仕様
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SEMI C3.39 - 三フッ化窒素(NF3)99.98%品質の仕様
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