SEMI 3D8 - Guide for Describing Silicon Wafers for Use as 300 mm Carrier Wafers in a 3DS-IC Temporary Bond-Debond (TBDB) Process

Browse Latest METIS Courses

1910 products

M02900 - SEMI M29 - 300 mmシッピングボックスの仕様
SEMI M29 - 300 mmシッピングボックスの仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
M08000 - SEMI M80 - 450 mmウェーハの搬送および出荷用フロントオープニング・シッピングボックスの機械仕様
SEMI M80 - 450 mmウェーハの搬送および出荷用フロントオープニング・シッピングボックスの機械仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
P04300 - SEMI P43 - Photomask Qualification Terminology
SEMI P43 - Photomask Qualification Terminology Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P00300 - SEMI P3 - レジスト付きクロムブランク
SEMI P3 - レジスト付きクロムブランク Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
G08500 - SEMI G85 - マップデータ・フォーマット用仕様
SEMI G85 - マップデータ・フォーマット用仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
M03200 - SEMI M32 - 統計的仕様のガイド
SEMI M32 - 統計的仕様のガイド Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
MF053400 - SEMI MF534 - Test Method for Bow of Silicon Wafers
SEMI MF534 - Test Method for Bow of Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M03700 - SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers
SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M02900 - SEMI M29 - Specification for 300 mm Shipping Box
SEMI M29 - Specification for 300 mm Shipping Box Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P03000 - SEMI P30 - 寸法測定用走査型電子顕微鏡（CD-SEM）の目録発行の実施要領
SEMI P30 - 寸法測定用走査型電子顕微鏡（CD-SEM）の目録発行の実施要領 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
MF039900 - SEMI MF399 - Test Method for Thickness of Heteroepitaxial or Polysilicon Layers
SEMI MF399 - Test Method for Thickness of Heteroepitaxial or Polysilicon Layers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D01700 - SEMI D17 - FPDガラス基板搬送用カセットの機械的仕様
SEMI D17 - FPDガラス基板搬送用カセットの機械的仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
D03100 - SEMI D31 - FPD画質検査における輝度ムラの計量単位（DSEMU）の定義
SEMI D31 - FPD画質検査における輝度ムラの計量単位（DSEMU）の定義 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
M03300 - SEMI M33 - Test Method for the Determination of Residual Surface Contamination on Silicon Wafers by Means of Total Reflection X-Ray Fluorescence Spectroscopy (TXRF)
SEMI M33 - Test Method for the Determination of Residual Surface Contamination on Silicon Wafers by Means of Total Reflection X-Ray Fluorescence Spectroscopy (TXRF) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P01000 - SEMI P10 - Specification of Data Structures for Photomask Orders
SEMI P10 - Specification of Data Structures for Photomask Orders Sale priceMember Price: ¥113
Non-Member Price: ¥31,900