Products

Filters

Sort by:

1910 products

MF172700 - SEMI MF1727 - Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers
SEMI MF1727 - Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF176300 - SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer
SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF177100 - SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique
SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF180900 - SEMI MF1809 - Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon
SEMI MF1809 - Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF181000 - SEMI MF1810 - Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers
SEMI MF1810 - Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF181100 - SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data
SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF198200 - SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography
SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF207400 - SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers
SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF216600 - SEMI MF2166 - Practices for Monitoring Non-Contact Dielectric Characterization Systems Through Use of Special Reference Wafers
SEMI MF2166 - Practices for Monitoring Non-Contact Dielectric Characterization Systems Through Use of Special Reference Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Microchips and Solar Chips
Microchips and Solar Chips Sale priceMember Price:
Non-Member Price: ¥4,000
MS00100 - SEMI MS1 - Guide to Specifying Wafer-Wafer Bonding Alignment Targets
SEMI MS1 - Guide to Specifying Wafer-Wafer Bonding Alignment Targets Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MS00200 - SEMI MS2 - Test Method for Step Height Measurements of Thin Films
SEMI MS2 - Test Method for Step Height Measurements of Thin Films Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MS00300 - SEMI MS3 - Terminology for MEMS Technology
SEMI MS3 - Terminology for MEMS Technology Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MS00400 - SEMI MS4 - Test Method for Young's Modulus Measurements of Thin, Reflecting Films Based on the Frequency of Beams in Resonance
SEMI MS4 - Test Method for Young's Modulus Measurements of Thin, Reflecting Films Based on the Frequency of Beams in Resonance Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MS00500 - SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures
SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MS00600 - SEMI MS6 - Guide for Design and Materials for Interfacing Microfluidic Systems
SEMI MS6 - Guide for Design and Materials for Interfacing Microfluidic Systems Regular price¥49,500 JPY Sale price¥31,900 JPY
MS00700 - SEMI MS7 - Specification for Microfluidic Interfaces to Electronic Device Packages
SEMI MS7 - Specification for Microfluidic Interfaces to Electronic Device Packages Regular price¥49,500 JPY Sale price¥31,900 JPY
MS00800 - SEMI MS8 - Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages
SEMI MS8 - Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages Regular price¥49,500 JPY Sale price¥31,900 JPY
MS00900 - SEMI MS9 - Specification for High Density Permanent Connections Between Microfluidic Devices
SEMI MS9 - Specification for High Density Permanent Connections Between Microfluidic Devices Regular price¥49,500 JPY Sale price¥31,900 JPY
MS01000 - SEMI MS10 - Test Method to Measure Fluid Permeation Through MEMS Packaging Materials
SEMI MS10 - Test Method to Measure Fluid Permeation Through MEMS Packaging Materials Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MS01100 - SEMI MS11 - Specification for Microfluidic Port and Pitch Dimensions
SEMI MS11 - Specification for Microfluidic Port and Pitch Dimensions Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MS01200 - SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices
SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MS01300 - SEMI MS13 - Guide for Use of Test Patterns for Characterizing a Deep Reactive Ion Etching (DRIE) Process
SEMI MS13 - Guide for Use of Test Patterns for Characterizing a Deep Reactive Ion Etching (DRIE) Process Sale priceMember Price: ¥113
Non-Member Price: ¥31,900