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1910 products

MF039700 - SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe
SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF039800 - SEMI MF398 - Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum
SEMI MF398 - Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF039900 - SEMI MF399 - Test Method for Thickness of Heteroepitaxial or Polysilicon Layers
SEMI MF399 - Test Method for Thickness of Heteroepitaxial or Polysilicon Layers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF052300 - SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces
SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF052500 - SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe
SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF053300 - SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers
SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF053400 - SEMI MF534 - Test Method for Bow of Silicon Wafers
SEMI MF534 - Test Method for Bow of Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF057600 - SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF065700 - SEMI MF657 - Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning
SEMI MF657 - Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF067100 - SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials
SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF067200 - SEMI MF672 - Guide for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe
SEMI MF672 - Guide for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge
SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF067400 - SEMI MF674 - Practice for Preparing Silicon for Spreading Resistance Measurements
SEMI MF674 - Practice for Preparing Silicon for Spreading Resistance Measurements Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF072300 - SEMI MF723 - Practice for Conversion Between Resistivity and Dopant or Carrier Density for Boron-Doped, Phosphorous-Doped, and Arsenic-Doped Silicon
SEMI MF723 - Practice for Conversion Between Resistivity and Dopant or Carrier Density for Boron-Doped, Phosphorous-Doped, and Arsenic-Doped Silicon Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF072800 - SEMI MF728 - Practice for Preparing an Optical Microscope for Dimensional Measurements
SEMI MF728 - Practice for Preparing an Optical Microscope for Dimensional Measurements Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF084700 - SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF092800 - SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF095000 - SEMI MF950 - Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Wafer Surface by Angle Polished and Defect Etching
SEMI MF950 - Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Wafer Surface by Angle Polished and Defect Etching Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF095100 - SEMI MF951 - Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
SEMI MF951 - Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF097800 - SEMI MF978 - Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques
SEMI MF978 - Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF104800 - SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated ScatterMF104800 - SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter
SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF104900 - SEMI MF1049 - Practice for Shallow Etch Pit Detection on Silicon Wafers
SEMI MF1049 - Practice for Shallow Etch Pit Detection on Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF115200 - SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers
SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF115300 - SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements
SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements Sale priceMember Price: ¥113
Non-Member Price: ¥31,900