SEMI 3D8 - Guide for Describing Silicon Wafers for Use as 300 mm Carrier Wafers in a 3DS-IC Temporary Bond-Debond (TBDB) Process

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1910 products

MF152800 - SEMI MF1528 - Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF1528 - Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $113.00
Non-Member Price: $193.00
G02400 - SEMI G24 - Test Method for Measuring the Lead-to-Lead and Loading Capacitance of Package Leads
SEMI G24 - Test Method for Measuring the Lead-to-Lead and Loading Capacitance of Package Leads Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF161700 - SEMI MF1617 - Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and EPI Substrates by Secondary Ion Mass Spectrometry
SEMI MF1617 - Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and EPI Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $113.00
Non-Member Price: $193.00
M05100 - SEMI M51 - Test Method for Characterizing Silicon Wafer by Gate Oxide Integrity
SEMI M51 - Test Method for Characterizing Silicon Wafer by Gate Oxide Integrity Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF207400 - SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers
SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF172600 - SEMI MF1726 - Practice for Analysis of Crystallographic Perfection of Silicon Wafers
SEMI MF1726 - Practice for Analysis of Crystallographic Perfection of Silicon Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
G09300 - SEMI G93 - ボール・グリッド・アレイ（BGA）パッケージ用はんだボールの測定方法
SEMI G93 - ボール・グリッド・アレイ（BGA）パッケージ用はんだボールの測定方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
G04100 - SEMI G41 - Specification for Dual Strip SOIC Leadframe
SEMI G41 - Specification for Dual Strip SOIC Leadframe Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF177100 - SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique
SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique Sale priceMember Price: $113.00
Non-Member Price: $193.00
G05100 - SEMI G51 - Specification for Plastic Molded (Metric) Quad Flat Pack Leadframes
SEMI G51 - Specification for Plastic Molded (Metric) Quad Flat Pack Leadframes Sale priceMember Price: $113.00
Non-Member Price: $193.00
F02000 - SEMI F20 - Specification for 316L Stainless Steel Bar, Forgings, Extruded Shapes, Plate, and Tubing for Components Used in General Purpose, High Purity and Ultra-High Purity Semiconductor Manufacturing Applications
SEMI F20 - Specification for 316L Stainless Steel Bar, Forgings, Extruded Shapes, Plate, and Tubing for Components Used in General Purpose, High Purity and Ultra-High Purity Semiconductor Manufacturing Applications Sale priceMember Price: $225.00
Non-Member Price: $380.00
MF181100 - SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data
SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data Sale priceMember Price: $113.00
Non-Member Price: $193.00
M06500 - SEMI M65 - 化合物半導体エピタキシャルウェーハに使用するサファイア基板の仕様
SEMI M65 - 化合物半導体エピタキシャルウェーハに使用するサファイア基板の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors
SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Sale priceMember Price: $113.00
Non-Member Price: $193.00
M04400 - SEMI M44 - シリコン中の酸素の換算係数ガイド
SEMI M44 - シリコン中の酸素の換算係数ガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00