SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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1900 products

M07100 - SEMI M71 - CMOS LSI用シリコン・オン・インシュレーター(SOI)ウェーハのための仕様
MF067100 - SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials
M04200 - SEMI M42 - 化合物半導体エピタキシャルウェーハの仕様
SEMI M42 - 化合物半導体エピタキシャルウェーハの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M03800 - SEMI M38 - Specification for Polished Reclaimed Silicon Wafers
SEMI M38 - Specification for Polished Reclaimed Silicon Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
G02400 - SEMI G24 - Test Method for Measuring the Lead-to-Lead and Loading Capacitance of Package Leads
MF161700 - SEMI MF1617 - Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and EPI Substrates by Secondary Ion Mass Spectrometry
M05100 - SEMI M51 - Test Method for Characterizing Silicon Wafer by Gate Oxide Integrity
SEMI M51 - Test Method for Characterizing Silicon Wafer by Gate Oxide Integrity Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF177100 - SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique
G05100 - SEMI G51 - Specification for Plastic Molded (Metric) Quad Flat Pack Leadframes
SEMI G51 - Specification for Plastic Molded (Metric) Quad Flat Pack Leadframes Sale priceMember Price: $113.00
Non-Member Price: $193.00
F02000 - SEMI F20 - Specification for 316L Stainless Steel Bar, Forgings, Extruded Shapes, Plate, and Tubing for Components Used in General Purpose, High Purity and Ultra-High Purity Semiconductor Manufacturing Applications
G06700 - SEMI G67 - Test Method for the Measurement of Particle Generation from Sheet Materials
SEMI G67 - Test Method for the Measurement of Particle Generation from Sheet Materials Sale priceMember Price: $113.00
Non-Member Price: $193.00
G09400 - SEMI G94 - Specification for Coin-Stack Type Tape Frame Shipping Container for 300 mm Wafer
M04000 - SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド
SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
G02100 - SEMI G21 - Specification for Plating Integrated Circuit Leadframes
SEMI G21 - Specification for Plating Integrated Circuit Leadframes Sale priceMember Price: $113.00
Non-Member Price: $193.00
F05500 - SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers
G09500 - SEMI G95 - Specification for Mechanical Features of 450 mm Load Port for Tape Frame Cassettes in the Backend Process
G08200 - SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process
SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process Sale priceMember Price: $113.00
Non-Member Price: $193.00
HB00600 - SEMI HB6 - Test Method for Measurement of Thickness and Shape of Crystalline Sapphire Wafers by Using Optical Probes
MF176300 - SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer
SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer Sale priceMember Price: $113.00
Non-Member Price: $193.00
F06900 - SEMI F69 - Test Method for Transport and Shock Testing of Gas Delivery Systems
SEMI F69 - Test Method for Transport and Shock Testing of Gas Delivery Systems Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF015400 - SEMI MF154 - Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces
G06800 - SEMI G68 - Test Method for Junction-to-Case Thermal Resistance Measurements in Air Environment for Semiconductor Packages
M07300 - SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles
MF104800 - SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated ScatterMF104800 - SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter
SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter Sale priceMember Price: $113.00
Non-Member Price: $193.00