{"product_id":"mf067100-semi-mf671-test-method-for-measuring-flat-length-on-wafers-of-silicon-and-other-electronic-materials","title":"MF067100 - SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials","description":"\u003cp\u003e \u003c\/p\u003e\u003cp\u003eThis Test Method covers techniques for determination of the length of the flatted portion of a wafer periphery.\u003cbr\u003e \u003c\/p\u003e\u003cp\u003eThis Test Method is intended primarily for use on electronic materials in the form of nominally circular edge-contoured wafers with flat lengths up to 65 mm. The precision of this Test Method has been established directly only for silicon wafers, but it is not expected to be material dependent.\u003cbr\u003e \u003c\/p\u003e\u003cp\u003eThis Test Method is suitable for referee measurement purposes and may be used for routine acceptance measurements when specified limits require test precision greater than can be obtained with hand held scale and unaided eye.\u003cbr\u003e \u003c\/p\u003e\u003cp\u003eThis Test Method is independent of surface finish.\u003cbr\u003e \u003c\/p\u003e\u003cp\u003eFor application to wafers of diameter 3 inch or smaller, the values stated in inch-pound units are to be regarded as the standard whether or not they appear in parentheses; the values stated in acceptable metric units are for information only. For application to wafers of diameter larger than 3 inch, the values stated in acceptable metric units are to be regarded as the standard; the values stated in inch-pound units are for information only.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003cbr\u003eSEMI M1 — Specification for Polished Single Crystal Silicon Wafers\u003cbr\u003eSEMI M59 — Terminology for Silicon Technology\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003cbr\u003eSEMI MF671-0312 (Reapproved 1023)\u003cbr\u003eSEMI MF671-0312 (Reapproved 0718)\u003cbr\u003eSEMI MF671-0312 (technical revision)\u003cbr\u003eSEMI MF671-0707 (technical revision)\u003cbr\u003eSEMI MF671-0705 (technical revision)\u003cbr\u003eSEMI MF671-99 (first SEMI publication)\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI MF671-0312 (Reapproved 1023) - Current","offer_id":43106888056899,"sku":"17195","price":171.95,"currency_code":"EUR","in_stock":true},{"title":"SEMI MF671-0312 (Reapproved 0718) - Superseded","offer_id":43106888089667,"sku":"4963","price":171.95,"currency_code":"EUR","in_stock":true},{"title":"SEMI MF671-0312 - Superseded","offer_id":40234297065539,"sku":"9974","price":171.95,"currency_code":"EUR","in_stock":true},{"title":"SEMI MF671-0707 - Superseded","offer_id":40234297098307,"sku":"9976","price":171.95,"currency_code":"EUR","in_stock":true},{"title":"SEMI MF671-0705 - Superseded","offer_id":40234296934467,"sku":"9975","price":171.95,"currency_code":"EUR","in_stock":true},{"title":"SEMI MF671-99 - Superseded","offer_id":40234296967235,"sku":"9977","price":171.95,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/MFVolume_62c52464-bbfb-43be-944d-77b85760bfa7.png?v=1776702517","url":"https:\/\/store-dev2.semi.org\/en-nl\/products\/mf067100-semi-mf671-test-method-for-measuring-flat-length-on-wafers-of-silicon-and-other-electronic-materials","provider":"SEMI Dev 2","version":"1.0","type":"link"}