{"product_id":"mf039800-semi-mf398-test-method-for-majority-carrier-concentration-in-semiconductors-by-measurement-of-wavenumber-or-wavelength-of-the-plasma-resonance-minimum","title":"MF039800 - SEMI MF398 - Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum","description":"\u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003eThis standard was technically approved by the global Silicon Wafer Committee. This edition was approved for publication by the global Audits \u0026amp; Reviews Subcommittee on November 21, 2006. It was available at www.semi.org in February 2007. Originally published by ASTM International as ASTM F398-74T; previously published as SEMI MF398-92 (Reapproved 2002) \u003c\/font\u003e\u003c\/p\u003e \u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003e \u003c\/font\u003e\u003c\/p\u003e \u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003eNOTICE: This document was balloted and approved for withdrawal in 2007. \u003c\/font\u003e\u003c\/p\u003e \u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003e \u003c\/font\u003e\u003c\/p\u003e \u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003eThis test method covers determination of the wavenumber of the plasma resonance minimum in the infrared reflectance of a doped semiconductor specimen, from which the majority carrier concentration can be obtained. This test method of determination of the wavenumber minimum is nondestructive and contactless. It is applicable to n- and p-type silicon, n- and p-type gallium arsenide, and n-type germanium. This test method gives a relative measurement in that the relation between the wavenumber of the plasma resonance minimum and the majority carrier concentration is empirical. \u003c\/font\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003e\u003cfont\u003eNone.\u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI MF398-92 (Withdrawn 0307) - Withdrawn - Historical","offer_id":40234355064899,"sku":"9947","price":171.95,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/MFVolume_699b68cc-3e0c-4245-bc46-c5523bdfa145.png?v=1776702019","url":"https:\/\/store-dev2.semi.org\/en-nl\/products\/mf039800-semi-mf398-test-method-for-majority-carrier-concentration-in-semiconductors-by-measurement-of-wavenumber-or-wavelength-of-the-plasma-resonance-minimum","provider":"SEMI Dev 2","version":"1.0","type":"link"}