{"product_id":"m07900-semi-m79-太陽電池用円盤状100-mm鏡面研磨単結晶ゲルマニウムウェーハの仕様","title":"M07900 - SEMI M79 - 太陽電池用円盤状100 mm鏡面研磨単結晶ゲルマニウムウェーハの仕様","description":"\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e本スタンダードは，\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003eglobal Compound Semiconductor Materials Committee\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003eで技術的に承認されている。現版は\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003e2010\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e年\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003e12\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e月\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003e21\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e日，\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003eglobal Audits and Reviews Subcommittee\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003eにて発行が承認された。\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003e2011\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e年\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003e2\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e月に\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003ewww.semiviews.org\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003eおよび\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003e www.semi.org\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003eで入手可能となる。\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/p\u003e\n\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003e \u003cp dir=\"ltr\" align=\"left\"\u003e \u003c\/p\u003e\n\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e本仕様では，半導体および電子デバイスの製造に使用される円盤状\u003cfont face=\"Arial\" size=\"2\"\u003e\u003cfont face=\"Arial\" size=\"2\"\u003e100 mm\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e\u003cfont lang=\"JA\" face=\"MS PMincho\" size=\"2\"\u003e高純度単結晶ゲルマニウムウェーハの基板に関する要求事項をカバーする。\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/p\u003e\n\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\n\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003e\u003cfont\u003eSEMI M1 — Specification for Polished Single Crystal Silicon Wafers \u003cbr\u003eSEMI MF26 — Test Methods for Determining the Orientation of a Semiconductive Single Crystal \u003cbr\u003eSEMI MF43 — Test Methods for Resistivity of Semiconductor Materials \u003cbr\u003eSEMI MF154 — Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces \u003cbr\u003eSEMI MF523 — Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces \u003cbr\u003eSEMI MF533 — Test Method for Thickness and Thickness Variation of Silicon Wafers \u003cbr\u003eSEMI MF534 — Test Method for Bow of Silicon Wafers \u003cbr\u003eSEMI MF657 — Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning \u003cbr\u003eSEMI MF671 — Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials \u003cbr\u003eSEMI MF673 — Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge \u003cbr\u003eSEMI MF847 — Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon and Wafers by X-Ray Techniques \u003cbr\u003eSEMI MF928 — Test Methods for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates \u003cbr\u003eSEMI MF1390 — Test Method for Measuring Warp on Silicon Wafers by Automated Non-Contact Scanning \u003cbr\u003eSEMI MF1530 — Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Non-Contact Scanning \u003cbr\u003eSEMI MF2074 — Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers \u003cbr\u003eSEMI T5 — Specification for Alphanumeric Marking of Round Compound Semiconductor Wafers \u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e","brand":"semi.org","offers":[{"title":"SEMI M79-0211 - 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