{"title":"SEMICON West 2021 Promotions","description":"","products":[{"product_id":"semiviews-readerplus","title":"SEMIViews - Reader Plus","description":"\u003cdiv data-olk-copy-source=\"MailCompose\"\u003eThis is an online subscription product with a license term of one year from the date of purchase. The license includes access for one person to SEMIViews through a personal username and password. The personal username and password is assigned to and allows access for one person only and may not be shared or distributed within or outside of the company. If you have several employees that need access to SEMIViews, a license is required for each user. The subscription includes access to Standards in Adobe Acrobat PDF format in English (official version) and where available, Japanese, Chinese, and Korean. Updates and historical versions are also included.\u003c\/div\u003e\n\u003cdiv\u003e\u003c\/div\u003e\n\u003cdiv\u003eThe prices shown are the base price for one license (seat). The price goes down with each additional license purchased. For example, if you purchase 100 Reader+ licenses, the price is $460 per seat (member rate). For 250 Reader+ licenses, the price drops to $240 per seat (member rate). The pricing calculator can be used to estimate quantity prices. You may choose to stay within one product type or choose a combination of product types, depending on your company's needs.\u003c\/div\u003e\n\u003cdiv\u003e\u003c\/div\u003e\n\u003cdiv\u003e*If you have more than 500 employees, or are looking for company-wide access, please contact your local SEMI office to inquire about the SEMIViews Enterprise License.\u003c\/div\u003e\n\u003cdiv\u003eTo purchase a single license through the store with a credit card, click on the “buy now” button. To order more than one license, please contact our Customer Service department at 408.943.6900 or email your request to customerservice@semi.org.\u003c\/div\u003e\n\u003cdiv\u003eActivation can take up to 3 business days. Orders received during non-business hours will be processed on the next business day (Monday-Friday, Pacific Time).\u003c\/div\u003e\n\u003cdiv\u003e\u003cb\u003e\u003c\/b\u003e\u003c\/div\u003e\n\u003cdiv\u003e\n\u003cb\u003eRefund Policy:\u003c\/b\u003e Due to the nature of our products, SEMI has a no refund\/no exchange policy. Please make sure that you have reviewed your order prior to finalizing your purchase. All sales are final.\u003c\/div\u003e","brand":"semi.org","offers":[{"title":"Default Title","offer_id":40234231824451,"sku":"228","price":3542.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/SEMIViewsmain_15bbb81e-f619-4f50-8dc6-1c7a904c92cb.jpg?v=1776703152"},{"product_id":"semiviews-reader","title":"SEMIViews - Reader","description":"\u003cdiv data-olk-copy-source=\"MailCompose\"\u003eThis is an online subscription product with a license term of one year from the date of purchase. The license includes access for one person to SEMIViews through a personal username and password. The personal username and password is assigned to and allows access for one person only and may not be shared or distributed within or outside of the company. If you have several employees that need access to SEMIViews, a license is required for each user. The subscription includes access to Standards in Adobe Acrobat PDF format in English (official version) and where available, Japanese, Chinese, and Korean. Updates and historical versions are also included.\u003c\/div\u003e\n\u003cdiv\u003e\u003c\/div\u003e\n\u003cdiv\u003eThe prices shown are the base price for one license (seat). The price goes down with each additional license purchased. For example, if you purchase 100 Reader+ licenses, the price is $460 per seat (member rate). For 250 Reader+ licenses, the price drops to $240 per seat (member rate). The pricing calculator can be used to estimate quantity prices. You may choose to stay within one product type or choose a combination of product types, depending on your company's needs.\u003c\/div\u003e\n\u003cdiv\u003e\u003c\/div\u003e\n\u003cdiv\u003e*If you have more than 500 employees, or are looking for company-wide access, please contact your local SEMI office to inquire about the SEMIViews Enterprise License.\u003c\/div\u003e\n\u003cdiv\u003eTo purchase a single license through the store with a credit card, click on the “buy now” button. To order more than one license, please contact our Customer Service department at 408.943.6900 or email your request to customerservice@semi.org.\u003c\/div\u003e\n\u003cdiv\u003e\u003c\/div\u003e\n\u003cdiv\u003eActivation can take up to 3 business days. Orders received during non-business hours will be processed on the next business day (Monday-Friday, Pacific Time).\u003c\/div\u003e\n\u003cdiv\u003e\u003cb\u003e\u003c\/b\u003e\u003c\/div\u003e\n\u003cdiv\u003e\n\u003cb\u003eRefund Policy:\u003c\/b\u003e Due to the nature of our products, SEMI has a no refund\/no exchange policy. Please make sure that you have reviewed your order prior to finalizing your purchase. All sales are final.\u003c\/div\u003e\n\u003cp\u003e\u003cbr\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"Default Title","offer_id":40234236444739,"sku":"229","price":1992.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/SEMIViewsmain_ca6b0835-b5e8-4b13-ae57-7760bdbf4d93.jpg?v=1776703151"},{"product_id":"a00100-semi-a1-specification-for-horizontal-communication-hc-between-equipment-for-factory-automation-system","title":"A00100 - SEMI A1 - Specification for Production Equipment Smart Connection Interface (PESCI)","description":"\u003cp align=\"justify\"\u003e \u003c\/p\u003e\u003cp class=\"StdsText\"\u003e\u003cspan style=\"font-family: Arial, sans-serif; font-size: small;\"\u003eThe purpose of this Standard is to provide a communication interface specification, to be used for the equipment control in flow shop type manufacturing line, that has the following capabilities.\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003c!--[if !supportLists]--\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"mso-bidi-font-size:10.0pt;font-family:Symbol;mso-fareast-font-family: \n \n Symbol;mso-bidi-font-family:Symbol\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e \u003c\/span\u003e\u003c\/span\u003e\u003c!--[endif]--\u003e\u003cspan style='mso-bidi-font-size:10.0pt;font-family:\"Arial\",sans-serif'\u003eSimultaneous transfer of Material and its Material Data between adjacent equipment\u003cp\u003e\u003c\/p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003c!--[if !supportLists]--\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"mso-bidi-font-size:10.0pt;font-family:Symbol;mso-fareast-font-family: \n \n Symbol;mso-bidi-font-family:Symbol\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e \u003c\/span\u003e\u003c\/span\u003e\u003c!--[endif]--\u003e\u003cspan style='mso-bidi-font-size:10.0pt;font-family:\"Arial\",sans-serif'\u003eTransfer of general-purpose data between equipment\u003cp\u003e\u003c\/p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003c!--[if !supportLists]--\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"mso-bidi-font-size:10.0pt;font-family:Symbol;mso-fareast-font-family: \n \n Symbol;mso-bidi-font-family:Symbol\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e \u003c\/span\u003e\u003c\/span\u003e\u003c!--[endif]--\u003e\u003cspan style='mso-bidi-font-size:10.0pt;font-family:\"Arial\",sans-serif'\u003eTransfer of general-purpose data between the host and equipment\u003cp\u003e\u003c\/p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e \u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e \u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eThe purpose of this Standard is to provide a communication interface specification that can also be supported by cost effective controllers such as Programmable Logic Controller (PLC).\u003c\/span\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003e\u003cp\u003e\u003c\/p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsH1\"\u003e \u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eThe scope of this Standard is to define communication interface specifications for equipment control in a flow shop type manufacturing line, which includes:\u003c\/span\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003e\u003cp\u003e\u003c\/p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003c!--[if !supportLists]--\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"mso-bidi-font-size:10.0pt;font-family:Symbol;mso-fareast-font-family: \n \n Symbol;mso-bidi-font-family:Symbol\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e \u003c\/span\u003e\u003c\/span\u003e\u003c!--[endif]--\u003e\u003cspan style='mso-bidi-font-size:10.0pt;font-family:\"Arial\",sans-serif'\u003eA handoff interface that transfers a Material and its Material Data simultaneously between adjacent equipment\u003cp\u003e\u003c\/p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003c!--[if !supportLists]--\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"mso-bidi-font-size:10.0pt;font-family:Symbol;mso-fareast-font-family: \n \n Symbol;mso-bidi-font-family:Symbol\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e \u003c\/span\u003e\u003c\/span\u003e\u003c!--[endif]--\u003e\u003cspan style='mso-bidi-font-size:10.0pt;font-family:\"Arial\",sans-serif'\u003eA communication interface that transfers general-purpose data between equipment or between the host and equipment\u003cp\u003e\u003c\/p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e \u003c\/p\u003e\u003cp class=\"MsoNoSpacing\"\u003e \u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e \u003c\/p\u003e\u003cp class=\"MsoNoSpacing\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cp\u003e\u003c\/p\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNoSpacing\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cb\u003eSubordinate Standard\u003c\/b\u003e (included):\u003cp\u003e\u003c\/p\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNoSpacing\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eSEMI A1.1-1020 - \u003c\/font\u003e\u003cfont face=\"arial\"\u003e\u003cspan style=\"font-size: 10pt; line-height: 107%;\"\u003eSpecification for TCP\/IP Interface for Production Equipment Smart Connection Interface \u003c\/span\u003e\u003cspan style=\"font-size: 10pt; line-height: 107%;\"\u003e(PESCI)\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNoSpacing\"\u003e \u003c\/p\u003e\u003cp class=\"MsoNoSpacing\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cp\u003e\u003c\/p\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cb\u003eReferenced SEMI Standards \u003c\/b\u003e(purchase separately)\u003c\/font\u003e\u003cp class=\"MsoNoSpacing\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cp\u003e\u003c\/p\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1.1 — Specification for TCP\/IP Interface for Production Equipment Smart Connection Interface (PESCI)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A2 — Specification for Surface Mount Assembler Smart Hookup (SMASH)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e \u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cspan style='font-size:10.0pt;line-height:107%;font-family:\n\"Arial\",sans-serif'\u003e\u003cb\u003eRevision History\u003c\/b\u003e\u003cp\u003e\u003c\/p\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1-0123 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1-0521 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1-1020 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1-1019 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1-0519 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1-0918 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1-0617 (first published - replaces SEMI PV35)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style='font-size:10.0pt;line-height:107%;font-family:\n\"Arial\",sans-serif'\u003e\u003cp\u003e\u003c\/p\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1.1-1020 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1.1-1019 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI A1.1-0918 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI A1-0123 - Current","offer_id":40378958512195,"sku":"16370","price":170.0,"currency_code":"USD","in_stock":true},{"title":"SEMI A1-0521 - Superseded","offer_id":40378958544963,"sku":"14540","price":170.0,"currency_code":"USD","in_stock":true},{"title":"SEMI A1-1020 - Superseded","offer_id":40234246242371,"sku":"14240","price":170.0,"currency_code":"USD","in_stock":true},{"title":"SEMI A1-1019 - Superseded","offer_id":40234246340675,"sku":"13590","price":170.0,"currency_code":"USD","in_stock":true},{"title":"SEMI A1-0519 - Superseded","offer_id":40234246406211,"sku":"8277","price":170.0,"currency_code":"USD","in_stock":true},{"title":"SEMI A1-0918 - 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This Excel-formatted database is conveniently delivered electronically.\u003c\/span\u003e","brand":"semi.org","offers":[{"title":"Default Title","offer_id":40234248437827,"sku":"207","price":4350.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/Fab_WorldFabWatch_170x170text_2x_1_bd26806b-a050-4203-bf07-5dcfb4730fdd.png?v=1776702898"},{"product_id":"world-fab-watch-subscription","title":"World Fab Watch - Subscription","description":"\u003cspan style=\"color: rgb(51, 51, 51); font-family: Roboto; font-size: 14px; background-color: rgb(255, 255, 255);\"\u003eThe SEMI World Fab Watch report is a powerful and comprehensive database of 1000-plus fabs, R\u0026amp;D, and pilot-line fab locations worldwide. It provides an excellent snapshot of the last quarter for all worldwide front-end semiconductor fabs. \u003c\/span\u003e\u003cspan style=\"color: rgb(51, 51, 51); font-family: Roboto; font-size: 14px; background-color: rgb(255, 255, 255);\"\u003eThe database includes front-end fabs and foundries such as TSMC, UMC, GLOBALFOUNDRIES, SMIC, Samsung, Intel, Toshiba, Micron, SK Hynix, Powerchip, Texas Instruments, Renesas, STMicro, Fujitsu, Sharp, NXP, Infineon, and many more. This Excel-formatted database is conveniently delivered electronically.\u003c\/span\u003e","brand":"semi.org","offers":[{"title":"Default Title","offer_id":40234251190339,"sku":"206","price":6250.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/Fab_WorldFabWatch_170x170text_2x_1_7628dfa0-0c72-4afa-9641-6d9c89c597ab.png?v=1776702899"},{"product_id":"f04700-semi-f47-specification-for-semiconductor-processing-equipment-voltage-sag-immunity","title":"F04700 - SEMI F47 - Specification for Semiconductor Processing Equipment Voltage Sag Immunity","description":"\u003cp class=\"StdsH2\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003eSemiconductor factories require high levels of power quality due to the sensitivity of equipment and process controls. Semiconductor processing equipment is especially vulnerable to voltage sags. This Specification defines the voltage sag immunity required for semiconductor processing, metrology, and automated test equipment. This Specification strikes a balance between voltage sag immunity and increased equipment cost.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsH1\"\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003eThis Specification sets minimum voltage sag immunity requirements for equipment used in the semiconductor industry. Immunity is specified in terms of voltage sag depth (in percent of nominal voltage remaining during the sag) and voltage sag duration (in cycles or seconds). This Specification also sets procurement requirements, test methods, pass\/fail criteria, and test report requirements.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003e\u003cbr\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003eThe primary focus of this Specification is semiconductor processing equipment including but not limited to the following types:\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eEtch equipment (Dry \u0026amp; Wet)\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eFilm deposition equipment (CVD \u0026amp; PVD)\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eThermal equipment\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eSurface prep and clean equipment\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003ePhotolithography equipment (Scanner, Stepper \u0026amp; Tracks)\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eIon implant equipment\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eMetrology equipment\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eAutomated test equipment\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eChemical mechanical polishing\/planarization equipment\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsH3\" style=\"text-indent: 0in; margin-left: 0in;\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e\u003cbr\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsH3\" style=\"text-indent: 0in; margin-left: 0in;\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eThe secondary focus of this Specification is subsystems and components that are used in the construction of semiconductor processing equipment, including but not limited to:\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003ePower supplies\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eRadio frequency generators and matching networks\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eUltrasonic generators\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eComputers and communication systems\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eRobots and factory interfaces\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eAC contactor coils and AC relay coils\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eChillers and cryo pumps\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003ePumps and blowers\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsListBulleted\"\u003e\u003cfont size=\"2\"\u003e\u003cspan style=\"font-family: Symbol;\"\u003e·\u003cspan style='font-variant-numeric: normal; font-variant-east-asian: normal; font-stretch: normal; line-height: normal; font-family: \"Times New Roman\";'\u003e    \u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eAdjustable speed drives\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003eThis Specification applies to semiconductor processing equipment to include the equipment mainframe and all subsystems whose electrical power is directly affected by the operation of the equipment’s emergency off (EMO) system.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cfont size=\"2\"\u003e\u003ci\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003eGrandfather Clause\u003c\/span\u003e\u003c\/i\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e — Equipment, subsystems, and components that were tested or certified under the previous version of this Specification, prior to the publication date of this Specification, do not require re-testing or re-certification until hardware or software design changes that could affect voltage sag immunity are implemented.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cspan style=\"line-height: 14.2667px; font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e　\u003c\/p\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cb\u003eReferenced SEMI Standards \u003c\/b\u003e(purchase separately)\u003cbr\u003e\u003c\/font\u003e\u003cp class=\"StdsText\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003eSEMI E51 — Guide for Typical Facilities Services and Termination Matrix\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsText\"\u003e\u003cspan style=\"font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003eSEMI S2 — Environmental, Health, and Safety Guideline for Semiconductor Manufacturing Equipment\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cspan style=\"line-height: 14.2667px; font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI F47-0706 (Reapproved 0812)E - Current","offer_id":40234254401603,"sku":"13761","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F47-0706 (Reapproved 0812) - Superseded","offer_id":40234254532675,"sku":"4038","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F47-0706 - Superseded","offer_id":40234254696515,"sku":"10789","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F47-0200 - Superseded","offer_id":40234254860355,"sku":"10788","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F47-0999 - Superseded","offer_id":40234254991427,"sku":"10954","price":380.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/F47_SpecforVoltageSagImmunity_800x800_2x_dadcc44e-4a32-4d48-aaeb-edbaf3d8e5d9.png?v=1776702759"},{"product_id":"e04900-semi-e49-guide-for-high-purity-and-ultrahigh-purity-piping-performance-subassemblies-and-final-assemblies","title":"E04900 - SEMI E49 - Guide for High Purity and Ultrahigh Purity Piping Performance, Subassemblies, and Final Assemblies","description":"\u003cp\u003e \u003c\/p\u003e\u003cp\u003e1  Purpose\u003cbr\u003e1.1  The purpose of this overview Standard is to provide a basic set of terminology and reference documents for SEMI E49.2, SEMI E49.4, SEMI E49.5, SEMI E49.6, SEMI E49.7, SEMI E49.8 and SEMI E137.\u003cbr\u003e2  Scope\u003cbr\u003e2.1  This Standard contains terminology and reference documents used in SEMI E49.2, SEMI E49.4, SEMI E49.5, SEMI E49.6, SEMI E49.7, SEMI E49.8, and SEMI E137, which will reference performance and method standards as well as recommended practices.\u003cbr\u003e2.1.1  The SEMI E49 Subordinate Standards are organized by types of piping distribution systems: gas, DI\/chemical, solvent, and by types of assembly and testing procedures: subassembly for stainless steel, subassembly for polymer and final tool assembly. Final assemblies should be tested or validated for all appropriate parameters (e.g., purity, integrity, failure rate) as specified in the applicable SEMI E49 Subordinate Standards.\u003cbr\u003e2.1.2  The piping distribution Subordinate Standards (SEMI E49.2 through SEMI E49.8) include guidelines for system design, performance, materials, and components. Purity and performance grades are described for each of the three types of distribution systems.\u003cbr\u003e2.1.3  Users should complete an overall tool cost of ownership analysis (refer to SEMI E35) to determine the optimum application of HP or UHP tool features. Key parameters should include facilities cost and installation cycle time, piping system reliability and maintainability factors, tool and sub-system contribution to contamination, and resultant effects on wafer quality and wafer throughput factors.\u003cbr\u003e2.2  Final assemblies should be evaluated according to the criteria of SEMI S2 for environmental, health and safety (EH\u0026amp;S) issues associated with their use.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSubordinate Standards (included)\u003cbr\u003eSEMI E49.2 — Guide for the Qualification of Polymer Assemblies Used in Ultrapure Water and Liquid Chemical Systems in Semiconductor Process Equipment\u003cbr\u003eSEMI E49.3 — Guide for Ultrahigh Purity Deionized Water and Chemical Distribution Systems in Semiconductor Manufacturing Equipment \u003cbr\u003eSEMI E49.4 — Guide for Ultrahigh Purity Solvent Distribution Systems with Metallic Fluid Paths in Semiconductor Manufacturing Equipment\u003cbr\u003eSEMI E49.5 — Guide for the Design of Ultrahigh Purity Solvent Distribution Systems with Non-Metallic Fluid Paths in Semiconductor Manufacturing Equipment\u003cbr\u003eSEMI E49.6 — Guide for Subsystem Assembly and Testing Procedures – Stainless Steel Systems\u003cbr\u003eSEMI E49.7 — Guide for the Design and Manufacture of Polymer Assemblies Used for Liquid Chemical Systems in Semiconductor Equipment\u003cbr\u003eSEMI E49.8 — Guide for High Purity and Ultrahigh Purity Gas Distribution Systems in Semiconductor Manufacturing Equipment\u003cbr\u003eSEMI E49.9 — Guide for Ultrahigh Purity Deionized Water and Chemical Distribution Systems in Semiconductor Manufacturing Equipment\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003cbr\u003eSEMI E35 — Guide to Calculate Cost of Ownership (COO) Metrics for Semiconductor Manufacturing Equipment\u003cbr\u003eSEMI E137 — Guide for Final Assembly, Packaging, Transportation, Unpacking, and Relocation of Semiconductor Manufacturing Equipment\u003cbr\u003eSEMI S2 — Environmental, Health, and Safety Guideline for Semiconductor Manufacturing Equipment\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003cbr\u003eSEMI E49-0419 (technical revision)\u003cbr\u003eSEMI E49-0617 (designation update)\u003cbr\u003eSEMI E49-1104 (Reapproved 1211)\u003cbr\u003eSEMI E49-1104 (technical revision)\u003cbr\u003eSEMI E49-0304 (designation update)\u003cbr\u003eSEMI E49-1103 (designation update)\u003cbr\u003eSEMI E49-0702 (technical revision)\u003cbr\u003eSEMI E49-95 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI E49.1-1104 - replaced by SEMI E137\u003cbr\u003eSEMI E49.1-0304 (technical revision)\u003cbr\u003eSEMI E49.1-95 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI E49.2-0617 (complete rewrite)\u003cbr\u003eSEMI E49.2-1104 (technical revision)\u003cbr\u003eSEMI E49.2-0298 (technical revision)\u003cbr\u003eSEMI E49.2-95 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI E49.3-0298 (Withdrawn 1104) - replaced by SEMI E49.2\u003cbr\u003eSEMI E49.3-0298 (technical revision)\u003cbr\u003eSEMI E49.3-95 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI E49.4-0419 (complete rewrite)\u003cbr\u003eSEMI E49.4-0298 (technical revision)\u003cbr\u003eSEMI E49.4-95 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI E49.5-0419 (complete rewrite)\u003cbr\u003eSEMI E49.5-1104 (technical revision)\u003cbr\u003eSEMI E49.5-0298 (technical revision)\u003cbr\u003eSEMI E49.5-95 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI E49.6-1103 (Reapproved 1211)\u003cbr\u003eSEMI E49.6-1103 (technical revision)\u003cbr\u003eSEMI E49.6-95 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI E49.7-0419 (complete rewrite)\u003cbr\u003eSEMI E49.7-0304E (editorial revision)\u003cbr\u003eSEMI E49.7-0304 (technical revision)\u003cbr\u003eSEMI E49.7-0702 (technical revision)\u003cbr\u003eSEMI E49.7-95 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI E49.8-1103 (Reapproved 1211)\u003cbr\u003eSEMI E49.8-1103 (technical revision)\u003cbr\u003eSEMI E49.8-0298 (technical revision)\u003cbr\u003eSEMI E49.8-96 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI E49.9-0298 (Withdrawn 0303) - replaced by SEMI E49.8 \u003cbr\u003eSEMI E49.9-0298 (technical revision)\u003cbr\u003eSEMI E49.9-96 (first published)\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI E49-0419 - Current","offer_id":40234256957507,"sku":"7163","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E49-0617 - Superseded","offer_id":40234257023043,"sku":"3813","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E49-1104 (Reapproved 1211) - Superseded","offer_id":40234257055811,"sku":"7675","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E49-1104 - Superseded","offer_id":40234257088579,"sku":"7348","price":380.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/EVolume_6c0725d4-ffd3-4f0c-a8ca-11f9156664da.png?v=1776702824"},{"product_id":"semi-power-and-compound-fab-outlook-to-2022","title":"Power \u0026 Compound Fab Report","description":"\u003cspan style=\"color: rgb(51, 51, 51); font-family: Roboto; font-size: 15px; background-color: rgb(255, 255, 255);\"\u003eThis report tracks more than 400 \u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(51, 51, 51); font-family: Roboto; background-color: rgb(255, 255, 255); font-size: 14px;\"\u003epower device related\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(51, 51, 51); font-family: Roboto; background-color: rgb(255, 255, 255); font-size: 14px;\"\u003e facilities and over 500 compound related facilities worldwide including more than 45 new facilities and lines to start production in 2018 or later. The Microsoft® Excel data \u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(51, 51, 51); font-family: Roboto; background-color: rgb(255, 255, 255); font-size: 14px;\"\u003efile\u003c\/span\u003e\u003cspan style=\"box-sizing: border-box; color: rgb(51, 51, 51); font-family: Roboto; background-color: rgb(255, 255, 255); font-size: 14px;\"\u003e gives access to the latest fab information regarding installed capacity, technologies, materials, products, and forecasts through the next four years to 2022. This report provides insight into current fab activity for both power and compound semiconductor manufacturing and informs business planning and investment.\u003c\/span\u003e","brand":"semi.org","offers":[{"title":"Default Title","offer_id":40234265149507,"sku":"633","price":6250.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/Fab_Power_CompoundOutlookReport_170x170text_2x_1_a41295c6-db97-4d47-a4cf-d35b7038b645.png?v=1776702903"},{"product_id":"f05700-semi-f57-specification-for-polymer-materials-and-components-used-in-ultrapure-water-and-liquid-chemical-distribution-systems","title":"F05700 - SEMI F57 - Specification for High Purity Polymer Materials and Components Used in Ultrapure Water and Liquid Chemical Distribution Systems","description":"\u003cp align=\"justify\" dir=\"ltr\"\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eThis Standard specifies minimum performance requirements for ultra high purity (UHP) polymer materials and components suitable for conveying ultrapure water (UPW) in UPW distribution systems. Further information regarding UPW systems can be found in SEMI F61, SEMI F63.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eIt also provides recommendations for the use of polymer materials and components used in UHP liquid chemical distribution systems (LCDS). Such distribution systems covered in this Specification include bulk supply, facility distribution, and process equipment applications.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eAlthough the requirements of this Specification focus on testing materials and components with UPW at elevated temperatures, there could be other applicable chemicals, such as caustics and oxidizers, which users of this Specification might like to consider. However, defining the vast number of testing parameters for each possible liquid chemistry stream is beyond the scope of this Specification. Nevertheless, this Specification intends neither to exclude nor to limit the possibility that suppliers and end-users might test with chemicals other than UPW or with other temperature conditions and, at the same time, set their own internal limits separate from the requirements within this Specification.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eThis Specification focuses on polymer material and component performance and validation. Operational requirements to ensure polymer materials and components meet the intent of this Specification are provided where appropriate. A summary list follows:\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cul dir=\"ltr\"\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eQuantitative Measures of Compliance\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eMetallic Contribution Limits\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eIonic Contribution Limits\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eTotal Organic (Oxidizable) Carbon Contribution Limits\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSurface Roughness Limits\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eQualitative Measures of Compliance\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eMechanical Properties\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003ePhysical Properties\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eChemical Resistance\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eReliability\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eTraceability Requirements\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003ePackaging Requirements\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eCertification\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eThis Specification pertains to polymer materials and components consisting of but not limited to the items shown in Table 1 are designed to contain and supply the following, but not limited to, the types of liquid chemicals listed below:\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cul dir=\"ltr\"\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eUPW\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eAcids, bases and oxidizers\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eAqueous salt solutions\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli align=\"justify\"\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSolvents\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003ePolymer materials and components that meet the requirements specified in this Standard shall be considered suitable for UPW and LCDS as described in ¶ \u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003e1.3\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003e. Refer to SEMI C90 for additional requirements for the use of polymers in LCDS.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e (purchase separately)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI C69 — Test Method for the Determination of Surface Areas of Polymer Pellets\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI C90 — Test Method and Specification for Testing Perfluoroalkoxy (PFA) Materials Used in Liquid Chemical Distribution Systems\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI E49 — Guide for High Purity and Ultrahigh Purity Piping Performance, Subassemblies, and Final Assemblies\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI F40 — Practice for Preparing Liquid Chemical Distribution Components and Neat Polymers for Chemical Testing\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI F61 — Guide to Design and Operation of a Semiconductor Ultrapure Water System\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI F63 — Guide for Ultrapure Water used in Semiconductor Processing\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eRevision History\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/b\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI F57-0622 (technical revision)\u003cbr\u003eSEMI F57-0120 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI F57-0314 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI F57-0312 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI F57-0301 (technical revision)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:11pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style=\"font-family:Calibri,sans-serif\"\u003e\u003cspan style=\"font-size:10.0pt\"\u003e\u003cspan style=\"line-height:107%\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI F57-1000 (first published)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI F57-0622 - Current","offer_id":40234265575491,"sku":"15128","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F57-0120 - Superseded","offer_id":40234265608259,"sku":"13719","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F57-0314 - 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for substrates such as wafers, frames, strips, and trays.\u003cbr\u003e2  Scope\u003cbr\u003e2.1  This version of the Specification applies to the substrate types: wafers, frames, strips, and trays.\u003cbr\u003e2.2  This Specification addresses assembly and packaging including the testing of semiconductor devices.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSubordinate Standards (included)\u003cbr\u003eSEMI E142.1 — Specification for XML Schema for Substrate Mapping\u003cbr\u003eSEMI E142.2 — Specification for SECS II Protocol for Substrate Mapping\u003cbr\u003eSEMI E142.3 — Specification for Web Services for Substrate Mapping\u003cbr\u003eSEMI E142.4 — Specification for SECS II Protocol for Substrate Mapping Using Item Transfer\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003cbr\u003eSEMI E5 — Specification for SEMI Equipment Communications Standard 2 Message Content (SECS-II)\u003cbr\u003eSEMI E39 — Specification for Object Services: Concept, Behavior, and Services\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003cbr\u003eSEMI E142-0225 (technical revision)\u003cbr\u003eSEMI E142-0224E (editorial revision)\u003cbr\u003eSEMI E142-0224 (technical revision)\u003cbr\u003eSEMI E142-1022 (designation update)\u003cbr\u003eSEMI E142-0921 (technical revision)\u003cbr\u003eSEMI E142-0820 (technical revision)\u003cbr\u003eSEMI E142-0211 (Reapproved 1016)\u003cbr\u003eSEMI E142-0211 (designation update)\u003cbr\u003eSEMI E142-0706 (technical revision)\u003cbr\u003eSEMI E142-0306 (technical revision)\u003cbr\u003eSEMI E142-1105 (technical revision)\u003cbr\u003eSEMI E142-0305 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI E142.1-0225 (technical revision)\u003cbr\u003eSEMI E142.1-0224 (technical revision)\u003cbr\u003eSEMI E142.1-0921E (technical 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This database offers access to and insights into global OSAT facilities in China, Taiwan, Korea, Japan, Southeast Asia, Europe, and the Americas. The report also highlights packaging technology offerings by manufacturing location. Details include:\u003c\/p\u003e\u003cul style=\"box-sizing: border-box; margin-top: 0px; margin-bottom: 10px; color: rgb(51, 51, 51); font-family: Roboto; font-size: 15px; background-color: rgb(255, 255, 255);\"\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003ePlant site technology capability: Tape and Reel, Test\u003c\/li\u003e\n\u003cli style=\"box-sizing: border-box;\"\u003ePackaging assembly service offered: BGA, specific leadframe type such as QFP, QFN, SO, flip chip bumping, WLP, Modules\/SIP, etc.\u003c\/li\u003e\n\u003c\/ul\u003e","brand":"semi.org","offers":[{"title":"Default Title","offer_id":40234271473731,"sku":"221","price":11000.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/WWAssembly_TestFacilitydatabaseShopify800x800.png?v=1776702901"},{"product_id":"e08400-semi-e84-specification-for-enhanced-carrier-handoff-parallel-i-o-interface","title":"E08400 - SEMI E84 - Specification for Enhanced Carrier Handoff Parallel I\/O Interface","description":"\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eDue to the migration to large wafer sizes, future semiconductor factories will use extensive automated material handling systems (AMHS) to transfer wafer carriers, including FOUPs and open cassettes, of increasing weight. The parallel input\/output (PI\/O) control signals between the production equipment and the AMHS must be better defined for more reliable and efficient carrier handoffs (load\/unload) at production equipment load ports.\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e　\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eThe purpose of this Specification is to enhance the capabilities of the parallel I\/O interface defined in SEMI E23 in order to support improvements in the reliability and efficiency of carrier transfer. The enhanced capabilities include continuous handoff, simultaneous handoff, and the capabilities of error detection on the interface.\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e \u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eThe scope of this Specification is limited to communications associated with the material handoff operations between the active equipment (e.g., AMHS equipment including AGV, RGV and OHT) and the passive equipment (e.g., production equipment including process and metrology equipment; stockers, etc.). This scope also extends to interbay AMHS active equipment (i.e., OHS and stockers equipped with transfer devices) and passive equipment (i.e., OHS and stockers not equipped with transfer devices). This Specification defines the enhanced parallel I\/O interface signals used to handoff carriers between the production equipment and the AMHS. Figures 1 and 2 show examples of types of AMHS equipment.\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e　\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eThis enhanced carrier handoff parallel I\/O interface specification includes:\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e• Signal definition including load port assignment signals (¶ 6.1),\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e• Carrier handoff sequence definitions and time diagrams (¶ 6.2),\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e• Error indication, detection, and recovery (¶ 6.3 and ¶ 6.4),\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e• Connector type, signal, and pin assignment (¶ 6.4), and\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e• Interface sensor unit size to be located at load port defined by SEMI E15.1 (applicable for systems designed to handle 300 mm wafer carriers).\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e　\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eThe enhanced carrier handoff parallel I\/O interface controls the handoff of a carrier to and from the passive equipment by the active equipment. This parallel I\/O interface only controls the automated handoff operation of the carrier. The handoff is the operation in which a carrier is transferred from one piece of equipment to another. Both the active and passive equipment manage this operation. The factory level controller (i.e., host) does not manage the handoff operation. Figure 3 shows applications for the parallel I\/O interface specified in this Document.\u003c\/font\u003e\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E1.9 — Mechanical Specification for Cassettes Used to Transport and Store 300 mm Wafers\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E15.1 — Specification for 300 mm Tool Load Port\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E23 — Specification for Cassette Transfer Parallel I\/O Interface\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E30 — Specification for the Generic Model for Communications and Control of Manufacturing Equipment (GEM)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E47.1 — Mechanical Specification for FOUPS Used to Transport and Store 300 mm Wafers\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E87 — Specification for Carrier Management (CMS)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0823 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-1109 (Reapproved 1217)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-1109 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-1107 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0305 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0304 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0303 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-1102 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0302 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-1101 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0701 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0301 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-1000 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0200A (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0200 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0999 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI E84-0699 (first published)\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI E84-0823 - Current","offer_id":43106897756227,"sku":"17050","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-1109 (Reapproved 1217) - Superseded","offer_id":43106897788995,"sku":"3861","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-1109 - Superseded","offer_id":40234277273667,"sku":"7524","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-1107 - Superseded","offer_id":40234277306435,"sku":"7424","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-0305 - Superseded","offer_id":40234277339203,"sku":"7423","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-0304 - Superseded","offer_id":40234277371971,"sku":"7422","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-0303 - Superseded","offer_id":40234277404739,"sku":"7525","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-1102 - Superseded","offer_id":40234277437507,"sku":"7526","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-0302 - Superseded","offer_id":40234277470275,"sku":"7534","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-1101 - Superseded","offer_id":40234277503043,"sku":"7527","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-0701 - Superseded","offer_id":40234277535811,"sku":"7528","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-0301 - Superseded","offer_id":40234277568579,"sku":"7529","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-1000 - Superseded","offer_id":40234277601347,"sku":"7530","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-0200A - Superseded","offer_id":40234277634115,"sku":"7531","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-0200 - Superseded","offer_id":40234277666883,"sku":"7532","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-0999 - Superseded","offer_id":40234277699651,"sku":"7533","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI E84-0699 - Superseded","offer_id":40234277732419,"sku":"7535","price":380.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/EVolume_73cb522b-35e4-45f0-9d3f-1c8ca18ad2ff.png?v=1776702783"},{"product_id":"f07800-semi-f78-practice-for-gas-tungsten-arc-gta-welding-of-fluid-distribution-systems-in-semiconductor-manufacturing-applications","title":"F07800 - SEMI F78 - Practice for Gas Tungsten Arc (GTA) Welding of Fluid Distribution Systems in Semiconductor Manufacturing Applications","description":"\u003cp\u003e \u003c\/p\u003e\u003cp\u003e1  Purpose\u003cbr\u003e1.1  The purpose of this Practice is to provide procedures for welding stainless steels and other corrosion resistant metals and alloys (CRAs) for fluid (liquid or gas) distribution systems in semiconductor manufacturing applications. Welds performed following these procedures are of sufficient quality to provide the required system purity, weld integrity, and weld strength for use in semiconductor manufacturing applications.\u003cbr\u003e \u003c\/p\u003e\u003cp\u003e2  Scope\u003cbr\u003e2.1  This Practice provides procedures for gas tungsten arc (GTA) autogenous butt joint welds of stainless steel and other CRAs in fluid distribution systems. The fluid distribution system includes tubing, pipe, fittings, valves, subassemblies and components that contain and distribute fluid.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003cbr\u003eSEMI F20 — Specification for 316L Stainless Steel Bar, Forgings, Extruded Shapes, Plate, and Tubing for Components Used in General Purpose, High Purity and Ultra-High Purity Semiconductor Manufacturing Applications\u003cbr\u003eSEMI F81 — Specification for Visual Inspection and Acceptance of Gas Tungsten Arc (GTA) Welds in Fluid Distribution Systems in Semiconductor Applications\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003cbr\u003eSEMI F78-0624 (technical revision)\u003cbr\u003eSEMI F78-0611 (Reapproved 0917)\u003cbr\u003eSEMI F78-0611 (technical revision)\u003cbr\u003eSEMI F78-0304 (technical revision)\u003cbr\u003eSEMI F78-0703 (first published)\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI F78-0624 - Current","offer_id":43106895855683,"sku":"17821","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F78-0611 (Reapproved 0917) - Superseded","offer_id":43106895888451,"sku":"4081","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F78-0611 - Superseded","offer_id":40234287792195,"sku":"10870","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F78-0304 - Superseded","offer_id":40234287824963,"sku":"10828","price":380.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/F78_GasTungstenArtWelding_800x800_2x_e24343c0-5b83-4006-aa26-af9ac7c3f954.png?v=1776702720"},{"product_id":"f06300-semi-f63-guide-for-ultrapure-water-used-in-semiconductor-processing","title":"F06300 - SEMI F63 - Guide for Ultrapure Water Used in Semiconductor Processing","description":"\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp\u003e1  Purpose\u003cbr\u003e1.1  This Guide may be used:\u003cbr\u003e• To establish performance criteria when purchasing ultrapure water (UPW) purification equipment.\u003cbr\u003e• To set the process control parameters for UPW-system operation.\u003cbr\u003e• To establish quality expectations for the supplied UPW.\u003cbr\u003eNOTE 1: These suggested guidelines are published as technical information and are intended for informational purposes only.\u003cbr\u003e1.2  This Guide should be used in conjunction with SEMI F61 and SEMI F75. Together these Guides provide recommendations for facility engineers and other manufacturing and quality professionals who are responsible for establishing programs to specify, monitor and control the quality of their ultrapure water (UPW) systems, through to point of use (POU).\u003cbr\u003e2  Scope\u003cbr\u003e2.1  UPW is used extensively in the production of semiconductor devices for all wet-processing steps (including wafer rinsing). UPW purity is therefore critical to the manufacture of semiconductors. This Guide provides UPW quality parameters and background information for the decision-making process related to new or retrofit facilities that manufacture semiconductors with line widths of 32 nm and smaller.\u003cbr\u003eNOTE 2: The design and configuration of a typical UPW system and descriptions of UPW system elements and unit processes can be found in SEMI F61.\u003cbr\u003e2.2  The UPW scope also includes hot UPW (HUPW), when defining UPW quality criteria.\u003cbr\u003e2.3  The goal of members of the International Roadmap for Devices and Systems (IRDS) UPW committee is to look years ahead on a continual basis to assess the semiconductor industry’s future UPW technology requirements. In addition to IRDS input, the Liquid Chemicals Global Technical Committee contributed its knowledge of the feasibility and cost viability of the technical solutions necessary to support UPW quality values specified in this Guide.\u003cbr\u003e2.4  The information in this Guide has been developed from the following sources:\u003cbr\u003e• IRDS risk assessment with input from facility- and manufacturing-experts and technology providers in the semiconductor manufacturing industry.\u003cbr\u003e• The results of UPW testing at semiconductor manufacturing sites as measured by independent laboratories that test high purity water for the semiconductor industry.\u003cbr\u003e• Specifications from water-system equipment manufacturers.\u003cbr\u003e• Input from UPW producers and users at SEMI Standards Liquid Chemical Global Technical Committee meetings, and also through the balloting process.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003cbr\u003eSEMI C1 — Guide for the Analysis of Liquid Chemicals\u003cbr\u003eSEMI C10 — Guide for Determination of Method Detection Limits\u003cbr\u003eSEMI C79 — Guide to Evaluate the Efficacy of Sub-15 nm Filters Used in Ultrapure Water (UPW) Distribution Systems\u003cbr\u003eSEMI C82 — Test Method for Particle Removal Performance of Liquid Filter Rated 20 to 50 nm With Liquid-Borne Particle Counter\u003cbr\u003eSEMI C89 — Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS)\u003cbr\u003eSEMI C93 — Guide for Determining the Quality of Ion Exchange Resin Used in Polish Applications of Ultrapure Water System\u003cbr\u003eSEMI F57 — Specification for High Purity Polymer Materials and Components Used in Ultrapure Water and Liquid Chemical Distribution Systems\u003cbr\u003eSEMI F61 — Guide for Design and Operation of a Semiconductor Ultrapure Water System\u003cbr\u003eSEMI F75 — Guide for Quality Monitoring of Ultrapure Water Used in Semiconductor Manufacturing\u003cbr\u003eSEMI F104 — Test Method for Evaluation of Particle Contribution of Components Used in Ultrapure Water and Liquid Chemical Distribution Systems\u003cbr\u003eSEMI F121 — Guide for Evaluating Metrology for Particle Precursors in Ultrapure Water\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003cbr\u003eSEMI F63-1224 (technical revision)\u003cbr\u003eSEMI F63-0521 (technical revision)\u003cbr\u003eSEMI F63-0918 (technical revision)\u003cbr\u003eSEMI F63-1016 (technical revision)\u003cbr\u003eSEMI F63-0213 (technical revision)\u003cbr\u003eSEMI F63-0211 (technical revision)\u003cbr\u003eSEMI F63-0309 (technical revision)\u003cbr\u003eSEMI F63-0701 (first published)\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI F63-1224 - Current","offer_id":43106895298627,"sku":"18169","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F63-0521 - Superseded","offer_id":43106895331395,"sku":"14532","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F63-0918 - Superseded","offer_id":40234301751363,"sku":"4099","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F63-1016 - Superseded","offer_id":40234301784131,"sku":"10964","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F63-0213 - Superseded","offer_id":40234301816899,"sku":"10917","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F63-0211 - Superseded","offer_id":40234301849667,"sku":"10864","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F63-0309 - Superseded","offer_id":40234301882435,"sku":"10849","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F63-0701 - Superseded","offer_id":40234301915203,"sku":"10812","price":380.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/F63_UltrapureWaterGuide_800x800_2x_1cc77cda-6857-4ec4-a77b-f410a835ccb8.png?v=1776702706"},{"product_id":"f08100-semi-f81-specification-for-visual-inspection-and-acceptance-of-gas-tungsten-arc-gta-welds-in-fluid-distribution-systems-in-semiconductor-manufacturing-applications","title":"F08100 - SEMI F81 - Specification for Visual Inspection and Acceptance of Gas Tungsten Arc (GTA) Welds in Fluid Distribution Systems in Semiconductor Manufacturing Applications","description":"\u003cp\u003e \u003c\/p\u003e\u003cp\u003e1  Purpose\u003cbr\u003e1.1  The purpose of this Specification is to provide visual inspection and acceptance criteria for gas tungsten arc (GTA) welds of stainless steel and other corrosion resistant metals and alloys (CRAs) in fluid (liquid or gas) distribution systems in semiconductor manufacturing applications. These criteria are meant to ensure that welds are of sufficient quality to provide the required system purity, weld integrity, and weld strength for use in semiconductor manufacturing applications.\u003cbr\u003e \u003c\/p\u003e\u003cp\u003e2  Scope\u003cbr\u003e2.1  This Specification defines inspection and acceptance criteria for GTA autogenous butt joint welds of stainless steel and other CRAs in fluid distribution systems. The fluid distribution system includes tubing, pipe, fittings, valves, subassemblies, and components that contain and distribute fluid.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003cbr\u003eSEMI F78 — Practice for Gas Tungsten Arc (GTA) Welding of Fluid Distribution Systems in Semiconductor Manufacturing Applications\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003cbr\u003eSEMI F81-0624 (technical revision)\u003cbr\u003eSEMI F81-0611 (Reapproved 0917)\u003cbr\u003eSEMI F81-0611 (technical revision)\u003cbr\u003eSEMI F81-1103 (first published)\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI F81-0624 - Current","offer_id":43106895790147,"sku":"17822","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F81-0611 (Reapproved 0917) - Superseded","offer_id":43106895822915,"sku":"4082","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F81-0611 - Superseded","offer_id":40234303127619,"sku":"10869","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI F81-1103 - Superseded","offer_id":40234303160387,"sku":"10832","price":380.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/F81_SpecforGTAWelds_800x800_2x_b1187792-72b0-47bc-b163-ae4be2f446fe.png?v=1776702719"},{"product_id":"m00100-semi-m1-specification-for-polished-single-crystal-silicon-wafers","title":"M00100 - SEMI M1 - Specification for Polished Single Crystal Silicon Wafers","description":"\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp\u003e1  Purpose\u003cbr\u003e1.1  Single crystal silicon wafers are utilized for essentially all integrated circuits and many other semiconductor devices. To permit common processing equipment to be used in multiple device fabrication lines, it is essential for the wafer dimensions to be standardized.\u003cbr\u003e1.2  In addition, as technology advances to smaller and smaller dimensions for the elements of high-density integrated circuits, it has become of interest to standardize additional properties of the wafers.\u003cbr\u003e1.3  This Specification provides the essential dimensional and certain other common characteristics of silicon wafers, including polished wafers as well as substrates for epitaxial and certain other kinds of silicon wafers.\u003cbr\u003e2  Scope\u003cbr\u003e2.1  This Specification covers ordering information and certain requirements for high-purity (electronic grade), single crystal polished silicon wafers used in semiconductor device and integrated circuit manufacturing. Such wafers are usually sliced from cylindrical single-crystal ingots that have been ground to a uniform diameter prior to slicing. This Specification also covers ordering information and certain requirements for electronic grade silicon wafers intended for use as substrates (or starting wafers) for other kinds of wafers, including epitaxial, annealed, and SOI wafers.\u003cbr\u003e2.2  Standardized dimensional requirements are provided for a large number of categories of standardized polished wafers as listed in the tables in § 6.\u003cbr\u003e2.3  Values given for thickness, total thickness variation (TTV), bow, and warp apply only to wafers prior to application of back surface films, extrinsic gettering treatments, or other thermal treatments.\u003cbr\u003e2.4  This Specification applies specifically to prime silicon wafers with at least one chem-mechanically polished surface. Ground, lapped, and unpolished wafers are not covered but this Specification may provide guidance in connection with their procurement.\u003cbr\u003e2.5  This Specification also provides guides for the specification of 300 and 450 mm diameter prime silicon wafers for the 32, 22, and 16 nm technology generations. These are included in Related Information 1.\u003cbr\u003e2.6  This Specification does not cover requirements for the following related types of silicon materials and wafers:\u003cbr\u003e• Polycrystalline silicon (refer to SEMI M16 or JEITA EM-3601A),\u003cbr\u003e• Epitaxial wafers (refer to SEMI M62),\u003cbr\u003e• Epitaxial wafers with buried layer (refer to SEMI M61),\u003cbr\u003e• Test wafers (refer to SEMI M8),\u003cbr\u003e• Premium wafers (refer to SEMI M24),\u003cbr\u003e• Reclaimed wafers (refer to SEMI M38),\u003cbr\u003e• Annealed wafers (refer to SEMI M57),\u003cbr\u003e• SOI wafers (refer to SEMI M41, SEMI M71, or JEITA EM-3603B), and\u003cbr\u003e• Solar-grade silicon wafers (refer to SEMI PV22).\u003cbr\u003eThey do, however, provide the ordering information for test, premium, and reclaimed wafers, as well as the ordering information for the polished substrates and starting wafers used to prepare epitaxial, annealed, and SOI wafers.\u003cbr\u003e2.7  For reference purposes, U.S. customary units shall be used for wafers of 2 inch and 3 inch nominal diameters, and SI (system international, commonly called metric) units for 100 mm and larger diameter wafers.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003cbr\u003eSEMI M8 — Specification for Polished Monocrystalline Silicon Test Wafers\u003cbr\u003eSEMI M12 — Specification for Serial Alphanumeric Marking of the Front Surface of Wafers\u003cbr\u003eSEMI M13 — Specification for Alphanumeric Marking of Silicon Wafers\u003cbr\u003eSEMI M16 — Specification for Polycrystalline Silicon\u003cbr\u003eSEMI M18 — Guide for Developing Specification Forms for Order Entry of Silicon Wafers\u003cbr\u003eSEMI M20 — Practice for Establishing a Wafer Coordinate System\u003cbr\u003eSEMI M24 — Specification for Polished Monocrystalline Silicon Premium Wafers\u003cbr\u003eSEMI M26 — Guide for the Re-Use of 100, 125, 150, and 200 mm Wafer Shipping Boxes Used to Transport Wafers\u003cbr\u003eSEMI M35 — Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection\u003cbr\u003eSEMI M38 — Specification for Polished Reclaimed Silicon Wafers\u003cbr\u003eSEMI M40 — Guide for Measurement of Roughness of Planar Surfaces on Silicon Wafers\u003cbr\u003eSEMI M41 — Specification of Silicon-On-Insulator (SOI) for Power Device\/ICs\u003cbr\u003eSEMI M43 — Guide for Reporting Wafer Nanotopography\u003cbr\u003eSEMI M44 — Guide to Conversion Factors for Interstitial Oxygen in Silicon\u003cbr\u003eSEMI M45 — Specification for 300 mm Wafer Shipping System\u003cbr\u003eSEMI M49 — Guide for Specifying Geometry Measurement Systems for Silicon Wafers for the 130 nm to 16 nm Technology Generations\u003cbr\u003eSEMI M53 — Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodisperse Reference Spheres on Unpatterned Semiconductor Wafer Surfaces\u003cbr\u003eSEMI M57 — Guide for Specifying Silicon Annealed Wafers\u003cbr\u003eSEMI M58 — Test Method for Evaluating DMA-Based Particle Deposition Systems and Processes\u003cbr\u003eSEMI M59 — Terminology for Silicon Technology\u003cbr\u003eSEMI M61 — Specification for Silicon Epitaxial Wafers with Buried Layers\u003cbr\u003eSEMI M62 — Specification for Silicon Epitaxial Wafers\u003cbr\u003eSEMI M67 — Practice for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD and ESBIR Metrics\u003cbr\u003eSEMI M68 — Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD\u003cbr\u003eSEMI M70 — Test Method for Determining Wafer-Near-Edge Geometry Using Partial Wafer Site Flatness\u003cbr\u003eSEMI M71 — Specification for Silicon-On-Insulator (SOI) Wafers for CMOS LSI\u003cbr\u003eSEMI M73 — Test Methods for Extracting Relevant Characteristics from Measured Wafer Edge Profiles\u003cbr\u003eSEMI M77 — Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA\u003cbr\u003eSEMI M78 — Guide for Determining Nanotopography of Unpatterned Silicon Wafers for the 130 nm to 22 nm Generations in High Volume Manufacturing\u003cbr\u003eSEMI M85 — Guide for the Measurement of Trace Metal Contamination on Silicon Wafers Surface by Inductively Coupled Plasma Mass Spectrometry\u003cbr\u003eSEMI MF26 — Test Method for Determining the Orientation of a Semiconductive Single Crystal\u003cbr\u003eSEMI MF28 — Test Method for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductive Decay\u003cbr\u003eSEMI MF42 — Test Method for Conductivity Type of Extrinsic Semiconducting Materials\u003cbr\u003eSEMI MF81 — Test Method for Measuring Radial Resistivity Variation on Silicon Wafers\u003cbr\u003eSEMI MF84 — Test Method for Measuring Resistivity of Silicon Wafers with an In-Line Four-Point Probe\u003cbr\u003eSEMI MF391 — Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage\u003cbr\u003eSEMI MF523 — Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces\u003cbr\u003eSEMI MF525 — Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe\u003cbr\u003eSEMI MF533 — Test Method for Thickness and Thickness of Variation of Silicon Wafers\u003cbr\u003eSEMI MF671 — Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials\u003cbr\u003eSEMI MF673 — Test Method for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage\u003cbr\u003eSEMI MF847 — Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques\u003cbr\u003eSEMI MF928 — Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates\u003cbr\u003eSEMI MF951 — Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers\u003cbr\u003eSEMI MF978 — Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques\u003cbr\u003eSEMI MF1048 — Test Method for Measuring Reflective Total Integrated Scatter\u003cbr\u003eSEMI MF1049 — Practice for Shallow Etch Pit Detection on Silicon Wafers\u003cbr\u003eSEMI MF1152 — Test Method for Dimensions of Notches on Silicon Wafers\u003cbr\u003eSEMI MF1188 — Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption with Short Baseline\u003cbr\u003eSEMI MF1239 — Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction\u003cbr\u003eSEMI MF1366 — Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry\u003cbr\u003eSEMI MF1388 — Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors\u003cbr\u003eSEMI MF1390 — Test Method for Measuring Bow and Warp on Silicon Wafers by Automated Noncontact Scanning\u003cbr\u003eSEMI MF1391 — Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption\u003cbr\u003eSEMI MF1451 — Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning\u003cbr\u003eSEMI MF1528 — Test Method for Measuring Boron Contamination in Heavily Doped n-Type Silicon Substrates by Secondary Ion Mass Spectrometry\u003cbr\u003eSEMI MF1530 — Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning\u003cbr\u003eSEMI MF1535 — Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance\u003cbr\u003eSEMI MF1617 — Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and Epi Substrates by Secondary Ion Mass Spectrometry\u003cbr\u003eSEMI MF1619 — Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle\u003cbr\u003eSEMI MF1726 — Practice for Analysis of Crystallographic Perfection of Silicon Wafers\u003cbr\u003eSEMI MF1727 — Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers\u003cbr\u003eSEMI MF1809 — Guide for Selection and Use for Etching Solutions to Delineate Structural Defects in Silicon\u003cbr\u003eSEMI MF1982 — Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography\u003cbr\u003eSEMI MF2074 — Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers\u003cbr\u003eSEMI PV13 — Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor\u003cbr\u003eSEMI PV22 — Specification for Silicon Wafers for Use in Photovoltaic Solar Cells\u003cbr\u003eSEMI T3 — Specification for Wafer Box Labels\u003cbr\u003eSEMI T7 — Specification for Back Surface Marking of Double-sided Polished Wafers with a Two-Dimensional Matrix Code Symbol\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003cbr\u003eSEMI M1-0924 (technical revision)\u003cbr\u003eSEMI M1-0918 (technical revision)\u003cbr\u003eSEMI M1-1117 (technical revision)\u003cbr\u003eSEMI M1-1016 (technical revision)\u003cbr\u003eSEMI M1-0416 (technical revision)\u003cbr\u003eSEMI M1-0915 (technical revision)\u003cbr\u003eSEMI M1-0215 (technical revision)\u003cbr\u003eSEMI M1-1014 (technical revision)\u003cbr\u003eSEMI M1-0414 (technical revision)\u003cbr\u003eSEMI M1-0114 (technical revision)\u003cbr\u003eSEMI M1-1013 (technical revision)\u003cbr\u003eSEMI M1-0413 (technical 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revision)\u003cbr\u003eSEMI M1-0699 (technical revision)\u003cbr\u003eSEMI M1-0298 (technical revision)\u003cbr\u003eSEMI M1-0997 (technical revision)\u003cbr\u003eSEMI M1-1296 (technical revision)\u003cbr\u003eSEMI M1-96 (technical revision)\u003cbr\u003eSEMI M1-95 (technical revision)\u003cbr\u003eSEMI M1-94 (technical revision)\u003cbr\u003eSEMI M1-93 (technical revision)\u003cbr\u003eSEMI M1-92 (technical revision)\u003cbr\u003eSEMI M1-89 (technical revision)\u003cbr\u003eSEMI M1-85 (technical revision)\u003cbr\u003eSEMI M1-78 (first published)\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI M1-0924 - Current","offer_id":43106893594691,"sku":"18001","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI M1-0918 - Superseded","offer_id":43106893627459,"sku":"4833","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI M1-1117 - Superseded","offer_id":40234311057475,"sku":"9477","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI 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Superseded","offer_id":40234312433731,"sku":"9479","price":380.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/MVolume_396c7780-572a-4e79-be66-36dc8d0aa433.png?v=1776702634"},{"product_id":"s00600-semi-s6-environmental-health-and-safety-guideline-for-exhaust-ventilation-of-semiconductor-manufacturing-equipment","title":"S00600 - SEMI S6 - Environmental, Health, and Safety Guideline for Exhaust Ventilation of Semiconductor Manufacturing Equipment","description":"\u003cp dir=\"ltr\" align=\"justify\"\u003eThis Standard was technically approved by the Environmental, Health \u0026amp; Safety Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on December 13, 2017 and February 1, 2018. Available at www.semiviews.org and www.semi.org in June 2018; originally published in 1993; previously published June 2009.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"left\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eNOTICE: Conformance to the ‘should’ provisions of this Safety Guideline is necessary to declare conformance to this Document. Conformance to ‘may’, ‘suggested’, ‘preferred’, ‘recommended’, ‘NOTE’, or ‘Related Information’ provisions is not necessary to declare conformance.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThis Safety Guideline provides safety performance criteria for exhaust ventilation of semiconductor manufacturing equipment (SME) and test methods for assessing conformance to those criteria.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThe optimization of exhaust ventilation is becoming more important as energy efficiency and the physical constraints of exhaust ventilation utilities in user facilities become more pronounced. Efficiently designed exhaust ventilation should be provided to protect personnel, property, and the environment from health and safety risks. The purpose of this Safety Guideline is to provide performance and design principles and test methods and criteria for exhaust ventilation.\u003c\/p\u003e\u003cfont size=\"2\" face=\"Arial\"\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThis Safety Guideline applies to semiconductor manufacturing equipment that incorporates exhaust ventilation intended to be connected to user facilities’ exhaust ventilation system(s).\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThe criteria of this Document should be applied to exhaust ventilation systems provided for the purposes (in whole or in part) of personnel protection, equipment protection, and fire risk reduction.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThe performance and assessment criteria in this Document apply to all of the equipment provided by a supplier to a user or to another supplier to be provided as part of equipment the latter supplier provides to a user.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThis Document is intended to help the semiconductor equipment supplier design equipment exhaust ventilation systems to a common set of performance criteria as well as to provide assistance to both users and suppliers in the understanding of exhaust ventilation requirements for equipment systems. It is not intended to establish design specifications.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003c\/p\u003e\n\u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e\n\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003eSEMI F5 — Guide for Gaseous Effluent Handling\u003cbr\u003e SEMI S2 — Environmental, Health, and Safety Guideline for Semiconductor Manufacturing Equipment\u003cbr\u003e SEMI S14 — Safety Guidelines for Fire Risk Assessment and Mitigation of Semiconductor Manufacturing Equipment\u003cbr\u003e SEMI S22 — Safety Guideline for the Electrical Design of Semiconductor Manufacturing Equipment\u003cbr\u003e\u003c\/p\u003e\u003c\/font\u003e","brand":"semi.org","offers":[{"title":"SEMI S6-0618 - Current","offer_id":40234316267587,"sku":"5561","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S6-0707E - Superseded","offer_id":40234316300355,"sku":"6675","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S6-0707 - Superseded","offer_id":40234316333123,"sku":"6674","price":380.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S6-93 - Superseded","offer_id":40234316365891,"sku":"6676","price":380.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/S6_EHSGuidelineforExhaustVentilation_800x800_2x_44d84b2d-2591-4a94-af18-da7a9055b237.png?v=1776702362"},{"product_id":"p03800-semi-p39-specification-for-oasis®-open-artwork-system-interchange-standard","title":"P03800 - SEMI P39 - Specification for OASIS® – Open Artwork System Interchange Standard","description":"\u003cp dir=\"ltr\" align=\"justify\"\u003eThis Standard was technically approved by the Micropatterning Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on February 1, 2016. Available at www.semiviews.org and www.semi.org in April 2016; originally published March 2004; previously published March 2008.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThe purpose of this Specification is to define an interchange and encapsulation format for hierarchical integrated circuit mask layout information.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e\u003ci\u003e \u003c\/i\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003eBackground — In the fall of 2001, SEMI’s Data Path Task Force formed a working group to define a successor to the venerable GDSII Stream format, which had served the I.C. industry as a \u003ci\u003ede facto\u003c\/i\u003e standard for layout interchange for more than two decades. The old format, limited by 16-bit and 32-bit internal integer fields, by its inefficient representation of cell-native geometric figures, and by high structural overhead, was becoming difficult to use for leading-edge designs, and file sizes were becoming unwieldy, in some cases growing to many tens of gigabytes. The successor format was chartered with several overall goals:\u003c\/p\u003e \u003cul\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e\n\u003cli\u003eAchieve at least an order-of-magnitude file size improvement compared to GDSII Stream.\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e\n\u003cli\u003eRemove all 16-bit and 32-bit integer width restrictions—make the new format fully 64-bit capable.\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e\n\u003cli\u003eEfficiently represent cells with large payloads of flat native geometric figures.\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e\n\u003cli\u003eProvide a richer information palette to facilitate interchange of layout-related information between design and manufacturing.\u003c\/li\u003e \u003cp\u003e\u003c\/p\u003e\n\u003c\/ul\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eIn the months leading up to the formation of the SEMI Data Path Task Force, International SEMATECH sponsored a series of meetings focusing on Mask EDA issues. Many of the Task Force participants were also involved in these SEMATECH meetings, and carried forward much useful information from those sessions into the definition of this Specification.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThis format is designed primarily to encapsulate hierarchical mask layout for interchange between systems such as EDA software, mask writing tools, and mask inspection\/repair tools.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThis format is designed to be both hardware- and software-independent.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"left\"\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003e\u003cfont\u003eNone.\u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI P39-0416 - Current","offer_id":40234320396355,"sku":"5236","price":335.0,"currency_code":"USD","in_stock":true},{"title":"SEMI P39-0308 - Superseded","offer_id":40234320461891,"sku":"12982","price":170.0,"currency_code":"USD","in_stock":true},{"title":"SEMI P39-1105 - Superseded","offer_id":40234320494659,"sku":"12983","price":170.0,"currency_code":"USD","in_stock":true},{"title":"SEMI P39-0304E2 - Superseded","offer_id":40234320527427,"sku":"12980","price":170.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/products\/P39_SpecforOpenArtworkSystems_800x800_2x_9ab814d0-d480-4662-8719-eb6385a35879.png?v=1674569237"},{"product_id":"s00100-semi-s1-safety-guideline-for-equipment-safety-labels","title":"S00100 - SEMI S1 - Safety Guideline for Equipment Safety Labels","description":"\u003cp\u003e \u003c\/p\u003e\u003cp\u003e1  Purpose\u003cbr\u003e1.1  This Safety Guideline provides guidance for the content, format, and placement of equipment safety labels and gives symbols to use for several dozen hazards, prohibitions, and mandatory actions.\u003cbr\u003e1.2  This Safety Guideline is intended for use by equipment manufacturers to create safety labels that alert people to hazards (to people, property, and the environment) associated with the equipment.\u003cbr\u003e1.3  This Safety Guideline is intended to provide a unified, international, semiconductor-industry-specific safety labeling format.\u003cbr\u003e2  Scope\u003cbr\u003e2.1  This Safety Guideline is intended for use in developing safety labels for manufacturing equipment used in the semiconductor industry.\u003cbr\u003e2.2  This Safety Guideline may also be used for the design of safety signs for the facilities where semiconductor manufacturing equipment is installed.\u003cbr\u003e2.3  The guidance provided in this Safety Guideline may also be used to help communicate safety information in installation instructions, operation and maintenance manuals, and similar written communication relating to equipment.\u003cbr\u003eNOTE 1: ANSI Z535.6 provides information on such uses.\u003cbr\u003e2.4  This Safety Guideline may also be used for the design of computerized user interfaces on equipment.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards (purchase separately)\u003c\/strong\u003e\u003cbr\u003eSEMI S10 — Safety Guideline for Risk Assessment and Risk Evaluation Process\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003cbr\u003eSEMI S1-0824 (delayed revision implementation)\u003cbr\u003eSEMI S1-0923a (delayed revision)\u003cbr\u003eSEMI S1-0923 (complete rewrite)\u003cbr\u003eSEMI S1-1015 (technical revision)\u003cbr\u003eSEMI S1-0708E (publication correction)\u003cbr\u003eSEMI S1-0708 (technical revision) - pulled from publication\u003cbr\u003eSEMI S1-0308E (publication correction)\u003cbr\u003eSEMI S1-0308 (technical revision) - pulled from publication\u003cbr\u003eSEMI S1-1107E (publication correction)\u003cbr\u003eSEMI S1-1107 (technical revision) - pulled from publication\u003cbr\u003eSEMI S1-0701E (editorial revision)\u003cbr\u003eSEMI S1-0701 (technical revision)\u003cbr\u003eSEMI S1-90 (technical revision)\u003cbr\u003eSEMI S1-86 (first published)\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI S1-0824 - Current","offer_id":43106885206083,"sku":"17947","price":193.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S1-0923a - Superseded","offer_id":43106885238851,"sku":"17373","price":193.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S1-0923 - Superseded","offer_id":43106885271619,"sku":"17128","price":193.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S1-1015 - Superseded","offer_id":43106885304387,"sku":"5536","price":193.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S1-0308E - Superseded","offer_id":40234332913731,"sku":"6443","price":193.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S1-1107E - Superseded","offer_id":40234332979267,"sku":"6546","price":193.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S1-0708E - Superseded","offer_id":40234333077571,"sku":"6544","price":193.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S1-0701E - Superseded","offer_id":40234333241411,"sku":"6543","price":193.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S1-90 - Superseded","offer_id":40234333470787,"sku":"6548","price":193.0,"currency_code":"USD","in_stock":true},{"title":"SEMI S1-86 - Superseded","offer_id":40234333667395,"sku":"6547","price":193.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/S1_SafetyGuidelineforEquipmentSafetyLabels_800x800_2x_d4adc806-84a9-45f1-b0e5-6b4a61fae054.png?v=1776702395"},{"product_id":"global-mems-sensors-report","title":"MEMS \u0026 Sensors Fab Report","description":"\u003cp style=\"color: rgb(32, 31, 30); background-color: rgb(255, 255, 255); font-size: 11pt; font-family: Calibri, sans-serif; margin: 0px;\"\u003e\u003cspan style=\"margin: 0px; padding: 0px; border: 0px; font-style: inherit; font-variant: inherit; font-weight: inherit; font-stretch: inherit; font-size: 12pt; line-height: inherit; font-family: inherit; vertical-align: baseline; color: inherit;\"\u003eThis report lists \u003c\/span\u003e\u003cspan style=\"margin: 0px; padding: 0px; border: 0px; font-style: inherit; font-variant: inherit; font-stretch: inherit; font-size: 12pt; line-height: inherit; font-family: inherit; vertical-align: baseline; color: inherit;\"\u003e\u003cb\u003e239 companies\u003c\/b\u003e\u003c\/span\u003e\u003cspan style=\"margin: 0px; padding: 0px; border: 0px; font-style: inherit; font-variant: inherit; font-weight: inherit; font-stretch: inherit; font-size: 12pt; line-height: inherit; font-family: inherit; vertical-align: baseline; color: inherit;\"\u003e with 428 facilities\/lines including 353 volume fabs, 75 R\u0026amp;D facilities \u0026amp; Pilot lines, and 34 EPI facilities\/lines.\u003c\/span\u003e\u003c\/p\u003e\u003cp style=\"color: rgb(32, 31, 30); background-color: rgb(255, 255, 255); font-size: 11pt; font-family: Calibri, sans-serif; margin: 0px;\"\u003e\u003cspan style=\"margin: 0px; padding: 0px; border: 0px; font-style: inherit; font-variant: inherit; font-weight: inherit; font-stretch: inherit; font-size: 12pt; line-height: inherit; font-family: inherit; vertical-align: baseline; color: inherit;\"\u003eAdditionally, this report provides insight into front-end MEMS \u0026amp; Sensors capacity over a period of 12 years (2013 - 2024), with information on investment and capacity by region and by company.\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"Default Title","offer_id":40234349887555,"sku":"7172","price":6200.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/Fab_MEMS_SensorsReport_170x170text_2x_1_2acea67b-2ecf-4a4d-a9c9-195b12b8585c.png?v=1776702161"},{"product_id":"f02000-semi-f20-高純度および超高純度の半導体製造アプリケーションで使用される汎用コンポーネント用の316lステンレス鋼の棒鋼-鍛造品-押出成形品-鋼板-鋼管の仕様","title":"F02000 - SEMI F20 - 高純度および超高純度の半導体製造アプリケーションで使用される汎用コンポーネント用の316Lステンレス鋼の棒鋼，鍛造品，押出成形品，鋼板，鋼管の仕様","description":"\u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont size=\"2\" face=\"Microsoft Sans Serif\"\u003eNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version.\u003c\/font\u003e\u003c\/p\u003e\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont size=\"2\" face=\"Microsoft Sans Serif\"\u003e免責事項：\u003cfont size=\"2\"\u003e\u003cfont face=\"Microsoft Sans Serif\"\u003e\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e　このSEMI\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eスタンダードは，投票により作成された英語版が正式なものであり，日本語版は日本の利用者各位の便宜のために作成したものです。万が一英語と日本語とに差異がある場合には英語版記載内容が優先されます｡\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont face=\"Microsoft Sans Serif\"\u003e\u003cfont size=\"2\"\u003eSEMI\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e\u003cfont size=\"2\"\u003eスタンダード日本語翻訳版をご利用にあたっての注釈を本文の末尾に記載しております（「すべきである」「しなければならない」について等）。\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont size=\"2\"\u003e\u003c\/font\u003e\u003c\/p\u003e \u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont size=\"2\" face=\"Microsoft Sans Serif\"\u003e \u003c\/font\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont size=\"2\" face=\"Microsoft Sans Serif\"\u003e本スタンダードは，\u003cfont size=\"2\"\u003e\u003cfont face=\"Microsoft Sans Serif\"\u003eglobal Gases Committee\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eで技術的に承認されている。現版は2011\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e年5\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e月13\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e日，global Audits and Reviews Subcommittee\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eにて発行が承認された。2011\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e年6\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e月にwww.semiviews.org\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eおよび www.semi.org\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eで入手可能となる。初版は1995\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e年発行。前版は2006\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e年7\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e月発行。\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont size=\"2\" face=\"Microsoft Sans Serif\"\u003e　\u003cfont size=\"2\" face=\"Microsoft Sans Serif\"\u003e　\u003c\/font\u003e\u003c\/font\u003e\u003c\/p\u003e\n\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont size=\"2\" face=\"Microsoft Sans Serif\"\u003e本仕様の目的は，汎用や高純度，超高純度の化学物質（気体または液体）分配システム用コンポーネントを製造するために用いられる\u003cfont size=\"2\"\u003e\u003cfont face=\"Microsoft Sans Serif\"\u003e316L\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eステンレス鋼に必要な冶金学的清浄度に関する要求条件および材料組成を定義することである。\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/p\u003e\n\u003cfont size=\"2\" face=\"Microsoft Sans Serif\"\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\n\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont size=\"2\" face=\"Microsoft Sans Serif\"\u003e本仕様は，半導体製造設備で使用される汎用および高純度の化学物質（気体または液体）分配システムコンポーネントを製造するために用いられる\u003cfont size=\"2\"\u003e\u003cfont face=\"Microsoft Sans Serif\"\u003e316L\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eステンレス鋼に対する要求条件を，定義する。316L\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003e鋼は，棒鋼や鍛造品，押出成形品についてはASTM A276\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eに定義され，鋼板についてはASTM A240\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eに定義され，鋼管についてはASTM A269\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eおよびA632\u003cfont lang=\"JA\"\u003e\u003cfont lang=\"JA\"\u003eに定義されるものである。\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/p\u003e\n\u003cfont face=\"Arial\"\u003e\u003cfont size=\"2\" face=\"Arial\"\u003e \u003cp dir=\"ltr\" align=\"left\"\u003e\u003c\/p\u003e\n\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\n\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003e\u003cfont\u003eNone.\u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/font\u003e","brand":"semi.org","offers":[{"title":"SEMI F20-0706E 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