Popular Standards – Page 41

1638 products

G04200 - SEMI G42 - Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages

SEMI G42 - Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages

Member Price: €113,00
Non-Member Price: €171,95

F02400 - SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases

SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases

Member Price: €113,00
Non-Member Price: €171,95

MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials

SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials

Member Price: €113,00
Non-Member Price: €171,95

MF004300 - SEMI MF43 - Test Method for Resistivity of Semiconductor Materials

SEMI MF43 - Test Method for Resistivity of Semiconductor Materials

Member Price: €113,00
Non-Member Price: €171,95

MF084700 - SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques

SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques

Member Price: €113,00
Non-Member Price: €171,95

MF161900 - SEMI MF1619 - Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle

SEMI MF1619 - Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle

Member Price: €113,00
Non-Member Price: €171,95

F10100 - SEMI F101 - Test Method for Determining Pressure Regulator Performance in Gas Distribution Systems

SEMI F101 - Test Method for Determining Pressure Regulator Performance in Gas Distribution Systems

Member Price: €113,00
Non-Member Price: €171,95

F07500 - SEMI F75 - Guide for Quality Monitoring of Ultrapure Water Used in Semiconductor Manufacturing

SEMI F75 - Guide for Quality Monitoring of Ultrapure Water Used in Semiconductor Manufacturing

Member Price: €113,00
Non-Member Price: €171,95

HB00900 - SEMI HB9 - Test Method and Acceptance Criteria for Visual Inspection of Surface Defects of GaN Epitaxial Wafers Used for Manufacturing HB-LED

SEMI HB9 - Test Method and Acceptance Criteria for Visual Inspection of Surface Defects of GaN Epitaxial Wafers Used for Manufacturing HB-LED

Member Price: €113,00
Non-Member Price: €171,95

M08000 - SEMI M80 - Specification for Front-Opening Shipping Box Used to Transport and Ship 450 mm Wafers

SEMI M80 - Specification for Front-Opening Shipping Box Used to Transport and Ship 450 mm Wafers

Member Price: €113,00
Non-Member Price: €171,95

G04300 - SEMI G43 - プラスチックモールドパッケージのジャンクション部とケース間の熱抵抗のための試験方法

SEMI G43 - プラスチックモールドパッケージのジャンクション部とケース間の熱抵抗のための試験方法

Member Price: €135,00
Non-Member Price: €205,95

F08100 - SEMI F81 - Specification for Visual Inspection and Acceptance of Gas Tungsten Arc (GTA) Welds in Fluid Distribution Systems in Semiconductor Manufacturing Applications

SEMI F81 - Specification for Visual Inspection and Acceptance of Gas Tungsten Arc (GTA) Welds in Fluid Distribution Systems in Semiconductor Manufacturing Applications

Member Price: €225,00
Non-Member Price: €337,95

MF123900 - SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction

SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction

Member Price: €113,00
Non-Member Price: €171,95

MF052300 - SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces

SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces

Member Price: €113,00
Non-Member Price: €171,95

M07700 - SEMI M77 - Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA

SEMI M77 - Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA

Member Price: €113,00
Non-Member Price: €171,95

MF002600 - SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal

SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal

Member Price: €113,00
Non-Member Price: €171,95

M08600 - SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers

SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers

Member Price: €113,00
Non-Member Price: €171,95

F04000 - SEMI F40 - Practice for Preparing Liquid Chemical Distribution Components and Neat Polymers for Chemical Testing

SEMI F40 - Practice for Preparing Liquid Chemical Distribution Components and Neat Polymers for Chemical Testing

Member Price: €113,00
Non-Member Price: €171,95

M05900 - SEMI M59 - シリコン技術の用語集

SEMI M59 - シリコン技術の用語集

Member Price: €135,00
Non-Member Price: €205,95

F06400 - SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers

SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers

Member Price: €113,00
Non-Member Price: €171,95

$MF057600 - SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry$

SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry

Member Price: €113,00
Non-Member Price: €171,95

G02800 - SEMI G28 - プラスチックモールドS.O.パッケージのリードフレームのための仕様

SEMI G28 - プラスチックモールドS.O.パッケージのリードフレームのための仕様

Member Price: €135,00
Non-Member Price: €205,95

M06600 - SEMI M66 - MISフラットバンド電圧―絶縁膜厚法を使った，酸化膜，およびhigh-κゲートスタックの有効仕事関数の算出方法

SEMI M66 - MISフラットバンド電圧―絶縁膜厚法を使った，酸化膜，およびhigh-κゲートスタックの有効仕事関数の算出方法

Member Price: €135,00
Non-Member Price: €205,95

F06300 - SEMI F63 - Guide for Ultrapure Water Used in Semiconductor Processing

SEMI F63 - Guide for Ultrapure Water Used in Semiconductor Processing

Member Price: €252,00
Non-Member Price: €337,95

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