SEMI 3D8 - Guide for Describing Silicon Wafers for Use as 300 mm Carrier Wafers in a 3DS-IC Temporary Bond-Debond (TBDB) Process

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1910 products

MF161800 - SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers
SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
M04600 - SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling
SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling Sale priceMember Price: €113,00
Non-Member Price: €171,95
M02100 - SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array
SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array Sale priceMember Price: €113,00
Non-Member Price: €171,95
F02500 - SEMI F25 - Specification for Particle Concentration of Grade 10/0.2 Oxidant Specialty Gases
SEMI F25 - Specification for Particle Concentration of Grade 10/0.2 Oxidant Specialty Gases Sale priceMember Price: €113,00
Non-Member Price: €171,95
M06100 - SEMI M61 - Specification for Silicon Epitaxial Wafers with Buried Layers
SEMI M61 - Specification for Silicon Epitaxial Wafers with Buried Layers Sale priceMember Price: €113,00
Non-Member Price: €171,95
M07900 - SEMI M79 - Specification for Round 100 mm Polished Monocrystalline Germanium Wafers for Solar Cell Applications
SEMI M79 - Specification for Round 100 mm Polished Monocrystalline Germanium Wafers for Solar Cell Applications Sale priceMember Price: €113,00
Non-Member Price: €171,95
G06900 - SEMI G69 - Test Method for Measurement of Adhesive Strength Between Leadframes and Molding Compounds
SEMI G69 - Test Method for Measurement of Adhesive Strength Between Leadframes and Molding Compounds Sale priceMember Price: €113,00
Non-Member Price: €171,95
M02000 - SEMI M20 - Practice for Establishing a Wafer Coordinate System
SEMI M20 - Practice for Establishing a Wafer Coordinate System Sale priceMember Price: €113,00
Non-Member Price: €171,95
M02300 - SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers
SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
F09800 - SEMI F98 - Guide for Treatment of Reuse Water in Semiconductor Processing
SEMI F98 - Guide for Treatment of Reuse Water in Semiconductor Processing Sale priceFrom €171,95 EUR
F03700 - SEMI F37 - Test Method for Determination of Surface Roughness Parameters for Gas Distribution System Components
SEMI F37 - Test Method for Determination of Surface Roughness Parameters for Gas Distribution System Components Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF067400 - SEMI MF674 - Practice for Preparing Silicon for Spreading Resistance Measurements
SEMI MF674 - Practice for Preparing Silicon for Spreading Resistance Measurements Sale priceMember Price: €113,00
Non-Member Price: €171,95
MF092800 - SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates Sale priceMember Price: €113,00
Non-Member Price: €171,95
HB01000 - SEMI HB10 - Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers
SEMI HB10 - Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95
G07400 - SEMI G74 - Specification for Tape Frame for 300 mm Wafers
SEMI G74 - Specification for Tape Frame for 300 mm Wafers Sale priceMember Price: €113,00
Non-Member Price: €171,95