SEMI Standards

SEMI Standards are voluntary technical agreements for the semiconductor, flat panel display, micro-electromechanical systems, photovoltaic, and high-brightness LED industries.

1581 products

D01500 - SEMI D15 - FPDガラス基板の表面うねりの測定方法
SEMI D15 - FPDガラス基板の表面うねりの測定方法 Sale priceMember Price: ₩135
Non-Member Price: ₩286,000
C03200 - SEMI C32 - Specification for Methyl Ethyl Ketone
SEMI C32 - Specification for Methyl Ethyl Ketone Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
D04100 - SEMI D41 - 在平面顯示器影像品質檢測時，SEMI MURA的量測方法
SEMI D41 - 在平面顯示器影像品質檢測時，SEMI MURA的量測方法 Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
D01100 - SEMI D11 - FPD用ガラス基板の耐薬品性テスト方法
SEMI D11 - FPD用ガラス基板の耐薬品性テスト方法 Sale priceMember Price: ₩135
Non-Member Price: ₩286,000
D01100 - SEMI D11 - Specification for Flat Panel Display Glass Substrate Cassettes
SEMI D11 - Specification for Flat Panel Display Glass Substrate Cassettes Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
D02500 - SEMI D25 - Specification for Flat Panel Display Substrate Shipping Case
SEMI D25 - Specification for Flat Panel Display Substrate Shipping Case Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
D03500 - SEMI D35 - Test Method for Measurement of Cold Cathode Fluorescent Lamp (CCFL) Characteristics
SEMI D35 - Test Method for Measurement of Cold Cathode Fluorescent Lamp (CCFL) Characteristics Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
D03300 - SEMI D33 - Measuring Method of Optical Characteristics for Backlight Unit
SEMI D33 - Measuring Method of Optical Characteristics for Backlight Unit Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
C05300 - SEMI C53 - Specifications for Dimethyl Sulfoxide (DMSO) [Grades 1 and 2]
SEMI C53 - Specifications for Dimethyl Sulfoxide (DMSO) [Grades 1 and 2] Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
D02700 - SEMI D27 - Guide for Flat Panel Display Equipment Communication Interfaces
SEMI D27 - Guide for Flat Panel Display Equipment Communication Interfaces Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
D00300 - SEMI D3 - Quality Area Specification for Flat Panel Display Substrates
SEMI D3 - Quality Area Specification for Flat Panel Display Substrates Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
D01600 - SEMI D16 - Specification for Mechanical Interface Between Flat Panel Display Material Handling System and Tool Port
SEMI D16 - Specification for Mechanical Interface Between Flat Panel Display Material Handling System and Tool Port Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
D03200 - SEMI D32 - FPDガラス基板のオリエンテーションコーナ統一にともなう情報管理改善の仕様
SEMI D32 - FPDガラス基板のオリエンテーションコーナ統一にともなう情報管理改善の仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩286,000
D01200 - SEMI D12 - Specification for Edge Condition of Flat Panel Display (FPD) Substrates
SEMI D12 - Specification for Edge Condition of Flat Panel Display (FPD) Substrates Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
C04600 - SEMI C46 - 25%テトラメチル水酸化アンモニウムのガイド
SEMI C46 - 25%テトラメチル水酸化アンモニウムのガイド Sale priceMember Price: ₩135
Non-Member Price: ₩286,000
C08300 - SEMI C83 - Test Method for Tensile Strength Applied to Welded Connections Made by PFA Weld Fitting
SEMI C83 - Test Method for Tensile Strength Applied to Welded Connections Made by PFA Weld Fitting Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
C04900 - SEMI C49 - トリメチルホウ酸のガイド
SEMI C49 - トリメチルホウ酸のガイド Sale priceMember Price: ₩135
Non-Member Price: ₩286,000
C04700 - SEMI C47 - Guide for Trans 1,2 Dichloroethylene
SEMI C47 - Guide for Trans 1,2 Dichloroethylene Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
C03200 - SEMI C32 - メチルエチルケトンの仕様
SEMI C32 - メチルエチルケトンの仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩286,000
C04200 - SEMI C42 - Specification for Sodium Hydroxide Pellets
SEMI C42 - Specification for Sodium Hydroxide Pellets Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
D05400 - SEMI D54 - FPD生産における基板管理(SMS-FPD)のための仕様
SEMI D54 - FPD生産における基板管理(SMS-FPD)のための仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩286,000
M08900 - SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method
SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
MS01200 - SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices
SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
F11700 - SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems
SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems Sale priceMember Price: ₩113
Non-Member Price: ₩239,000
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