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MF053300 - SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers
SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
MF145100 - SEMI MF1451 - Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning
SEMI MF1451 - Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M01000 - SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers
SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M05800 - SEMI M58 - Test Method for Evaluating DMA Based Particle Deposition Systems and Processes
SEMI M58 - Test Method for Evaluating DMA Based Particle Deposition Systems and Processes Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
G06000 - SEMI G60 - Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing Materials
SEMI G60 - Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing Materials Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M04100 - SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs
SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M06300 - SEMI M63 - Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction
SEMI M63 - Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
G06200 - SEMI G62 - Test Method for Silver Plating Quality
SEMI G62 - Test Method for Silver Plating Quality Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M07700 - SEMI M77 - ロールオフ量（ROA）を使ってウェーハのエッジ近傍形状を決定するための作業方法
SEMI M77 - ロールオフ量（ROA）を使ってウェーハのエッジ近傍形状を決定するための作業方法 Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
M02100 - SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array
SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
MF161800 - SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers
SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M04600 - SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling
SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
MF104900 - SEMI MF1049 - Practice for Shallow Etch Pit Detection on Silicon Wafers
SEMI MF1049 - Practice for Shallow Etch Pit Detection on Silicon Wafers Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M08100 - SEMI M81 - Guide to Defects Found in Monocrystalline Silicon Carbide Substrates
SEMI M81 - Guide to Defects Found in Monocrystalline Silicon Carbide Substrates Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
G00400 - SEMI G4 - Specification for Integrated Circuit Leadframe Materials Used in the Production of Stamped Leadframes
SEMI G4 - Specification for Integrated Circuit Leadframe Materials Used in the Production of Stamped Leadframes Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M07900 - SEMI M79 - Specification for Round 100 mm Polished Monocrystalline Germanium Wafers for Solar Cell Applications
SEMI M79 - Specification for Round 100 mm Polished Monocrystalline Germanium Wafers for Solar Cell Applications Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M06100 - SEMI M61 - Specification for Silicon Epitaxial Wafers with Buried Layers
SEMI M61 - Specification for Silicon Epitaxial Wafers with Buried Layers Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
F02500 - SEMI F25 - Specification for Particle Concentration of Grade 10/0.2 Oxidant Specialty Gases
SEMI F25 - Specification for Particle Concentration of Grade 10/0.2 Oxidant Specialty Gases Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
G01300 - SEMI G13 - モールディングコンパウンドの膨張特性の標準試験方法
SEMI G13 - モールディングコンパウンドの膨張特性の標準試験方法 Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
MF092800 - SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
F03700 - SEMI F37 - Test Method for Determination of Surface Roughness Parameters for Gas Distribution System Components
SEMI F37 - Test Method for Determination of Surface Roughness Parameters for Gas Distribution System Components Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M02000 - SEMI M20 - Practice for Establishing a Wafer Coordinate System
SEMI M20 - Practice for Establishing a Wafer Coordinate System Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
M02300 - SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers
SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
MF156900 - SEMI MF1569 - Guide for Generation of Consensus Reference Materials for Semiconductor Technology
SEMI MF1569 - Guide for Generation of Consensus Reference Materials for Semiconductor Technology Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
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