SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

C00354 - SEMI C3.54 - Gas Purity Guideline for Silane (SiH4)
SEMI C3.54 - Gas Purity Guideline for Silane (SiH4) Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E06900 - SEMI E69 - Test Method for Determining Reproducibility and Zero Drift for Thermal Mass Flow Controllers
C03700 - SEMI C37 - Specification for Phosphoric Etchants
SEMI C37 - Specification for Phosphoric Etchants Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
C00318 - SEMI C3.18 - Specification for Dichlorosilane (SiH2Cl2) in Cylinders, 97% Quality
SEMI C3.18 - Specification for Dichlorosilane (SiH2Cl2) in Cylinders, 97% Quality Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
D04500 - SEMI D45 - FPDカラーフィルタ用高抵抗樹脂ブラックマトリクスの抵抗値測定方法
C07200 - SEMI C72 - Guide for Propylene-Glycol-Mono-Methyl-Ether (PGME), Propylene-Glycol-Mono-Methyl-Ether-Acetate (PGMEA) and the Mixture 70wt% PGME/30wt% PGMEA
D03300 - SEMI D33 - バックライトユニットの光学特性の測定方法
SEMI D33 - バックライトユニットの光学特性の測定方法 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
C03100 - SEMI C31 - Specification for Methanol
SEMI C31 - Specification for Methanol Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
D00500 - SEMI D5 - FPD基板の標準サイズ
SEMI D5 - FPD基板の標準サイズ Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
D03400 - SEMI D34 - Test Method for FPD Polarizing Films
SEMI D34 - Test Method for FPD Polarizing Films Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
C00315 - SEMI C3.15 - Standard for Nitrogen (N2), In Cylinders, 99.9992% Quality
SEMI C3.15 - Standard for Nitrogen (N2), In Cylinders, 99.9992% Quality Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
C04200 - SEMI C42 - 水酸化ナトリウム(固体)の仕様
SEMI C42 - 水酸化ナトリウム(固体)の仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
C09400 - SEMI C94 - Guide for Cyclohexanone
SEMI C94 - Guide for Cyclohexanone Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
C06300 - SEMI C63 - Specification for Organosilicate Precursors Used in Low K CVD Processes
SEMI C63 - Specification for Organosilicate Precursors Used in Low K CVD Processes Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
D02900 - SEMI D29 - Test Method for Heat Resistance in Flat Panel Display (FPD) Color Filters
SEMI D29 - Test Method for Heat Resistance in Flat Panel Display (FPD) Color Filters Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
C01600 - SEMI C16 - Guide for Precision and Data Reporting Practices
SEMI C16 - Guide for Precision and Data Reporting Practices Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
E08300 - SEMI E83 - PGVメカニカルドッキングフランジの仕様
SEMI E83 - PGVメカニカルドッキングフランジの仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
D00700 - SEMI D7 - FPD Glass Substrate Surface Roughness Measurement Method
SEMI D7 - FPD Glass Substrate Surface Roughness Measurement Method Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
D01600 - SEMI D16 - FPDマテリアルハンドリングシステムとツールポート間の機械的インタフェース仕様
D02400 - SEMI D24 - FPD用ガラス基板の仕様
SEMI D24 - FPD用ガラス基板の仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩347,000
D04800 - SEMI D48 - Specification for Reference Position of Substrate ID to Specify Datum Line for ID Reader for Handing Off/On Tool
E09400 - SEMI E94 - 컨트롤 잡 관리 사양
SEMI E94 - 컨트롤 잡 관리 사양 Sale priceMember Price: ₩113
Non-Member Price: ₩290,000
C00605 - SEMI C6.5 - パイプラインガスとして授受されるグレード10/0.2窒素(N2)およびアルゴン(Ar)に対するパーティクル仕様
C08700 - SEMI C87 - Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Contact Profilometry