SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

G02600 - SEMI G26 - Specification for Hermetic Slam Chip Carrier Lids
SEMI G26 - Specification for Hermetic Slam Chip Carrier Lids Sale priceMember Price: ₩113
Non-Member Price: ₩226,000
G08500 - SEMI G85 - マップデータ・フォーマット用仕様
SEMI G85 - マップデータ・フォーマット用仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
P03000 - SEMI P30 - 寸法測定用走査型電子顕微鏡（CD-SEM）の目録発行の実施要領
SEMI P30 - 寸法測定用走査型電子顕微鏡（CD-SEM）の目録発行の実施要領 Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
D03100 - SEMI D31 - FPD画質検査における輝度ムラの計量単位（DSEMU）の定義
SEMI D31 - FPD画質検査における輝度ムラの計量単位（DSEMU）の定義 Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
M03200 - SEMI M32 - 統計的仕様のガイド
SEMI M32 - 統計的仕様のガイド Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
M03700 - SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers
SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
PV03500 - SEMI PV35 - Specification for Horizontal Communication Between Equipment for Photovoltaic Fabrication System
SEMI PV35 - Specification for Horizontal Communication Between Equipment for Photovoltaic Fabrication System Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
P01000 - SEMI P10 - フォトマスクオーダーのデータ構造の仕様
SEMI P10 - フォトマスクオーダーのデータ構造の仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
M02900 - SEMI M29 - Specification for 300 mm Shipping Box
SEMI M29 - Specification for 300 mm Shipping Box Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
MF053400 - SEMI MF534 - Test Method for Bow of Silicon Wafers
SEMI MF534 - Test Method for Bow of Silicon Wafers Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
D01700 - SEMI D17 - FPDガラス基板搬送用カセットの機械的仕様
SEMI D17 - FPDガラス基板搬送用カセットの機械的仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
MF039900 - SEMI MF399 - Test Method for Thickness of Heteroepitaxial or Polysilicon Layers
SEMI MF399 - Test Method for Thickness of Heteroepitaxial or Polysilicon Layers Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
G00500 - SEMI G5 - 仕様　セラミックチップキャリア（CCC）
SEMI G5 - 仕様　セラミックチップキャリア（CCC） Sale priceMember Price: ₩135
Non-Member Price: ₩291,000
M03300 - SEMI M33 - Test Method for the Determination of Residual Surface Contamination on Silicon Wafers by Means of Total Reflection X-Ray Fluorescence Spectroscopy (TXRF)
SEMI M33 - Test Method for the Determination of Residual Surface Contamination on Silicon Wafers by Means of Total Reflection X-Ray Fluorescence Spectroscopy (TXRF) Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
P03700 - SEMI P37 - Specification for Extreme Ultraviolet Lithography Substrates and Blanks
SEMI P37 - Specification for Extreme Ultraviolet Lithography Substrates and Blanks Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
C10300 - SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing
SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
Flex Electronics Webinar Master Class: May 2021 (on demand)
Flex Electronics Webinar Master Class: May 2021 (on demand) Sale priceMember Price: ₩49
Non-Member Price: ₩149,000
G06700 - SEMI G67 - シート材料から発生する粒子の測定の試験方法
SEMI G67 - シート材料から発生する粒子の測定の試験方法 Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
P00600 - SEMI P6 - フォトマスク用レジストレーションマーク
SEMI P6 - フォトマスク用レジストレーションマーク Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
P01700 - SEMI P17 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresist Metal Ion Free (MIF) Developers by Inductively Coupled Plasma Emission Spectroscopy (ICP)
SEMI P17 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresist Metal Ion Free (MIF) Developers by Inductively Coupled Plasma Emission Spectroscopy (ICP) Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
P00600 - SEMI P6 - Specification for Registration Marks for Photomasks
SEMI P6 - Specification for Registration Marks for Photomasks Sale priceMember Price: ₩113
Non-Member Price: ₩291,000
P04200 - SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様
SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様 Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
M03900 - SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法
SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法 Sale priceMember Price: ₩135
Non-Member Price: ₩348,000
M03000 - SEMI M30 - Standard Test Method for Substitutional Atomic Carbon Concentration in GaAs by Fourier Transform Infrared Absorption Spectroscopy
SEMI M30 - Standard Test Method for Substitutional Atomic Carbon Concentration in GaAs by Fourier Transform Infrared Absorption Spectroscopy Sale priceMember Price: ₩113
Non-Member Price: ₩291,000