{"product_id":"t01000-semi-t10-test-method-for-the-assessment-of-2d-data-matrix-direct-mark-quality","title":"T01000 - SEMI T10 - Test Method for the Assessment of 2D Data Matrix Direct Mark Quality","description":"\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Microsoft Sans Serif\",sans-serif;font-size:9.5pt;'\u003eThis Standard is intended to define the methodology for the assessment of 2D Data Matrix direct mark quality.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Microsoft Sans Serif\",sans-serif;font-size:9.5pt;'\u003eThis Standard defines assessment criteria, metrology methods, and assessment reporting procedures as applied to 2D Data Matrix code direct marks on semiconductor related materials. Application specifications, which refer to this Standard, may further limit its scope to more specific requirements of a particular application.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Microsoft Sans Serif\",sans-serif;font-size:9.5pt;'\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Microsoft Sans Serif\",sans-serif;font-size:9.5pt;'\u003eNone.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Microsoft Sans Serif\",sans-serif;font-size:9.5pt;'\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Microsoft Sans Serif\",sans-serif;font-size:9.5pt;'\u003eSEMI T10-0701 (Reapproved 0923)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Microsoft Sans Serif\",sans-serif;font-size:9.5pt;'\u003eSEMI T10-0701 (Reapproved 0618)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Microsoft Sans Serif\",sans-serif;font-size:9.5pt;'\u003eSEMI T10-0701 (Reapproved 0912)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Microsoft Sans Serif\",sans-serif;font-size:9.5pt;'\u003eSEMI T10-0701 (Reapproved 0307)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Microsoft Sans Serif\",sans-serif;font-size:9.5pt;'\u003eSEMI T10-0701 (first published)\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI T10-0701 (Reapproved 0923) - Current","offer_id":43106884485187,"sku":"17155","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI T10-0701 (Reapproved 0618) - Superseded","offer_id":43106884517955,"sku":"5649","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI T10-0701 (Reapproved 0912) - Superseded","offer_id":40234318102595,"sku":"13132","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI T10-0701 (Reapproved 0307) - Superseded","offer_id":40234318135363,"sku":"13133","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI T10-0701 - Superseded","offer_id":40234318168131,"sku":"13134","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/TVolume_b35c0adf-69e9-4436-aa71-4c62167ddd23.png?v=1776702358","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/t01000-semi-t10-test-method-for-the-assessment-of-2d-data-matrix-direct-mark-quality","provider":"SEMI Dev 2","version":"1.0","type":"link"}