{"product_id":"pv09300-semi-pv93-test-method-for-accelerated-cell-level-testing-for-light-and-elevated-temperature-induced-degradation-letid-susceptibility-of-solar-cells","title":"PV09300 - SEMI PV93 - Test Method for Accelerated Cell Level Testing for Light And Elevated Temperature Induced Degradation (LeTID) Susceptibility of Solar Cells","description":"\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003eThe purpose of the test method is to standardize the\nprocedures, analysis and reporting for quantitatively determining light and\nelevated temperature induced degradation (LeTID) susceptibility of silicon\nsolar cells.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003eThe standard is necessary since the LeTID effect is\nhighly sensitive to temperature and charge carrier injection of solar cells\nunder illumination or current injection.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003eThe test method covers the procedure for gauging silicon\nbased photovoltaic (PV) cells with respect to LeTID with the aim of comparison\/benchmarking\nof different solar cell concepts, production processes as well as silicon\nmaterials.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003eThe test method defines consistent parameters for\ntesting LeTID susceptibility of solar cells, since the LeTID effect depends on\nthe working point of the solar cell under test, that is, if the solar cell is\ntested at short circuit current (\u003ci\u003eI\u003c\/i\u003e\u003csub\u003esc\u003c\/sub\u003e),\nopen circuit voltage (\u003ci\u003eV\u003c\/i\u003e\u003csub\u003eoc\u003c\/sub\u003e)\nor maximum power point (\u003ci\u003eP\u003c\/i\u003e\u003csub\u003empp\u003c\/sub\u003e).\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003eThe test method gives as a result a metric for the\nstrength of LeTID susceptibility and for assessing LeTID mitigation procedures.\nIt may be implemented in statistical process control routines in production on\na small sample basis.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003eThe test method is targeted at fast quantitative\npredictions of LeTID for solar cells later on integrated in PV modules. It is\nnot intended for a quantitative prediction of the performance of the modules in\nthe field.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003e\u003cbr\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif;\nmso-bidi-font-weight:bold'\u003e\u003cfont size=\"2\"\u003eNone.\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\"\u003e\u003cspan style=\"line-height: 107%; font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI PV93-0320 - Current","offer_id":40234367844419,"sku":"13784","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/PVVolume_0e1fb699-bc29-40d4-8696-d9049eb6561d.png?v=1776701775","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/pv09300-semi-pv93-test-method-for-accelerated-cell-level-testing-for-light-and-elevated-temperature-induced-degradation-letid-susceptibility-of-solar-cells","provider":"SEMI Dev 2","version":"1.0","type":"link"}