{"product_id":"pv07500-semi-pv75-test-method-on-cell-level-for-potential-induced-degradation-susceptibility-of-solar-cells-and-module-encapsulation-materials","title":"PV07500 - SEMI PV75 - Test Method on Cell Level for Potential-Induced Degradation Susceptibility of Solar Cells and Module Encapsulation Materials","description":"\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003eThe purpose of this Test Method is the standardization of experimental setup and procedures for PID tests on solar cell level based on non-encapsulated silicon solar cells instead of complete modules.\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003eThis Test Method defines procedures to test and evaluate the PID susceptibility of wafer-based silicon solar cells and module construction components.\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003eThe only type of PID that is considered within this Test Method is the shunting of silicon solar cells due to high voltage stress induced leakage currents. This type of PID is called PID-s.\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003eThe Test Method is designed for silicon solar cells, having a front side emitter, a front side dielectric antireflective layer and front side contacts on top. For the sake of practicability and in order to minimize any border effects, solar cells tested with this Test Method must have edge lengths larger than 6 cm.\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003eThis Test Method is based on the fact that considered solar module designs comprise following layer stack (from top\/sunny side to bottom): glass (or transparent polymer) cover sheet, polymeric encapsulation material and solar cells. The materials of the solar module back-side and their stacking order do not impact the measurement results.\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003eDepending on which component is altered\/exchanged for sampling, solar cells, polymeric encapsulation foils and glass sheets can be tested for their PID-s sensitivity. Following distinction is used in this Test Method:\u003c\/p\u003e\u003col\u003e\n\u003cli\u003ePID test of solar cells\u003c\/li\u003e\n\u003cli\u003ePID test of encapsulation polymer sheets\u003c\/li\u003e\n\u003cli\u003ePID test of module (glass) cover materials\u003c\/li\u003e\n\u003c\/ol\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003eWith this Test Method, two or more different PID test specimens (hereafter: test specimens) can be compared quantitatively with respect to their PID-s sensitivity.\u003c\/p\u003e\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e\u003c\/p\u003e\u003cp\u003eNone.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cfont\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI PV75-0823 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI PV75-1016 (first published)\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI PV75-0823 - Current","offer_id":43106886189123,"sku":"17103","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI PV75-1016 - Superseded","offer_id":43106886221891,"sku":"5331","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/PVVolume_b076b787-8070-4f89-a81f-9e9a5bbab42f.png?v=1776702415","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/pv07500-semi-pv75-test-method-on-cell-level-for-potential-induced-degradation-susceptibility-of-solar-cells-and-module-encapsulation-materials","provider":"SEMI Dev 2","version":"1.0","type":"link"}