{"product_id":"pv07300-semi-pv73-test-method-for-thin-film-silicon-photovoltaic-pv-modules-light-soaking","title":"PV07300 - SEMI PV73 - Test Method for Thin-Film Silicon Photovoltaic (PV) Modules Light Soaking","description":"\u003cp align=\"justify\" dir=\"ltr\"\u003e\u003cbr\u003e\u003cb\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eNOTICE: This Document was balloted and approved for withdrawal in 2022.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/b\u003e\u003cbr\u003e\u003cbr\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eThis Standard provides a performance test method for the initial light-induced degradation in thin-film silicon photovoltaic (PV) modules.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eThe current standard for stabilization in thin-film silicon PV modules is IEC 61646 (module output power \u0026lt;2% change after successive 43 kW\/m2 exposure periods). According to the IEC standard, light soaking time less than 200 hours is usually sufficient for 1 kW\/m2 intensity. However, stabilized power to be achieved in such a short time and the power will continue to degrade. Thus, longer light soaking time is necessary to determine the module’s stabilized output power.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eTherefore, a standard test method for thin-film silicon PV modules is needed to obtain an accurate module stabilized output power value.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eThis Standard describes procedures for the measurement of initial light-induced degradation of thin-film silicon modules in simulated sunlight.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eThese test methods are applicable to thin-film silicon PV modules.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e (purchase separately)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eNone.\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eRevision History\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/b\u003e\u003cbr\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI PV73-0216 (Withdrawn 0922)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003cbr\u003e\u003cspan style=\"font-size:10pt\"\u003e\u003cspan style='font-family:\"Times New Roman\",serif'\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003eSEMI PV73-0216 (first published)\u003c\/span\u003e\u003c\/span\u003e\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI PV73-0216 (Withdrawn 0922) - Withdrawn","offer_id":40234400514115,"sku":"16167","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI PV73-0216 - Current","offer_id":40348633137219,"sku":"5329","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/PVVolume_bbd1fde9-d37f-476c-a6ca-3e0ad3d69ae6.png?v=1776701308","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/pv07300-semi-pv73-test-method-for-thin-film-silicon-photovoltaic-pv-modules-light-soaking","provider":"SEMI Dev 2","version":"1.0","type":"link"}