{"product_id":"pv04300-semi-pv43-test-method-for-the-measurement-of-oxygen-concentration-in-pv-silicon-materials-for-silicon-solar-cells-by-inert-gas-fusion-infrared-detection-method","title":"PV04300 - SEMI PV43 - Test Method for the Measurement of Oxygen Concentration in PV Silicon Materials for Silicon Solar Cells by Inert Gas Fusion Infrared Detection Method","description":"\u003cp dir=\"ltr\" align=\"justify\"\u003eThis Standard was technically approved by the Photovoltaic – Materials Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on August 17, 2018. Available at www.semiviews.org and www.semi.org in October 2018; originally published January 2013.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThe purpose of this Test Method is to standardize analytical protocols for the measurement of oxygen concentration in photovoltaic (PV) silicon materials. This will facilitate comparison of test results between laboratories which support research and development activities or monitor or qualify PV silicon materials for purchase, sale or internal use.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e \u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThis Test Method can be used to analyze the oxygen content in PV silicon materials for photovoltaic applications. It may also be used for semiconductor grade silicon materials.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eApplications of this Test Method include monitoring or qualifying PV silicon materials to be used for silicon solar cell production.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eFurthermore, this Test Method may be used in research and development of PV silicon materials manufacturing and crystalline and multicrystalline silicon growth processes. It may also be used for correlation of failure or reduced performance and oxygen concentration of crystalline or multicrystalline silicon solar cells.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThe test method described is for use with commercially available oxygen analyzers which are based on the inert gas fusion principle and use infrared detector as the measuring technique.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThe detection range of the method described is from 5 to 500 ppma.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eNot all the information needed to determine the oxygen concentration in PV silicon materials is included in this Test Method. For instance, determination of the optimum temperatures for measuring the oxygen concentrations in a variety of silicon samples or optimization of the oxygen peak parameters are not described in this Test Method.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThis Test Method does cover the particular factors (e.g., specimen preparation, calibration procedures, determination of detection limits) known to affect the most the reliability of oxygen analyses.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eSilicon samples in a range of physical forms can used, including polysilicon powders, granules, flakes, chunks, and single and multicrystalline wafers and slugs.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThe oxygen determinations described in this Test Method can be used irrespective of all dopant species and concentrations.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThe limit of detection is determined by the instrumental blank value limitations, and may vary with instrumentation and preparation techniques.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThe typical elements present in PV silicon materials for photovoltaic applications such as dopants or unwanted trace or ultra-trace level impurities do not interfere with the determination of oxygen concentrations conducted by this method.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"left\"\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003eSEMI PV17 — Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications\u003cbr\u003e SEMI PV22 — Specification for Silicon Wafers for Use in Photovoltaic Solar Cells\u003cbr\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI PV43-0113 (Reapproved 1018) - Current","offer_id":40234318004291,"sku":"5283","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI PV43-0113 - Superseded","offer_id":40234318037059,"sku":"12782","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/PVVolume_9fc6861c-96f7-44c5-9ba7-15db80c79880.png?v=1776702449","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/pv04300-semi-pv43-test-method-for-the-measurement-of-oxygen-concentration-in-pv-silicon-materials-for-silicon-solar-cells-by-inert-gas-fusion-infrared-detection-method","provider":"SEMI Dev 2","version":"1.0","type":"link"}