{"product_id":"p03600-semi-p36-guide-for-magnification-reference-for-critical-dimension-measurement-scanning-electron-microscopes-cd-sem","title":"P03600 - SEMI P36 - Guide for Magnification Reference for Critical Dimension Measurement Scanning Electron Microscopes (CD-SEM)","description":"\u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eThe purpose of this Guide is (1) to define common and important specifications of magnification references which are used for calibrating magnifications of critical dimension measurement scanning electron microscopes (CD-SEMs), and as the result (2) to provide magnification references which are easy for anyone to use.\u003c\/font\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e　\u003c\/font\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eIt is preferable that design, manufacture and purchase specifications for CD-SEM magnification references conform to this Guide.\u003c\/font\u003e\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"left\"\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e　\u003c\/font\u003e\u003c\/p\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003c\/font\u003e\u003cp\u003e\u003cfont\u003e\u003cfont face=\"arial\" size=\"2\"\u003eNone.\u003c\/font\u003e\u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI P36-1108 (Reapproved 0913) - Inactive","offer_id":40234317807683,"sku":"5235","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI P36-1108 - Superseded","offer_id":40234317873219,"sku":"12975","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI P36-0308 - Superseded","offer_id":40234317905987,"sku":"12972","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI P36-0600 - Superseded","offer_id":40234317938755,"sku":"12973","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/PVolume_66e8b5c3-a847-47f2-a8bb-fcc90a7c8875.png?v=1776702501","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/p03600-semi-p36-guide-for-magnification-reference-for-critical-dimension-measurement-scanning-electron-microscopes-cd-sem","provider":"SEMI Dev 2","version":"1.0","type":"link"}